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Solar X-ray Monitor On Board the Chandrayaan-2 Orbiter: In-flight Performance and Science Prospects
Authors:
N. P. S. Mithun,
Santosh V. Vadawale,
Aveek Sarkar,
M. Shanmugam,
Arpit R. Patel,
Biswajit Mondal,
Bhuwan Joshi,
Janardhan P.,
Hiteshkumar L. Adalja,
Shiv Kumar Goyal,
Tinkal Ladiya,
Neeraj Kumar Tiwari,
Nishant Singh,
Sushil Kumar,
Manoj K. Tiwari,
M. H. Modi,
Anil Bhardwaj
Abstract:
The Solar X-ray Monitor (abbreviated as XSM) on board India's Chandrayaan-2 mission is designed to carry out broadband spectroscopy of the Sun from lunar orbit. It observes the Sun as a star and measures the spectrum every second in the soft X-ray band of 1 - 15 keV with an energy resolution better than 180 eV at 5.9 keV. The primary objective of the XSM is to provide the incident solar spectrum f…
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The Solar X-ray Monitor (abbreviated as XSM) on board India's Chandrayaan-2 mission is designed to carry out broadband spectroscopy of the Sun from lunar orbit. It observes the Sun as a star and measures the spectrum every second in the soft X-ray band of 1 - 15 keV with an energy resolution better than 180 eV at 5.9 keV. The primary objective of the XSM is to provide the incident solar spectrum for the X-ray fluorescence spectroscopy experiment on the Chandrayaan-2 orbiter, which aims to generate elemental abundance maps of the lunar surface. However, observations with the XSM can independently be used to study the Sun as well. The Chandrayaan-2 mission was launched on 22 July 2019, and the XSM began nominal operations, in lunar orbit, from September 2019. The in-flight observations, so far, have shown that its spectral performance has been identical to that on the ground. Measurements of the effective area from ground calibration were found to require some refinement, which has been carried out using solar observations at different incident angles. It also has been shown that the XSM is sensitive enough to detect solar activity well below A-class. This makes the investigations of microflares and the quiet solar corona feasible in addition to the study of the evolution of physical parameters during intense flares. This article presents the in-flight performance and calibration of the XSM instrument and discusses some specific science cases that can be addressed using observations with the XSM.
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Submitted 21 September, 2020;
originally announced September 2020.
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Ground Calibration of Solar X-ray Monitor On-board Chandrayaan-2 Orbiter
Authors:
N. P. S. Mithun,
Santosh V. Vadawale,
M. Shanmugam,
Arpit R. Patel,
Neeraj Kumar Tiwari,
Hiteshkumar L. Adalja,
Shiv Kumar Goyal,
Tinkal Ladiya,
Nishant Singh,
Sushil Kumar,
Manoj K. Tiwari,
M. H. Modi,
Biswajit Mondal,
Aveek Sarkar,
Bhuwan Joshi,
P. Janardhan,
Anil Bhardwaj
Abstract:
Chandrayaan-2, the second Indian mission to the Moon, carries a spectrometer called the Solar X-ray Monitor (XSM) to perform soft X-ray spectral measurements of the Sun while a companion payload measures the fluorescence emission from the Moon. Together these two payloads will provide quantitative estimates of elemental abundances on the lunar surface. XSM is also expected to provide significant c…
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Chandrayaan-2, the second Indian mission to the Moon, carries a spectrometer called the Solar X-ray Monitor (XSM) to perform soft X-ray spectral measurements of the Sun while a companion payload measures the fluorescence emission from the Moon. Together these two payloads will provide quantitative estimates of elemental abundances on the lunar surface. XSM is also expected to provide significant contributions to the solar X-ray studies with its highest time cadence and energy resolution spectral measurements. For this purpose, the XSM employs a Silicon Drift Detector and carries out energy measurements of incident photons in the 1 -- 15 keV range with a resolution of less than 180 eV at 5.9 keV, over a wide range of solar X-ray intensities. Extensive ground calibration experiments have been carried out with the XSM using laboratory X-ray sources as well as X-ray beam-line facilities to determine the instrument response matrix parameters required for quantitative spectral analysis. This includes measurements of gain, spectral redistribution function, and effective area, under various observing conditions. The capability of the XSM to maintain its spectral performance at high incident flux as well as the dead-time and pile-up characteristics have also been investigated. The results of these ground calibration experiments of the XSM payload are presented in this article.
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Submitted 14 July, 2020;
originally announced July 2020.
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X-ray Reflectivity measurements of Speculum metal mirrors using Synchrotron radiation
Authors:
E. A Nazimudeen,
T. E Girish,
Sunila Abraham,
M. H. Modi,
M. K. Tiwari,
C. V. Midhun,
T. S. Shyju,
K. M. Varier
Abstract:
Recent advances in grazing incidence X-ray optics using synchrotron radiation sources have stimulated the need for basic research in high quality mirror materials for novel applications. In this paper we communicate the results of the first measurements of glazing angle X-ray reflectivity (XRR) of speculum metal mirrors using synchrotron radiation sources. Our results agree with similar measuremen…
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Recent advances in grazing incidence X-ray optics using synchrotron radiation sources have stimulated the need for basic research in high quality mirror materials for novel applications. In this paper we communicate the results of the first measurements of glazing angle X-ray reflectivity (XRR) of speculum metal mirrors using synchrotron radiation sources. Our results agree with similar measurements made in polished speculum gratings by Arthur Compton and his collaborators during 1923 using ordinary X-ray tubes. Our experimental investigations are based on synchrotron radiation research facilities (Indus 2) maintained by Govt of India in Indore . Variations in the XRR with grazing angles of incidence and X-ray energy for cast, thin film and electron irradiated samples of speculum metal will be discussed in this paper.
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Submitted 21 February, 2020;
originally announced February 2020.
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Surface and interface study of pulsed-laser-deposited off-stoichiometric NiMnSb thin films on Si(100) substrate
Authors:
S. Rai,
M. K. Tiwari,
G. S. Lodha,
M. H. Modi,
M. K. Chattopadhyay,
S. Majumdar,
S. Gardelis,
Z. Viskadourakis,
J. Giapintzakis,
R. V. Nandedkar,
S. B. Roy,
P. Chaddah
Abstract:
We report a detailed study of surface and interface properties of pulsed-laser deposited NiMnSb films on Si (100) substrate as a function of film thickness. As the thickness of films is reduced below 35 nm formation of a porous layer is observed. Porosity in this layer increases with decrease in NiMnSb film thickness. These morphological changes of the ultra thin films are reflected in the inter…
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We report a detailed study of surface and interface properties of pulsed-laser deposited NiMnSb films on Si (100) substrate as a function of film thickness. As the thickness of films is reduced below 35 nm formation of a porous layer is observed. Porosity in this layer increases with decrease in NiMnSb film thickness. These morphological changes of the ultra thin films are reflected in the interesting transport and magnetic properties of these films. On the other hand, there are no influences of compositional in-homogeneity and surface/interface roughness on the magnetic and transport properties of the films.
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Submitted 13 October, 2005;
originally announced October 2005.
