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Crossover from First to Second-Order Transition in Frustrated Ising Antiferromagnetic Films
Authors:
X. T. Pham Phu,
V. Thanh Ngo,
Hung the Diep
Abstract:
In the bulk state, the Ising FCC antiferromagnet is fully frustrated and is known to have a very strong first-order transition. In this paper, we study the nature of this phase transition in the case of a thin film, as a function of the film thickness. Using Monte Carlo (MC) simulations, we show that the transition remains first order down to a thickness of four FCC cells. It becomes clearly sec…
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In the bulk state, the Ising FCC antiferromagnet is fully frustrated and is known to have a very strong first-order transition. In this paper, we study the nature of this phase transition in the case of a thin film, as a function of the film thickness. Using Monte Carlo (MC) simulations, we show that the transition remains first order down to a thickness of four FCC cells. It becomes clearly second order at a thickness of two FCC cells, i.e. four atomic layers. It is also interesting to note that the presence of the surface reduces the ground state (GS) degeneracy found in the bulk. For the two-cell thickness, the surface magnetization is larger than the interior one. It undergoes a second-order phase transition at a temperature $T_C$ while interior spins become disordered at a lower temperature $T_D$. This loss of order is characterized by a peak of the interior spins susceptibility and a peak of the specific heat which do not depend on the lattice size suggesting that either it is not a real transition or it is a Kosterlitz-Thouless nature. The surface transition, on the other hand, is shown to be of second order with critical exponents deviated from those of pure 2D Ising universality class. We also show results obtained from the Green's function method. Discussion is given.
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Submitted 25 February, 2009;
originally announced February 2009.
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Critical behavior of magnetic thin films as a function of thickness
Authors:
X. T. Pham Phu,
V. Thanh Ngo,
H. T. Diep
Abstract:
We study the critical behavior of magnetic thin films as a function of the film thickness. We use the ferromagnetic Ising model with the high-resolution multiple histogram Monte Carlo (MC) simulation. We show that though the 2D behavior remains dominant at small thicknesses, there is a systematic continuous deviation of the critical exponents from their 2D values. We observe that in the same ran…
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We study the critical behavior of magnetic thin films as a function of the film thickness. We use the ferromagnetic Ising model with the high-resolution multiple histogram Monte Carlo (MC) simulation. We show that though the 2D behavior remains dominant at small thicknesses, there is a systematic continuous deviation of the critical exponents from their 2D values. We observe that in the same range of varying thickness the deviation of the exponent $ν$ is rather small, while exponent $β$ suffers a larger deviation. We explain these deviations using the concept of "effective" exponents suggested by Capehart and Fisher in a finite-size analysis. The shift of the critical temperature with the film thickness obtained here by MC simulation is in an excellent agreement with their prediction.
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Submitted 19 December, 2007;
originally announced December 2007.
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Nature of phase transition in magnetic thin films
Authors:
X. T. Pham Phu,
V. Thanh Ngo,
H. T. Diep
Abstract:
We study the critical behavior of magnetic thin films as a function of the film thickness. We use the ferromagnetic Ising model with the high-resolution multiple histogram Monte Carlo (MC) simulation. We show that though the 2D behavior remains dominant at small thicknesses, there is a systematic continuous deviation of the critical exponents from their 2D values. We observe that in the same ran…
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We study the critical behavior of magnetic thin films as a function of the film thickness. We use the ferromagnetic Ising model with the high-resolution multiple histogram Monte Carlo (MC) simulation. We show that though the 2D behavior remains dominant at small thicknesses, there is a systematic continuous deviation of the critical exponents from their 2D values. We observe that in the same range of varying thickness the deviation of the exponent $ν$ is very small from its 2D value, while exponent $β$ suffers a larger deviation. Moreover, as long as the film thickness is fixed, i. e. no finite size scaling is done in the $z$ direction perpendicular to the film, the 3D values of the critical exponents cannot be attained even with very large (but fixed) thickness. The crossover to 3D universality class cannot therefore take place without finite size scaling applied in the $z$ direction, in the limit of numerically accessible thicknesses. From values of exponent $α$ obtained by MC, we estimate the effective dimension of the system. We conclude that with regard to the critical behavior, thin films behave as systems with effective dimension between 2 and 3.
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Submitted 28 May, 2007;
originally announced May 2007.
