Polarization dependent interface properties of ferroelectric Schottky barriers studied by soft X-ray absorption spectroscopy
Authors:
H. Kohlstedt,
A. Petraru,
M. Meier J. Denlinger,
J. Guo,
Y. Wanli,
A. Scholl,
B. Freelon,
T. Schneller,
R. Waser,
P. Yu,
R. Ramesh,
T. Learmonth,
P. -A. Glans,
K. E. Smith
Abstract:
We applied soft X-ray absorption spectroscopy to study the Ti L-edge in ferroelectric capacitors using a modified total electron yield method. The inner photo currents and the X-ray absorption spectra were polarization state dependent. The results are explained on the basis of photo electric effects and the inner potential in the ferroelectric capacitors as a result of back-to-back Schottky barr…
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We applied soft X-ray absorption spectroscopy to study the Ti L-edge in ferroelectric capacitors using a modified total electron yield method. The inner photo currents and the X-ray absorption spectra were polarization state dependent. The results are explained on the basis of photo electric effects and the inner potential in the ferroelectric capacitors as a result of back-to-back Schottky barriers superimposed by the potential due to the depolarization field. In general, the presented method offers the opportunity to investigate the electronic structure of buried metal-insulator and metal-semiconductor interfaces in thin film devices. Corresponding author: [email protected]
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Submitted 23 October, 2008;
originally announced October 2008.
Observation of Spin Fluctuations in a High-Tc Parent Compound Using Resonant Inelastic X-ray Scattering
Authors:
B. Freelon,
P. G. Medaglia,
A. Tebano,
G. Balestrino,
K. Okada,
A. Kotani,
F. Vernay,
T. P. Devereaux,
P. A. Glans,
T. Learmonth,
K. E. Smith,
A. L. D. Kilcoyne,
B. Rude,
I. Furtado,
J. -H. Guo
Abstract:
We report the first observation of soft-x-ray scattering from spin fluctuations in a high-Tc parent compound. An antiferromagnetic charge transfer insulator, CaCuO2, was irradiated by Cu M-edge soft x-rays. Ultra-high resolution measurements of scattered intensity revealed magnon-magnon excitations, due to spin exchange scattering, as low-energy loss features. The process is analogous to optical…
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We report the first observation of soft-x-ray scattering from spin fluctuations in a high-Tc parent compound. An antiferromagnetic charge transfer insulator, CaCuO2, was irradiated by Cu M-edge soft x-rays. Ultra-high resolution measurements of scattered intensity revealed magnon-magnon excitations, due to spin exchange scattering, as low-energy loss features. The process is analogous to optical Raman scattering. The spectra provide the first measurement of the two-magnon excitation energy and the antiferromagnetic exchange parameter in infinite-layer CaCuO2. The results reveal resonant inelastic soft x-ray scattering as a novel probe of the spin dynamics in cuprates.
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Submitted 27 June, 2008;
originally announced June 2008.
