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A Sixteen Multiple-Amplifier-Sensing CCD and Characterization Techniques Targeting The Next Generation of Astronomical Instruments
Authors:
Agustin J. Lapi,
Blas J. Irigoyen Gimenez,
Miqueas E. Gamero,
Claudio R. Chavez Blanco,
Fernando Chierchie,
Guillermo Fernandez Moroni,
Stephen E. Holland,
Juan Estrada,
Javier Tiffenberg
Abstract:
This work presents a candidate sensor for future spectroscopic applications, such as a Stage-5 Spectroscopic Survey Experiment or the Habitable Worlds Observatory. This new type of CCD sensor features multiple in-line amplifiers at its output stage allowing multiple measurements of the same charge packet, either in each amplifier and/or in the different amplifiers. Recently, the operation of an 8-…
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This work presents a candidate sensor for future spectroscopic applications, such as a Stage-5 Spectroscopic Survey Experiment or the Habitable Worlds Observatory. This new type of CCD sensor features multiple in-line amplifiers at its output stage allowing multiple measurements of the same charge packet, either in each amplifier and/or in the different amplifiers. Recently, the operation of an 8-amplifier sensor has been experimentally demonstrated, and the operation of a 16-amplifier sensor is presented in this work. This new sensor enables a noise level of approximately $1^e_{\rm rms}$ with a single sample per amplifier. Additionally, it is shown that sub-electron noise can be achieved using multiple samples per amplifier. In addition to demonstrating the performance of the 16-amplifier sensor, this work aims to create a framework for future analysis and performance optimization of this type of detectors. New models and techniques are presented to characterize specific parameters, which are absent in conventional CCDs and Skipper-CCDs: charge transfer between amplifiers and independent and common noise in the amplifiers, and their processing.
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Submitted 29 May, 2024;
originally announced May 2024.
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Skipper-in-CMOS: Non-Destructive Readout with Sub-Electron Noise Performance for Pixel Detectors
Authors:
Agustin J. Lapi,
Miguel Sofo-Haro,
Benjamin C. Parpillon,
Adi Birman,
Guillermo Fernandez-Moroni,
Lorenzo Rota,
Fabricio Alcalde Bessia,
Aseem Gupta,
Claudio Chavez Blanco,
Fernando Chierchie,
Julie Segal,
Christopher J. Kenney,
Angelo Dragone,
Shaorui Li,
Davide Braga,
Amos Fenigstein,
Juan Estrada,
Farah Fahim
Abstract:
The Skipper-in-CMOS image sensor integrates the non-destructive readout capability of Skipper Charge Coupled Devices (Skipper-CCDs) with the high conversion gain of a pinned photodiode in a CMOS imaging process, while taking advantage of in-pixel signal processing. This allows both single photon counting as well as high frame rate readout through highly parallel processing. The first results obtai…
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The Skipper-in-CMOS image sensor integrates the non-destructive readout capability of Skipper Charge Coupled Devices (Skipper-CCDs) with the high conversion gain of a pinned photodiode in a CMOS imaging process, while taking advantage of in-pixel signal processing. This allows both single photon counting as well as high frame rate readout through highly parallel processing. The first results obtained from a 15 x 15 um^2 pixel cell of a Skipper-in-CMOS sensor fabricated in Tower Semiconductor's commercial 180 nm CMOS Image Sensor process are presented. Measurements confirm the expected reduction of the readout noise with the number of samples down to deep sub-electron noise of 0.15rms e-, demonstrating the charge transfer operation from the pinned photodiode and the single photon counting operation when the sensor is exposed to light. The article also discusses new testing strategies employed for its operation and characterization.
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Submitted 19 February, 2024;
originally announced February 2024.
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Fast Single-Quantum Measurement with a Multi-Amplifier Sensing Charge-Coupled Device
Authors:
Ana M. Botti,
Brenda A. Cervantes-Vergara,
Claudio R. Chavez,
Fernando Chierchie,
Alex Drlica-Wagner,
Juan Estrada,
Guillermo Fernandez Moroni,
Stephen E. Holland,
Blas J. Irigoyen Gimenez,
Agustin J. Lapi,
Edgar Marrufo Villalpando,
Miguel Sofo Haro,
Javier Tiffenberg,
Sho Uemura
Abstract:
A novel readout architecture that uses multiple non-destructive floating-gate amplifiers to achieve sub-electron readout noise in a thick, fully-depleted silicon detector is presented. This Multi-Amplifier Sensing Charge-Coupled Device (MAS-CCD) can perform multiple independent charge measurements with each amplifier; measurements with multiple amplifiers can then be combined to further reduce the…
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A novel readout architecture that uses multiple non-destructive floating-gate amplifiers to achieve sub-electron readout noise in a thick, fully-depleted silicon detector is presented. This Multi-Amplifier Sensing Charge-Coupled Device (MAS-CCD) can perform multiple independent charge measurements with each amplifier; measurements with multiple amplifiers can then be combined to further reduce the readout noise. The readout speed of this detector scales roughly linearly with the number of amplifiers without requiring segmentation of the active area. The performance of this detector is demonstrated, emphasizing the ability to resolve individual quanta and the ability to combine measurements across amplifiers to reduce readout noise. The unprecedented low noise and fast readout of the MAS-CCD make it a unique technology for astronomical observations, quantum imaging, and low-energy interacting particles.
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Submitted 18 August, 2023;
originally announced August 2023.
