FiND: Few-shot three-dimensional image-free confocal focusing on point-like emitters
Authors:
Swetapadma Sahoo,
Junyue Jiang,
Jaden Li,
Kieran Loehr,
Chad E. Germany,
**cheng Zhou,
Bryan K. Clark,
Simeon I. Bogdanov
Abstract:
Confocal fluorescence microscopy is widely applied for the study of point-like emitters such as biomolecules, material defects, and quantum light sources. Confocal techniques offer increased optical resolution, dramatic fluorescence background rejection and sub-nanometer localization, useful in super-resolution imaging of fluorescent biomarkers, single-molecule tracking, or the characterization of…
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Confocal fluorescence microscopy is widely applied for the study of point-like emitters such as biomolecules, material defects, and quantum light sources. Confocal techniques offer increased optical resolution, dramatic fluorescence background rejection and sub-nanometer localization, useful in super-resolution imaging of fluorescent biomarkers, single-molecule tracking, or the characterization of quantum emitters. However, rapid, noise-robust automated 3D focusing on point-like emitters has been missing for confocal microscopes. Here, we introduce FiND (Focusing in Noisy Domain), an imaging-free, non-trained 3D focusing framework that requires no hardware add-ons or modifications. FiND achieves focusing for signal-to-noise ratios down to 1, with a few-shot operation for signal-to-noise ratios above 5. FiND enables unsupervised, large-scale focusing on a heterogeneous set of quantum emitters. Additionally, we demonstrate the potential of FiND for real-time 3D tracking by following the drift trajectory of a single NV center indefinitely with a positional precision of < 10 nm. Our results show that FiND is a useful focusing framework for the scalable analysis of point-like emitters in biology, material science, and quantum optics.
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Submitted 10 November, 2023;
originally announced November 2023.
Identifying Higher Order Topology and Fractional Corner Charge Using Entanglement Spectra
Authors:
Penghao Zhu,
Kieran Loehr,
Taylor L. Hughes
Abstract:
We study the entanglement spectrum (ES) of two-dimensional $C_{n}$-symmetric second-order topological insulators (TIs). We show that some characteristic higher order topological observables, e.g., the filling anomaly and its associated fractional corner charge, can be determined from the ES of atomic and fragile TIs. By constructing the relationship between the configuration of Wannier orbitals an…
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We study the entanglement spectrum (ES) of two-dimensional $C_{n}$-symmetric second-order topological insulators (TIs). We show that some characteristic higher order topological observables, e.g., the filling anomaly and its associated fractional corner charge, can be determined from the ES of atomic and fragile TIs. By constructing the relationship between the configuration of Wannier orbitals and the number of protected in-gap states in the ES for different symmetric cuts in real space, we express the fractional corner charge in terms of the number of protected in-gap states of the ES. We show that our formula is robust in the presence of electron-electron interactions as long as the interactions preserve $C_{n}$ rotation symmetry and charge-conservation symmetry. Moreover, we discuss the possible signatures higher order topology in the many-body ES. Our methods allow the identification of some classes of higher order topology without requiring the usage of nested Wilson loops or nested entanglement spectra.
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Submitted 20 March, 2020; v1 submitted 22 October, 2019;
originally announced October 2019.
