Showing 1–9 of 9 results for author: Pelz, P M

Solving Complex Nanostructures With Ptychographic Atomic Electron Tomography

Authors: Philipp M Pelz, Sinead Griffin, Scott Stonemeyer, Derek Popple, Hannah Devyldere, Peter Ercius, Alex Zettl, Mary C Scott, Colin Ophus

Abstract: Transmission electron microscopy (TEM) is a potent technique for the determination of three-dimensional atomic scale structure of samples in structural biology and materials science. In structural biology, three-dimensional structures of proteins are routinely determined using phase-contrast single-particle cryo-electron microscopy from thousands of identical proteins, and reconstructions have rea… ▽ More Transmission electron microscopy (TEM) is a potent technique for the determination of three-dimensional atomic scale structure of samples in structural biology and materials science. In structural biology, three-dimensional structures of proteins are routinely determined using phase-contrast single-particle cryo-electron microscopy from thousands of identical proteins, and reconstructions have reached atomic resolution for specific proteins. In materials science, three-dimensional atomic structures of complex nanomaterials have been determined using a combination of annular dark field (ADF) scanning transmission electron microscopic (STEM) tomography and subpixel localization of atomic peaks, in a method termed atomic electron tomography (AET). However, neither of these methods can determine the three-dimensional atomic structure of heterogeneous nanomaterials containing light elements. Here, we perform mixed-state electron ptychography from 34.5 million diffraction patterns to reconstruct a high-resolution tilt series of a double wall-carbon nanotube (DW-CNT), encapsulating a complex $\mathrm{ZrTe}$ sandwich structure. Class averaging of the resulting reconstructions and subpixel localization of the atomic peaks in the reconstructed volume reveals the complex three-dimensional atomic structure of the core-shell heterostructure with 17 picometer precision. From these measurements, we solve the full $\mathrm{Zr_{11}Te_{50}}$ structure, which contains a previously unobserved $\mathrm{ZrTe_{2}}$ phase in the core. The experimental realization of ptychographic atomic electron tomography (PAET) will allow for structural determination of a wide range of nanomaterials which are beam-sensitive or contain light elements. △ Less

Submitted 17 June, 2022; originally announced June 2022.

Comments: 17 pages 3 figures in main text, 7 figures in supplementary materials

Simultaneous Successive Twinning Captured by Atomic Electron Tomography

Authors: Phillip M. Pelz, Catherine K. Groschner, Alexandra Bruefach, Adam Satariano, Colin Ophus, M. C. Scott

Abstract: Shape-controlled synthesis of multiply twinned nanostructures is heavily emphasized in nanoscience, in large part due to the desire to control the size, shape, and terminating facets of metal nanoparticles for applications in catalysis. Direct control of the size and shape of solution-grown nanoparticles relies on an understanding of how synthetic parameters alter nanoparticle structures during sy… ▽ More Shape-controlled synthesis of multiply twinned nanostructures is heavily emphasized in nanoscience, in large part due to the desire to control the size, shape, and terminating facets of metal nanoparticles for applications in catalysis. Direct control of the size and shape of solution-grown nanoparticles relies on an understanding of how synthetic parameters alter nanoparticle structures during synthesis. However, while outcome populations can be effectively studied with standard electron microscopy methods, transient structures that appear during some synthetic routes are difficult to study using conventional high resolution imaging methods due to the high complexity of the 3D nanostructures. Here, we have studied the prevalence of transient structures during growth of multiply twinned particles and employed atomic electron tomography to reveal the atomic-scale three dimensional structure of a Pd nanoparticle undergoing a shape transition. By identifying over 20,000 atoms within the structure and classifying them according to their local crystallographic environment, we observe a multiply-twinned structure consistent with a simultaneous successive twinning from a decahedral to icosahedral structure. We also observe a high degree of structural disorder in the nanoparticle, and a disordered crystal structure on the particle surface. Our results shed light on the transition mechanism for formation of icosahedral nanoparticle structures. △ Less

Submitted 14 September, 2021; originally announced September 2021.

Real-time interactive 4D-STEM phase-contrast imaging from electron event representation data

Authors: Philipp M. Pelz, Ian Johnson, Colin Ophus, Peter Ercius, Mary C. Scott

Abstract: The arrival of direct electron detectors (DED) with high frame-rates in the field of scanning transmission electron microscopy has enabled many experimental techniques that require collection of a full diffraction pattern at each scan position, a field which is subsumed under the name four dimensional-scanning transmission electron microscopy (4D-STEM). DED frame rates approaching 100 kHz require… ▽ More The arrival of direct electron detectors (DED) with high frame-rates in the field of scanning transmission electron microscopy has enabled many experimental techniques that require collection of a full diffraction pattern at each scan position, a field which is subsumed under the name four dimensional-scanning transmission electron microscopy (4D-STEM). DED frame rates approaching 100 kHz require data transmission rates and data storage capabilities that exceed commonly available computing infrastructure. Current commercial DEDs allow the user to make compromises in pixel bit depth, detector binning or windowing to reduce the per-frame file size and allow higher frame rates. This change in detector specifications requires decisions to be made before data acquisition that may reduce or lose information that could have been advantageous during data analysis. The 4D Camera, a DED with 87 kHz frame-rate developed at Lawrence Berkeley National Laboratory, reduces the raw data to a linear-index encoded electron event representation (EER). Here we show with experimental data from the 4D Camera that linear-index encoded EER and its direct use in 4D-STEM phase contrast imaging methods enables real-time, interactive phase-contrast from large-area 4D-STEM datasets. We detail the computational complexity advantages of the EER and the necessary computational steps to achieve real-time interactive ptychography and center-of-mass differential phase contrast using commonly available hardware accelerators. △ Less

Submitted 13 April, 2021; originally announced April 2021.

Comments: 11 pages

A Fast Algorithm for Scanning Transmission Electron Microscopy (STEM) Imaging and 4D-STEM Diffraction Simulations

Authors: Philipp M Pelz, Alexander Rakowski, Luis Rangel DaCosta, Benjamin H Savitzky, Mary C Scott, Colin Ophus

Abstract: Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying materials on the atomic scale. Many STEM experiments are supported or validated with electron scattering simulations. However, using the conventional multislice algorithm to perform these simulations can require extremely large calculation times, particularly for experiments with millions of probe positi… ▽ More Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying materials on the atomic scale. Many STEM experiments are supported or validated with electron scattering simulations. However, using the conventional multislice algorithm to perform these simulations can require extremely large calculation times, particularly for experiments with millions of probe positions as each probe position must be simulated independently. Recently, the PRISM algorithm was developed to reduce calculation times for large STEM simulations. Here, we introduce a new method for STEM simulation: partitioning of the STEM probe into "beamlets," given by a natural neighbor interpolation of the parent beams. This idea is compatible with PRISM simulations and can lead to even larger improvements in simulation time, as well requiring significantly less computer RAM. We have performed various simulations to demonstrate the advantages and disadvantages of partitioned PRISM STEM simulations. We find that this new algorithm is particularly useful for 4D-STEM simulations of large fields of view. We also provide a reference implementation of the multislice, PRISM and partitioned PRISM algorithms. △ Less

Submitted 3 April, 2021; originally announced April 2021.

Comments: 15 pages, 7 figures

Scalable multicomponent spectral analysis for high-throughput data annotation

Authors: Rui Patrick Xian, Ralph Ernstorfer, Philipp Michael Pelz

Abstract: Orchestrating parametric fitting of multicomponent spectra at scale is an essential yet underappreciated task in high-throughput quantification of materials and chemical composition. To automate the annotation process for spectroscopic and diffraction data collected in counts of hundreds to thousands, we present a systematic approach compatible with high-performance computing infrastructures using… ▽ More Orchestrating parametric fitting of multicomponent spectra at scale is an essential yet underappreciated task in high-throughput quantification of materials and chemical composition. To automate the annotation process for spectroscopic and diffraction data collected in counts of hundreds to thousands, we present a systematic approach compatible with high-performance computing infrastructures using the MapReduce model and task-based parallelization. We implement the approach in software and demonstrate linear computational scaling with respect to spectral components using multidimensional experimental materials characterization datasets from photoemission spectroscopy and powder electron diffraction as benchmarks. Our approach enables efficient generation of high-quality data annotation and online spectral analysis and is applicable to a variety of analytical techniques in materials science and chemistry as a building block for closed-loop experimental systems. △ Less

Submitted 29 March, 2021; v1 submitted 10 February, 2021; originally announced February 2021.

A single-projection three-dimensional reconstruction algorithm for scanning transmission electron microscopy data

Authors: Hamish G. Brown, Philipp M. Pelz, Shang-Lin Hsu, Zimeng Zhang, Ramamoorthy Ramesh, Katherine Inzani, Evan Sheridan, Sinéad M. Griffin, Marcel Schloz, Thomas C. Pekin, Christoph T. Koch, Scott D. Findlay, Leslie J. Allen, Mary C. Scott, Colin Ophus, Jim Ciston

Abstract: Increasing interest in three-dimensional nanostructures adds impetus to electron microscopy techniques capable of imaging at or below the nanoscale in three dimensions. We present a reconstruction algorithm that takes as input a focal series of four-dimensional scanning transmission electron microscopy (4D-STEM) data. We apply the approach to a lead iridate, Pb$_2$Ir$_2$O$_7$, and yttrium-stabiliz… ▽ More Increasing interest in three-dimensional nanostructures adds impetus to electron microscopy techniques capable of imaging at or below the nanoscale in three dimensions. We present a reconstruction algorithm that takes as input a focal series of four-dimensional scanning transmission electron microscopy (4D-STEM) data. We apply the approach to a lead iridate, Pb$_2$Ir$_2$O$_7$, and yttrium-stabilized zirconia,Y$_{0.095}$Zr$_{0.905}$O$_2$ , heterostructure from data acquired with the specimen in a single plan-view orientation, with the epitaxial layers stacked along the beam direction. We demonstrate that Pb-Ir atomic columns are visible in the uppermost layers of the reconstructed volume. We compare this approach to the alternative techniques of depth sectioning using differential phase contrast scanning transmission electron microscopy (DPC-STEM) and multislice ptychographic reconstruction. △ Less

Submitted 16 February, 2022; v1 submitted 15 November, 2020; originally announced November 2020.

Comments: 27 pages, 6 figures in main manuscript. 6 pages, 5 figures in supplementary. All computer code for electron microscopy simulation and reconstruction included in directory anc. Submitted to Microscopy & Microanalysis

Reconstructing the Scattering Matrix from Scanning Electron Diffraction Measurements Alone

Authors: Philipp M Pelz, Hamish G Brown, Jim Ciston, Scott D Findlay, Yaqian Zhang, Mary Scott, Colin Ophus

Abstract: Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely challenging, due to small numerical apertures, the unavailability of wavefront sha** optics, and the highly nonlinear inversion required from intensity-only measurements. In this work, we present a new algorithm using the scattering matrix formalism to solve the scattering from a… ▽ More Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely challenging, due to small numerical apertures, the unavailability of wavefront sha** optics, and the highly nonlinear inversion required from intensity-only measurements. In this work, we present a new algorithm using the scattering matrix formalism to solve the scattering from a non-crystalline medium from scanning diffraction measurements, and recover the illumination aberrations. Our method will enable 3D imaging and materials characterization at high resolution for a wide range of materials. △ Less

Submitted 28 August, 2020; originally announced August 2020.

Journal ref: Phys. Rev. Research 3, 023159 (2021)

py4DSTEM: a software package for multimodal analysis of four-dimensional scanning transmission electron microscopy datasets

Authors: Benjamin H Savitzky, Lauren A Hughes, Steven E Zeltmann, Hamish G Brown, Shiteng Zhao, Philipp M Pelz, Edward S Barnard, Jennifer Donohue, Luis Rangel DaCosta, Thomas C. Pekin, Ellis Kennedy, Matthew T Janish, Matthew M Schneider, Patrick Herring, Chirranjeevi Gopal, Abraham Anapolsky, Peter Ercius, Mary Scott, Jim Ciston, Andrew M Minor, Colin Ophus

Abstract: Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full 2D image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, in… ▽ More Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full 2D image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, including signatures of the local structure, orientation, deformation, electromagnetic fields and other sample-dependent properties. However, extracting this information requires complex analysis pipelines, from data wrangling to calibration to analysis to visualization, all while maintaining robustness against imaging distortions and artifacts. In this paper, we present py4DSTEM, an analysis toolkit for measuring material properties from 4D-STEM datasets, written in the Python language and released with an open source license. We describe the algorithmic steps for dataset calibration and various 4D-STEM property measurements in detail, and present results from several experimental datasets. We have also implemented a simple and universal file format appropriate for electron microscopy data in py4DSTEM, which uses the open source HDF5 standard. We hope this tool will benefit the research community, helps to move the develo** standards for data and computational methods in electron microscopy, and invite the community to contribute to this ongoing, fully open-source project. △ Less

Submitted 20 March, 2020; originally announced March 2020.

Comments: 32 pages, 18 figures

Low-dose cryo electron ptychography via non-convex Bayesian optimization

Authors: Philipp Michael Pelz, Wen Xuan Qiu, Robert Bücker, Günther Kassier, R. J. Dwayne Miller

Abstract: Electron ptychography has seen a recent surge of interest for phase sensitive imaging at atomic or near-atomic resolution. However, applications are so far mainly limited to radiation-hard samples because the required doses are too high for imaging biological samples at high resolution. We propose the use of non-convex, Bayesian optimization to overcome this problem and reduce the dose required fo… ▽ More Electron ptychography has seen a recent surge of interest for phase sensitive imaging at atomic or near-atomic resolution. However, applications are so far mainly limited to radiation-hard samples because the required doses are too high for imaging biological samples at high resolution. We propose the use of non-convex, Bayesian optimization to overcome this problem and reduce the dose required for successful reconstruction by two orders of magnitude compared to previous experiments. We suggest to use this method for imaging single biological macromolecules at cryogenic temperatures and demonstrate 2D single-particle reconstructions from simulated data with a resolution of 7.9 Å$\,$ at a dose of 20 $e^- / Å^2$. When averaging over only 15 low-dose datasets, a resolution of 4 Å$\,$ is possible for large macromolecular complexes. With its independence from microscope transfer function, direct recovery of phase contrast and better scaling of signal-to-noise ratio, cryo-electron ptychography may become a promising alternative to Zernike phase-contrast microscopy. △ Less

Submitted 19 February, 2017; originally announced February 2017.