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Optical, magneto-optical properties and fiber-drawing ability of tellurite glasses in the TeO2-ZnO-BaO ternary system
Authors:
J. Hrabovsky,
L. Strizik,
F. Desevedavy,
S. Tazlaru,
M. Kucera,
L. Nowak,
R. Krystufek,
J. Mistrik,
V. Dedic,
V. Kopecky Jr.,
G. Gadret,
T. Wagner,
F. Smektala,
M. Veis
Abstract:
The presented work is focused on the optical and magneto-optical characterization of TeO2-ZnO-BaO (TZB) tellurite glasses. We investigated the refractive index and extinction coefficient dispersion by spectroscopic ellipsometry from ultraviolet, 0.193 um, up to mid infrared, 25 um spectral region. Studied glasses exhibited large values of linear (n632 = 1.91-2.09) and non-linear refractive index (…
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The presented work is focused on the optical and magneto-optical characterization of TeO2-ZnO-BaO (TZB) tellurite glasses. We investigated the refractive index and extinction coefficient dispersion by spectroscopic ellipsometry from ultraviolet, 0.193 um, up to mid infrared, 25 um spectral region. Studied glasses exhibited large values of linear (n632 = 1.91-2.09) and non-linear refractive index (n2 = 1.20-2.67x10-11 esu), Verdet constant (V632 = 22-33 radT-1m-1) and optical band gap energy (Eg = 3.7-4.1 eV). The materials characterization revealed that BaO substitution by ZnO leads (at constant content of TeO2) to an increase in linear and nonlinear refractive index as well as Verdet constant while the optical band gap energy decreases. Fiber drawing ability of TeO2-ZnO-BaO glassy system has been demonstrated on 60TeO2-20ZnO-20BaO glass with presented mid infrared attenuation coefficient. Specific parameters such as dispersion and single oscillator energy, Abbe number, and first-/ third-order optical susceptibility are enclosed together with the values of magneto-optic anomaly derived from the calculation of measured dispersion of the refractive index.
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Submitted 2 August, 2023;
originally announced August 2023.
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A comparison of phase change materials in reconfigurable silicon photonic directional couplers
Authors:
Ting Yu Teo,
Milos Krbal,
Jan Mistrik,
Jan Prikryl,
Li Lu,
Robert Edward Simpson
Abstract:
The unique optical properties of phase change materials (PCMs) can be exploited to develop efficient reconfigurable photonic devices. Here, we design, model, and compare the performance of programmable 1X2 optical couplers based on: Ge$_2$Sb$_2$Te$_5$, Ge$_2$Sb$_2$Se$_4$Te$_1$, Sb$_2$Se$_3$, and Sb$_2$S$_3$ PCMs. Once programmed, these devices are passive, which can reduce the overall energy consu…
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The unique optical properties of phase change materials (PCMs) can be exploited to develop efficient reconfigurable photonic devices. Here, we design, model, and compare the performance of programmable 1X2 optical couplers based on: Ge$_2$Sb$_2$Te$_5$, Ge$_2$Sb$_2$Se$_4$Te$_1$, Sb$_2$Se$_3$, and Sb$_2$S$_3$ PCMs. Once programmed, these devices are passive, which can reduce the overall energy consumed compared to thermo-optic or electro-optic reconfigurable devices. Of all the PCMs studied, our ellipsometry refractive index measurements show that Sb$_2$S$_3$ has the lowest absorption in the telecommunications wavelength band. Moreover, Sb$_2$S$_3$-based couplers show the best overall performance, with the lowest insertion losses in both the amorphous and crystalline states. We show that by growth crystallization tuning at least four different coupling ratios can be reliably programmed into the Sb$_2$S$_3$ directional couplers. We used this effect to design a 2-bit tuneable Sb$_2$S$_3$ directional coupler with a dynamic range close to 32 dB. The bit-depth of the coupler appears to be limited by the crystallization stochasticity.
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Submitted 5 November, 2021; v1 submitted 2 June, 2021;
originally announced June 2021.
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Investigation of the quality of an As35S65 grating by spectroscopic ellipsometry
Authors:
Roman Antos,
Jan Mistrik,
Karel Palka,
Stanislav Slang,
Josef Navratil,
Jaroslav Hamrle,
Martin Veis,
Miroslav Vlcek
Abstract:
The quality of an As35S65 chalcogenide glass (ChG) grating fabricated by electron beam lithography (EBL) was characterized by optical scatterometry based on spectroscopic ellipsometry (SE) in the visible and near infrared spectral range and complementary techniques providing direct images, especially atomic force microscopy (AFM). The geometric dimensions and the shape of patterned grating lines w…
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The quality of an As35S65 chalcogenide glass (ChG) grating fabricated by electron beam lithography (EBL) was characterized by optical scatterometry based on spectroscopic ellipsometry (SE) in the visible and near infrared spectral range and complementary techniques providing direct images, especially atomic force microscopy (AFM). The geometric dimensions and the shape of patterned grating lines were determined by fitting modeled values (calculated by the Fourier modal method) to SE experimental data. A simple power-dependent function with only one variable parameter was successfully used to describe the shape of the patterned lines. The result yielded by SE is shown to correspond to AFM measurement with high accuracy, provided that optical constants of ChG modified by EBL were used in the fitting procedure. The line edge roughness (LER) of the grating was also investigated by further fitting the SE data to find out that no LER is optically detectable in the spectral range used, which is essential for the functionality of optical tools fabricated by EBL.
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Submitted 20 December, 2018;
originally announced December 2018.
