Showing 1–2 of 2 results for author: Moorthy, V H S
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Josephson junction array type I-V characteristics of quench-condensed ultra thin films of Bi
Authors:
G. Sambandamurthy,
K. DasGupta,
V. H. S. Moorthy,
N. Chandrasekhar
Abstract:
In this communication we report studies of d.c current-voltage (I-V) characteristics of ultra thin films of Bi, quench condensed on single crystal sapphire substrates at T = 15K. The hysteretic I-V characteristics are explained using a resistively and capacitively shunted junction (RCSJ) model of Josephson junction arrays. The Josephson coupling energy($E_J$) and the charging energy($E_c$) are c…
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In this communication we report studies of d.c current-voltage (I-V) characteristics of ultra thin films of Bi, quench condensed on single crystal sapphire substrates at T = 15K. The hysteretic I-V characteristics are explained using a resistively and capacitively shunted junction (RCSJ) model of Josephson junction arrays. The Josephson coupling energy($E_J$) and the charging energy($E_c$) are calculated for different thickness($d$) values. A low resistance state is found in the low current regime below the critical current, $I_c$. This resistance $R_0$ is found to have a minimum at a particular thickness ($d_c$) value. Reflection High Energy Electron Diffraction (RHEED) studies are done on these films. A distinct appearance of a diffuse ring near $d_c$ is observed in the diffraction images, consistent with the recent STM studies(Ekinci and Valles, PRL {\bf 82}(1999) 1518). These films show an irreversible annealing when temperature is increased. The annealing temperature ($T_a$) also has a maximum at the same thickness. Althoguh the R$_s$ vs T of quench condensed Bi films suggest that the films are uniform, our results indicate that even in thick films, the order parameter is not fully developed over the complete area of the film. These results are discussed qualitatively.
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Submitted 13 July, 2000;
originally announced July 2000.
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Magnetoresistance and conductivity exponents of quench-condensed ultra-thin films of Bi
Authors:
K. Das Gupta,
G. Sambandamurthy,
V. H. S. Moorthy,
N. Chandrasekhar
Abstract:
We have studied the magnetoresistance (MR) and evolution of conductivity with thickness of quench-condensed Bismuth films on substrates of various dielectric constants. Our results indicate a negative intial MR proportional to the square of the magnetic field. The conductance shows a power-law kind of dependence on thickness, with an exponent close to 1.33, characterisitic of a 2-D percolating s…
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We have studied the magnetoresistance (MR) and evolution of conductivity with thickness of quench-condensed Bismuth films on substrates of various dielectric constants. Our results indicate a negative intial MR proportional to the square of the magnetic field. The conductance shows a power-law kind of dependence on thickness, with an exponent close to 1.33, characterisitic of a 2-D percolating system, only when the films are grown on a thin ($\sim 10${\rm Å} Germanium underlayer but not otherwise.
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Submitted 2 October, 1999;
originally announced October 1999.
