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Improving the long-term stability of new-generation perovskite-based TCO using binary and ternary oxides cap** layers
Authors:
Moussa Mezhoud,
Martando Rath,
Stéphanie Gascoin,
Sylvain Duprey,
Philippe Marie,
Julien Cardin,
Christophe Labbé,
Wilfrid Prellier,
Ulrike Lüders
Abstract:
We report the impact of cap** layers on vanadate based transparent conductive oxides (TCOs) to prolong the thermal stability with a minimal loss of resistivity during heat treatment in ambient environment. In the present study, various protecting layers (amorphous Al2O3, LaAlO3 (LAO), TiO2 grown in base pressure and TiO2 deposited under oxygen partial pressure) are grown in-situ on polycrystalli…
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We report the impact of cap** layers on vanadate based transparent conductive oxides (TCOs) to prolong the thermal stability with a minimal loss of resistivity during heat treatment in ambient environment. In the present study, various protecting layers (amorphous Al2O3, LaAlO3 (LAO), TiO2 grown in base pressure and TiO2 deposited under oxygen partial pressure) are grown in-situ on polycrystalline perovskite SrVO3 (SVO) thin films using Pulsed Laser Deposition (PLD). The results show that amorphous LaAlO3 is the most promising protection layer among the oxide layers, to preserve both electrical and optical properties of perovskite SVO films from natural as well as artificial aging. Our present approach for a cap** layer on SVO may address the long-term stability issues of correlated TCOs and would open an opportunity for the future oxide electronics applications.
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Submitted 10 June, 2024;
originally announced June 2024.
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Uncovering the lowest thickness limit for room-temperature ferromagnetism of Cr$_{1.6}$Te$_{2}$
Authors:
Sandeep Kumar Chaluvadi,
Shyni Punathum Chalil,
Anupam Jana,
Deepak Dagur,
Giovanni Vinai,
Federico Motti,
Jun Fujii,
Moussa Mezhoud,
Ulrike Lüders,
Vincent Polewczyk,
Ivana Vobornik,
Giorgio Rossi,
Chiara Bigi,
Younghun Hwang,
Thomas Olsen,
Pasquale Orgiani,
Federico Mazzola
Abstract:
Metallic ferromagnetic transition metal dichalcogenides have emerged as important building blocks for scalable magnonics and memory applications. Downscaling such systems to the ultra-thin limit is critical to integrate them into technology. Here, we achieved layer-by-layer control over the transition metal dichalcogenide Cr$_{1.6}$Te$_{2}$ by using pulsed laser deposition, and we uncovered the mi…
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Metallic ferromagnetic transition metal dichalcogenides have emerged as important building blocks for scalable magnonics and memory applications. Downscaling such systems to the ultra-thin limit is critical to integrate them into technology. Here, we achieved layer-by-layer control over the transition metal dichalcogenide Cr$_{1.6}$Te$_{2}$ by using pulsed laser deposition, and we uncovered the minimum critical thickness above which room temperature magnetic order is maintained. The electronic and magnetic structure is explored experimentally and theoretically and it is shown that the films exhibit strong in-plane magnetic anisotropy as a consequence of large spin-orbit effects. Our study elucidates both magnetic and electronic properties of Cr$_{1.6}$Te$_{2}$, and corroborates the importance of intercalation to tune the magnetic properties of nanoscale materials architectures.
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Submitted 7 June, 2024; v1 submitted 18 March, 2024;
originally announced March 2024.
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Artificial ageing of thin films of the indium-free transparent conducting oxide SrVO3
Authors:
M. Rath,
M. Mezhoud,
O. El Khaloufi,
O. Lebedev,
J. Cardin,
Ch. Labbé,
F. Gourbilleau,
V. Polewczyk,
G. Vinai,
P. Torelli,
A. Fouchet,
A. David,
W. Prellier,
U. Lüders
Abstract:
SrVO3 (SVO) is a prospective candidate to replace the conventional indium-tin-oxide (ITO) among the new transparent conducting oxide (TCO) generation. In this study, the structural, electrical, and optical properties of SVO thin films, both epitaxial and polycrystalline, are determined during and after heat treatments in the 150-250 °C range and under ambient environment in order to explore the ch…
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SrVO3 (SVO) is a prospective candidate to replace the conventional indium-tin-oxide (ITO) among the new transparent conducting oxide (TCO) generation. In this study, the structural, electrical, and optical properties of SVO thin films, both epitaxial and polycrystalline, are determined during and after heat treatments in the 150-250 °C range and under ambient environment in order to explore the chemical stability of this material. The use of these relatively low temperatures speeds up the natural ageing of the films, and allows to follow the evolution of their related properties. The combination of techniques rather sensitive to the film surface and of techniques sampling the film volume will emphasize the presence of a surface oxidation evolving in time at low annealing temperatures, whereas the perovskite phase is destroyed throughout the film for treatments above 200 °C. The present study is designed to understand the thermal degradation and long-term stability issues of vanadate-based TCOs, and to identify technologically viable solutions for the application of this group as new TCOs.
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Submitted 15 March, 2023;
originally announced March 2023.
