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Deciphering capacitance frequency technique for performance limiting defect state parameters in energy harvesting perovskites
Authors:
Vikas Nandal,
Sumanshu Agarwal,
Pradeep R. Nair
Abstract:
With emerging thin film PIN based optoelectronics devices, a significant research thrust is focused on the passivation of trap states for performance enhancement. Among various methods, capacitance frequency technique (CFT) is often employed to quantify trap state parameters, however, the trapped charge induced electrostatic effect on the same is not yet established for such devices. Herein, we pr…
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With emerging thin film PIN based optoelectronics devices, a significant research thrust is focused on the passivation of trap states for performance enhancement. Among various methods, capacitance frequency technique (CFT) is often employed to quantify trap state parameters, however, the trapped charge induced electrostatic effect on the same is not yet established for such devices. Herein, we present a theoretical methodology to incorporate such effects in the CF characteristics of well-established carrier selective perovskite-based PIN devices. We show that the electrostatic effect of trapped charges leads to non-linear energy bands in perovskite layer which results in the underestimation of trap density from existing models of CFT. Consequently, a parabolic band approximation with effective length PBAEL model is developed which accurately predicts the trap density for shallow or deep states from CFT analysis. In addition, we demonstrate that the attempt to escape frequency, crucial for trapped charge dynamics with continuum energy bands, can be well extracted by eliminating non-linear effects at reduced perovskite thickness. We believe that our work provides a unified theoretical platform for CFT to extract trap state parameters for a broad class of organic and hybrid materials-based thin film devices for energy conversion applications such as solar cells, LEDs, etc.
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Submitted 14 June, 2021; v1 submitted 13 June, 2021;
originally announced June 2021.
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Ion Induced Passivation of Grain Boundaries in Perovskite Solar Cells
Authors:
Vikas Nandal,
Pradeep R. Nair
Abstract:
Demonstration of high-efficiency large area cells with excellent stability is an important requirement towards commercialization of perovskite solar cells (PSC). With reports of high-quality perovskite grains, it is evident that the performance of such large area cells will be strongly influenced by phenomena like carrier recombination and ion migration at grain boundaries (GBs). Here, we develop…
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Demonstration of high-efficiency large area cells with excellent stability is an important requirement towards commercialization of perovskite solar cells (PSC). With reports of high-quality perovskite grains, it is evident that the performance of such large area cells will be strongly influenced by phenomena like carrier recombination and ion migration at grain boundaries (GBs). Here, we develop a modeling framework to address performance limitation due to GBs in large area PSCs. Through detailed numerical simulations, we show that photo-carrier recombination has a non-trivial dependence on the orientation of GBs. Interestingly, we find that ions at GBs lead to significant performance recovery through field effect passivation, which is influenced by critical parameters like density and polarity of ions, and the location of GB. These results have interesting implications towards long-term stability and hence are relevant for the performance optimization of large area polycrystalline based thin film solar cells such as PSCs, CIGS, CZTS, etc.
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Submitted 26 November, 2018;
originally announced November 2018.
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Anomalous Scaling Exponents of Capacitance-Voltage Characteristics
Authors:
Vikas Nandal,
Pradeep R. Nair
Abstract:
Capacitance-Voltage (CV) measurements along with the Mott-Schottky (MS) analysis are widely used for characterization of material and device parameters. Using a simple analytical model, supported by detailed numerical simulations, here we predict that the capacitance of thin film devices scale as V^-2 (V is the applied potential), instead of the often used V^-0.5 dependence of MS analysis- with si…
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Capacitance-Voltage (CV) measurements along with the Mott-Schottky (MS) analysis are widely used for characterization of material and device parameters. Using a simple analytical model, supported by detailed numerical simulations, here we predict that the capacitance of thin film devices scale as V^-2 (V is the applied potential), instead of the often used V^-0.5 dependence of MS analysis- with significant implications towards extraction of parameters like do** density, built-in voltage, etc. Surprisingly, we find that the predicted trends are already hidden in multiple instances of existing literature. As such, our results constitute a fundamental contribution to semiconductor device physics and are directly applicable and immediately relevant to a broad range of optoelectronic devices like organic solar cells, perovskite-based solar cells, and LEDs, thin film a-Si devices, etc.
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Submitted 4 April, 2018;
originally announced April 2018.
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Predictive modeling of ion migration induced degradation in perovskite solar cells
Authors:
Vikas Nandal,
Pradeep R. Nair
Abstract:
With excellent efficiencies being reported from multiple labs across the world, device stability and the degradation mechanisms have emerged as the key aspects that could determine the future prospects of perovskite solar cells. However, the related experimental efforts remain scattered due to the lack of any unifying theoretical framework. In this context, here we provide a comprehensive analysis…
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With excellent efficiencies being reported from multiple labs across the world, device stability and the degradation mechanisms have emerged as the key aspects that could determine the future prospects of perovskite solar cells. However, the related experimental efforts remain scattered due to the lack of any unifying theoretical framework. In this context, here we provide a comprehensive analysis of ion migration effects in perovskite solar cells. Specifically, we show, for the first time, that (a) the effect of ionic charges is almost indistinguishable from that of dopant ions, (b) ion migration could lead to simultaneous improvement in Voc and degradation in Jsc - a unique observation which is beyond the realm of mere parametric variation in carrier mobility and lifetime, (c) champion devices are more resilient towards the ill effects of ion migration, and finally (d) we propose unique characterization schemes to determine both magnitude and polarity of ionic species. Our results, supported by detailed numerical simulations and direct comparison with experimental data, are of broad interest and provide a much needed predictive capability towards the research on performance degradation mechanisms in perovskite solar cells
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Submitted 17 April, 2017;
originally announced April 2017.
