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Showing 1–1 of 1 results for author: Oddershede, J

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  1. Registration between DCT and EBSD datasets for multiphase microstructures

    Authors: James A. D. Ball, Jette Oddershede, Claire Davis, Carl Slater, Mohammed Said, Himanshu Vashishtha, Stefan Michalik, David M. Collins

    Abstract: The ability to characterise the three-dimensional microstructure of multiphase materials is essential for understanding the interaction between phases and associated materials properties. Here, laboratory-based diffraction-contrast tomography (DCT), a recently-established materials characterization technique that can determine grain phases, morphologies, positions and orientations in a voxel-based… ▽ More

    Submitted 29 June, 2023; originally announced June 2023.

    Comments: 15 pages, 11 figures. Preprint submitted to Materials Characterization

    Journal ref: Materials Characterization, October 2023, Volume 204, Page 113228