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MELCHIORS: The Mercator Library of High Resolution Stellar Spectroscopy
Authors:
P. Royer,
T. Merle,
K. Dsilva,
S. Sekaran,
H. Van Winckel,
Y. Frémat,
M. Van der Swaelmen,
S. Gebruers,
A. Tkachenko,
M. Laverick,
M. Dirickx,
G. Raskin,
H. Hensberge,
M. Abdul-Masih,
B. Acke,
M. L. Alonso,
S. Bandhu Mahato,
P. G. Beck,
N. Behara,
S. Bloemen,
B. Buysschaert,
N. Cox,
J. Debosscher,
P. De Cat,
P. Degroote
, et al. (49 additional authors not shown)
Abstract:
Over the past decades, libraries of stellar spectra have been used in a large variety of science cases, including as sources of reference spectra for a given object or a given spectral type. Despite the existence of large libraries and the increasing number of projects of large-scale spectral surveys, there is to date only one very high-resolution spectral library offering spectra from a few hundr…
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Over the past decades, libraries of stellar spectra have been used in a large variety of science cases, including as sources of reference spectra for a given object or a given spectral type. Despite the existence of large libraries and the increasing number of projects of large-scale spectral surveys, there is to date only one very high-resolution spectral library offering spectra from a few hundred objects from the southern hemisphere (UVES-POP) . We aim to extend the sample, offering a finer coverage of effective temperatures and surface gravity with a uniform collection of spectra obtained in the northern hemisphere.
Between 2010 and 2020, we acquired several thousand echelle spectra of bright stars with the Mercator-HERMES spectrograph located in the Roque de Los Muchachos Observatory in La Palma, whose pipeline offers high-quality data reduction products. We have also developed methods to correct for the instrumental response in order to approach the true shape of the spectral continuum. Additionally, we have devised a normalisation process to provide a homogeneous normalisation of the full spectral range for most of the objects.
We present a new spectral library consisting of 3256 spectra covering 2043 stars. It combines high signal-to-noise and high spectral resolution over the entire range of effective temperatures and luminosity classes. The spectra are presented in four versions: raw, corrected from the instrumental response, with and without correction from the atmospheric molecular absorption, and normalised (including the telluric correction).
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Submitted 5 November, 2023;
originally announced November 2023.
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Optimization of a CCD-in-CMOS TDI detector's operating clock voltages by Taguchi based Grey relational analysis
Authors:
Swaraj Bandhu Mahato,
Pierre Boulenc
Abstract:
In recent years, CCD-in-CMOS TDI image sensors are becoming increasingly popular for many small satellite missions to assure a fast and affordable access to space for Low Earth Observation. Our monolithic CCD-in-CMOS TDI imager features a specifically developed technology which combines the benefits of a classical CCD TDI with the advantages of CMOS System-On-a-Chip (SoC) design. Like CCD, this de…
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In recent years, CCD-in-CMOS TDI image sensors are becoming increasingly popular for many small satellite missions to assure a fast and affordable access to space for Low Earth Observation. Our monolithic CCD-in-CMOS TDI imager features a specifically developed technology which combines the benefits of a classical CCD TDI with the advantages of CMOS System-On-a-Chip (SoC) design. Like CCD, this detector is also controlled by a large number of clock voltages. Optimizing these voltages allows to increase the performance of the detector by improving multiple characteristic parameters, such as full well capacity (FWC), dark current, linearity, dark signal non-uniformity (DSNU) and charge transfer efficiency (CTE). Traditionally, it has been the standard practice to adjust the CCD voltages by trial and error methods to get a better image. Because of the large parameter space, such subjective procedures may yield far from the optimum performance. This paper reports a design of experiments (DOE) technique applied on the clock voltages to improve the multiple performance parameters of the detector. This method utilizes the Taguchi's orthogonal arrays of experiments to reduce the number of experiments with different voltage combinations. Finally, optimal combination of clock voltages is obtained by converting the multiple performance parameters of the detector into a single Grey relational grade. In this process, the sequences of obtaining parameter values are categorized according to the performance characteristics. The condition Higher-the-better is used for parameters like FWC and CTE whereas condition Lower-the-better is applied for parameters, such as dark current, linearity error and DSNU.
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Submitted 1 October, 2021;
originally announced October 2021.
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Multispectral CCD-in-CMOS Time Delay Integration imager for high resolution Earth observation
Authors:
Swaraj Bandhu Mahato,
Steven Thijs,
Jonas Bentell,
Linkun Wu,
Klaas Tack,
Pierre Boulenc,
Dorian Lasnet,
Renaud Van Langendonck,
Piet De Moor
Abstract:
Many future small satellite missions are aimed to provide low-cost remote sensing data at unprecedented revisit rates, with a ground resolution of less than one meter. This requires high resolution, fast and sensitive line-scan imagers operating at low power consumption and ideally featuring spectral sensitivity. In this paper we present comprehensive characterization results of our 7 band Back-Si…
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Many future small satellite missions are aimed to provide low-cost remote sensing data at unprecedented revisit rates, with a ground resolution of less than one meter. This requires high resolution, fast and sensitive line-scan imagers operating at low power consumption and ideally featuring spectral sensitivity. In this paper we present comprehensive characterization results of our 7 band Back-Side Illuminated (BSI) CCD-in-CMOS sensor with a pixel pitch of 5.4 um. We have extensively characterized the key performance parameters of our CCD-in-CMOS sensor, such as quantum efficiency (QE), full well capacity (FWC), read noise, conversion gain, non-linearity, dark current etc. Novelty of this device is the combination of 7 TDI bands on the same imager allowing simultaneous multispectral TDI capture. Glass-based broadband filters with a typical band-pass width of about 100 nm have been developed and glued together to form a filter assembly of 6 band-pass filters and one panchromatic channel. Multispectral capability of this sensor is particularly interesting for Low Earth Observation (LEO) applications such as environmental monitoring, precision agriculture, disaster detection and monitoring. To highlight its ad-vantages for use in vegetation observation, we demonstrated a fake leaf and a real leaf imaging using a 7 band BSI sensor with integrated filters operating in 7-band mode at 15 kHz.
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Submitted 29 September, 2021;
originally announced September 2021.
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Measuring Intra-pixel Sensitivity Variations of a CMOS Image Sensor
Authors:
Swaraj Bandhu Mahato,
Joris De Ridder,
Guy Meynants,
Gert Raskin,
Hans Van Winckel
Abstract:
Some applications in scientific imaging, like space-based high-precision photometry, benefit from a detailed characterization of the sensitivity variation within a pixel. A detailed map of the intra-pixel sensitivity (IPS) allows to increase the photometric accuracy by correcting for the impact of the tiny sub-pixel movements of the image sensor during integration. This paper reports the measureme…
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Some applications in scientific imaging, like space-based high-precision photometry, benefit from a detailed characterization of the sensitivity variation within a pixel. A detailed map of the intra-pixel sensitivity (IPS) allows to increase the photometric accuracy by correcting for the impact of the tiny sub-pixel movements of the image sensor during integration. This paper reports the measurement of the sub-pixel sensitivity variation and the extraction of the IPS map of a front-side illuminated CMOS image sensor with a pixel pitch of 6 \boldmath$μm$. Our optical measurement setup focuses a collimated beam onto the imaging surface with a microscope objective. The spot was scanned in a raster over a single pixel to probe the pixel response at each (sub-pixel) scan position. We model the optical setup in ZEMAX to cross-validate the optical spot profile described by an Airy diffraction pattern. In this work we introduce a forward modeling technique to derive the variation of the IPS. We model the optical spot scanning system and discretize the CMOS pixel response. Fitting this model to the measured data allows us to quantify the spatial sensitivity variation within a single pixel. Finally, we compare our results to those obtained from the more commonly used Wiener deconvolution.
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Submitted 4 May, 2018;
originally announced May 2018.
