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Showing 1–3 of 3 results for author: Oveisi, E

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  1. arXiv:2110.07766  [pdf, other

    eess.IV cs.CV

    3D Reconstruction of Curvilinear Structures with Stereo Matching DeepConvolutional Neural Networks

    Authors: Okan Altingövde, Anastasiia Mishchuk, Gulnaz Ganeeva, Emad Oveisi, Cecile Hebert, Pascal Fua

    Abstract: Curvilinear structures frequently appear in microscopy imaging as the object of interest. Crystallographic defects, i.e., dislocations, are one of the curvilinear structures that have been repeatedly investigated under transmission electron microscopy (TEM) and their 3D structural information is of great importance for understanding the properties of materials. 3D information of dislocations is of… ▽ More

    Submitted 14 October, 2021; originally announced October 2021.

  2. arXiv:2010.10860  [pdf

    cond-mat.mtrl-sci

    Atomic scale symmetry and polar nanoclusters in the paraelectric phase of ferroelectric materials

    Authors: Andreja Bencan, Emad Oveisi, Sina Hashemizadeh, Vignaswaran K. Veerapandiyan, Takuya Hoshina, Tadej Rojac, Marco Deluca, Goran Drazic, Dragan Damjanovic

    Abstract: The nature of the "forbidden" local- and long-range polar order in nominally nonpolar paraelectric phases of ferroelectric materials has been an open question since the discovery of ferroelectricity in oxide perovskites (ABO3). A currently considered model suggests locally correlated displacements of B-site atoms along a subset of <111> cubic directions. Such offsite displacements have been confir… ▽ More

    Submitted 21 October, 2020; originally announced October 2020.

    Comments: the main text and supplementary information

    Journal ref: Nat Commun 12, 3509 (2021)

  3. arXiv:2005.10093  [pdf

    cond-mat.mtrl-sci physics.ins-det

    Insights into image contrast from dislocations in ADF-STEM

    Authors: E. Oveisi, M. C. Spadaro, E. Rotunno, V. Grillo, C. Hebert

    Abstract: Competitive mechanisms contribute to image contrast from dislocations in annular dark field scanning transmission electron microscopy ADF STEM. A clear theoretical understanding of the mechanisms underlying the ADF STEM contrast is therefore essential for correct interpretation of dislocation images. This paper reports on a systematic study of the ADF STEM contrast from dislocations in a GaN speci… ▽ More

    Submitted 25 May, 2020; v1 submitted 20 May, 2020; originally announced May 2020.