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Full field electron spectromicroscopy applied to ferroelectric materials
Authors:
N. Barrett,
J. E. Rault,
J. L. Wang,
C. Mathieu,
A. Locatelli,
T. O. Mentes,
M. A. Nino,
S. Fusil,
M. Bibes,
A. Barthelemy,
D. Sando,
W. Ren,
S. Prosandeev,
L. Bellaiche,
B. Vilquin,
A. Petraru,
I. P. Krug,
C. M. Schneider
Abstract:
The application of PhotoEmission Electron Microscopy (PEEM) and Low Energy Electron Microscopy (LEEM) techniques to the study of the electronic and chemical structure of ferroelectric materials is reviewed. Electron optics in both techniques gives spatial resolution of a few tens of nanometres. PEEM images photoelectrons whereas LEEM images reflected and elastically backscattered electrons. Both P…
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The application of PhotoEmission Electron Microscopy (PEEM) and Low Energy Electron Microscopy (LEEM) techniques to the study of the electronic and chemical structure of ferroelectric materials is reviewed. Electron optics in both techniques gives spatial resolution of a few tens of nanometres. PEEM images photoelectrons whereas LEEM images reflected and elastically backscattered electrons. Both PEEM and LEEM can be used in direct and reciprocal space imaging. Together, they provide access to surface charge, work function, topography, chemical map**, surface crystallinity and band structure. Examples of applications for the study of ferroelectric thin films and single crystals are presented.
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Submitted 13 June, 2018;
originally announced June 2018.
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Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy
Authors:
J. Schaab,
I. P. Krug,
F. Nickel,
D. M. Gottlob,
H. Doğanay,
A. Cano,
M. Hentschel,
Z. Yan,
E. Bourret,
C. M. Schneider,
R. Ramesh,
D. Meier
Abstract:
High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEM and demonstrate its capability for imaging and investigating domain walls in ferroelectrics with high-spatial resolution. Using ErMnO3 as test system, we show that ferroelectric domain walls can be visualized b…
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High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEM and demonstrate its capability for imaging and investigating domain walls in ferroelectrics with high-spatial resolution. Using ErMnO3 as test system, we show that ferroelectric domain walls can be visualized based on photo-induced charging effects and local variations in their electronic conductance can be mapped by analyzing the energy distribution of photoelectrons. Our results open the door for non-destructive, contract-free, and element-specific studies of the electronic and chemical structure at domain walls in ferroelectrics.
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Submitted 9 May, 2014; v1 submitted 8 May, 2014;
originally announced May 2014.
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Electronic properties of Co$_{2}$FeSi investigated by x-ray magnetic linear dichroism
Authors:
Mirko Emmel,
Alexey Alfonsov,
Dominik Legut,
Andreas Kehlberger,
Enrique Vilanova,
Ingo P. Krug,
Daniel M. Gottlob,
Marilena Belesi,
Bernd Büchner,
Mathias Kläui,
Peter M. Oppeneer,
Sabine Wurmehl,
Hans-Joachim Elmers,
Gerhard Jakob
Abstract:
We present experimental XMLD spectra measured on epitaxial (001)-oriented thin Co$_{2}$FeSi films, which are rich in features and depend sensitively on the degree of atomic order and interdiffusion from cap** layers. Al- and Cr-capped films with different degrees of atomic order were prepared by DC magnetron sputtering by varying the deposition temperatures. The local structural properties of th…
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We present experimental XMLD spectra measured on epitaxial (001)-oriented thin Co$_{2}$FeSi films, which are rich in features and depend sensitively on the degree of atomic order and interdiffusion from cap** layers. Al- and Cr-capped films with different degrees of atomic order were prepared by DC magnetron sputtering by varying the deposition temperatures. The local structural properties of the film samples were additionally investigated by nuclear magnetic resonance (NMR) measurements. The XMLD spectra of the different samples show clear and uniform trends at the $L_{3,2}$ edges. The Al-capped samples show similar behavior as previous measured XMLD spectra of Co$_2$FeSi$_{0.6}$Al$_{0.4}$. Thus, we assume that during deposition Al atoms are being implanted into the subsurface of Co$_{2}$FeSi. Such an interdiffusion is not observed for the corresponding Cr-capped films, which makes Cr the material of choice for cap** Co$_{2}$FeSi films. We report stronger XMLD intensities at the $L_{3,2}$ Co and Fe egdes for films with a higher saturation magnetization. Additionally, we compare the spectra with \textit{ab initio} predictions and obtain a reasonably good agreement. Furthermore, we were able to detect an XMCD signal at the Si $L$-edge, indicating the presence of a magnetic moment at the Si atoms.
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Submitted 28 January, 2014; v1 submitted 25 October, 2013;
originally announced October 2013.
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Symmetry analysis of magneto-optical effects: The case of x-ray diffraction and x-ray absorption at the transition metal L23 edge
Authors:
M. W. Haverkort,
N. Hollmann,
I. P. Krug,
A. Tanaka
Abstract:
A general symmetry analysis of the optical conductivity or scattering tensor is used to rewrite the conductivity tensor as a sum of fundamental spectra multiplied by simple functions depending on the local magnetization direction. Using this formalism, we present several numerical examples at the transition metal L23 edge. From these numerical calculations we can conclude that large deviations f…
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A general symmetry analysis of the optical conductivity or scattering tensor is used to rewrite the conductivity tensor as a sum of fundamental spectra multiplied by simple functions depending on the local magnetization direction. Using this formalism, we present several numerical examples at the transition metal L23 edge. From these numerical calculations we can conclude that large deviations from the magneto-optical effects in spherical symmetry are found. These findings are in particular important for resonant x-ray diffraction experiments where the polarization dependence and azimuthal dependence of the scattered Bragg intensity is used to determine the local ordered magnetization direction.
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Submitted 4 November, 2009;
originally announced November 2009.
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Magnetic coupling in highly-ordered NiO/Fe3O4(110): Ultrasharp magnetic interfaces vs. long-range magnetoelastic interactions
Authors:
I. P. Krug,
F. U. Hillebrecht,
H. Gomonaj,
M. Haverkort,
A. Tanaka,
L. H. Tjeng,
C. M. Schneider
Abstract:
We present a laterally resolved X-ray magnetic dichroism study of the magnetic proximity effect in a highly ordered oxide system, i.e. NiO films on Fe3O4(110). We found that the magnetic interface shows an ultrasharp electronic, magnetic and structural transition from the ferrimagnet to the antiferromagnet. The monolayer which forms the interface reconstructs to NiFe2O4 and exhibits an enhanced…
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We present a laterally resolved X-ray magnetic dichroism study of the magnetic proximity effect in a highly ordered oxide system, i.e. NiO films on Fe3O4(110). We found that the magnetic interface shows an ultrasharp electronic, magnetic and structural transition from the ferrimagnet to the antiferromagnet. The monolayer which forms the interface reconstructs to NiFe2O4 and exhibits an enhanced Fe and Ni orbital moment, possibly caused by bonding anisotropy or electronic interaction between Fe and Ni cations. The absence of spin-flop coupling for this crystallographic orientation can be explained by a structurally uncompensated interface and additional magnetoelastic effects.
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Submitted 9 January, 2008;
originally announced January 2008.
