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Showing 1–2 of 2 results for author: Osseiran, M

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  1. arXiv:2310.14665  [pdf, other

    cs.CR cs.AR

    Read Disturbance in High Bandwidth Memory: A Detailed Experimental Study on HBM2 DRAM Chips

    Authors: Ataberk Olgun, Majd Osseiran, Abdullah Giray Yaglikci, Yahya Can Tugrul, Haocong Luo, Steve Rhyner, Behzad Salami, Juan Gomez Luna, Onur Mutlu

    Abstract: We experimentally demonstrate the effects of read disturbance (RowHammer and RowPress) and uncover the inner workings of undocumented read disturbance defense mechanisms in High Bandwidth Memory (HBM). Detailed characterization of six real HBM2 DRAM chips in two different FPGA boards shows that (1) the read disturbance vulnerability significantly varies between different HBM2 chips and between dif… ▽ More

    Submitted 2 May, 2024; v1 submitted 23 October, 2023; originally announced October 2023.

    Comments: To appear in DSN 2024

  2. arXiv:2305.17918  [pdf, other

    cs.CR cs.AR

    An Experimental Analysis of RowHammer in HBM2 DRAM Chips

    Authors: Ataberk Olgun, Majd Osseiran, Abdullah Giray Ya{ğ}lık{c}ı, Yahya Can Tuğrul, Haocong Luo, Steve Rhyner, Behzad Salami, Juan Gomez Luna, Onur Mutlu

    Abstract: RowHammer (RH) is a significant and worsening security, safety, and reliability issue of modern DRAM chips that can be exploited to break memory isolation. Therefore, it is important to understand real DRAM chips' RH characteristics. Unfortunately, no prior work extensively studies the RH vulnerability of modern 3D-stacked high-bandwidth memory (HBM) chips, which are commonly used in modern GPUs.… ▽ More

    Submitted 29 May, 2023; originally announced May 2023.

    Comments: To appear at DSN Disrupt 2023