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Three-dimensional atomically-resolved analytical imaging with a field ion microscope
Authors:
Shyam Katnagallu,
Felipe Felipe F. Morgado,
Isabelle Mouton,
Baptiste Gault,
Leigh T. Stephenson
Abstract:
Atom probe tomography (APT) helps elucidate the link between the nanoscale chemical variations and physical properties, but it has limited structural resolution. Field ion microscopy (FIM), a predecessor technique to APT, is capable of attaining atomic resolution along certain sets of crystallographic planes albeit at the expense of elemental identification. We demonstrate how two commercially-ava…
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Atom probe tomography (APT) helps elucidate the link between the nanoscale chemical variations and physical properties, but it has limited structural resolution. Field ion microscopy (FIM), a predecessor technique to APT, is capable of attaining atomic resolution along certain sets of crystallographic planes albeit at the expense of elemental identification. We demonstrate how two commercially-available atom probe instruments, one with a straight flight path and one fitted with a reflectron-lens, can be used to acquire time-of-flight mass spectrometry data concomitant with a FIM experiment. We outline various experimental protocols making use of temporal and spatial correlations to best discriminate field evaporated signals from the large field ionised background signal, demonstrating an unsophisticated yet efficient data mining strategy to provide this discrimination. We discuss the remaining experimental challenges that need be addressed, notably concerned with accurate detection and identification of individual field evaporated ions contained within the high field ionised flux that contributes to a FIM image. Our hybrid experimental approach can, in principle, exhibit true atomic resolution with elemental discrimination capabilities, neither of which atom probe nor field ion microscopy can individually fully deliver - thereby making this new approach, here broadly termed analytical field ion microscope (aFIM), unique.
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Submitted 23 March, 2021; v1 submitted 19 March, 2021;
originally announced March 2021.
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Reflections on the spatial performance of atom probe tomography in the analysis of atomic neighbourhoods
Authors:
Baptiste Gault,
Benjamin Klaes,
Felipe F. Morgado,
Christoph Freysoldt,
Yue Li,
Frederic De Geuser,
Leigh T. Stephenson,
François Vurpillot
Abstract:
Atom probe tomography is often introduced as providing "atomic-scale" map** of the composition of materials and as such is often exploited to analyse atomic neighbourhoods within a material. Yet quantifying the actual spatial performance of the technique in a general case remains challenging, as they depend on the material system being investigated as well as on the specimen's geometry. Here, by…
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Atom probe tomography is often introduced as providing "atomic-scale" map** of the composition of materials and as such is often exploited to analyse atomic neighbourhoods within a material. Yet quantifying the actual spatial performance of the technique in a general case remains challenging, as they depend on the material system being investigated as well as on the specimen's geometry. Here, by using comparisons with field-ion microscopy experiments and field-ion imaging and field evaporation simulations, we provide the basis for a critical reflection on the spatial performance of atom probe tomography in the analysis of pure metals, low alloyed systems and concentrated solid solutions (i.e. akin to high-entropy alloys). The spatial resolution imposes strong limitations on the possible interpretation of measured atomic neighbourhoods, and directional neighbourhood analyses restricted to the depth are expected to be more robust. We hope this work gets the community to reflect on its practices, in the same way, it got us to reflect on our work.
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Submitted 19 July, 2021; v1 submitted 2 March, 2021;
originally announced March 2021.
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Revealing atomic-scale vacancy-solute interaction in nickel
Authors:
Felipe F. Morgado,
Shyam Katnagallu,
Christoph Freysoldt,
Benjamin Klaes,
François Vurpillot,
Jörg Neugebauer,
Dierk Raabe,
Steffen Neumeier,
Baptiste Gault,
Leigh T. Stephenson
Abstract:
Imaging individual vacancies in solids and revealing their interactions with solute atoms remains one of the frontiers in microscopy and microanalysis. Here we study a creep-deformed binary Ni-2 at.% Ta alloy. Atom probe tomography reveals a random distribution of Ta. Field ion microscopy, with contrast interpretation supported by density-functional theory and time-of-flight mass spectrometry, evi…
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Imaging individual vacancies in solids and revealing their interactions with solute atoms remains one of the frontiers in microscopy and microanalysis. Here we study a creep-deformed binary Ni-2 at.% Ta alloy. Atom probe tomography reveals a random distribution of Ta. Field ion microscopy, with contrast interpretation supported by density-functional theory and time-of-flight mass spectrometry, evidences a positive correlation of tantalum with vacancies. Our results support solute-vacancy binding, which explains improvement in creep resistance of Ta-containing Ni-based superalloys and helps guide future material design strategies.
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Submitted 16 June, 2021; v1 submitted 2 March, 2021;
originally announced March 2021.
