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Experimental analysis of single particle deformations and rotations in colloidal and granular systems
Authors:
Marcel Roth,
Michael Franzmann,
Maria D'Acunzi,
Max Kreiter,
Günter K. Auernhammer
Abstract:
Confocal microscopy of fluorescent labeled particles has been used to study the dynamical and structural properties of colloidal and granular matter in real space. Localization algorithms allow for a fully automatized determination of the three dimensional positions and translational motions of all constituent (spherical) particles in the observed volume. Though, particle deformations or rotationa…
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Confocal microscopy of fluorescent labeled particles has been used to study the dynamical and structural properties of colloidal and granular matter in real space. Localization algorithms allow for a fully automatized determination of the three dimensional positions and translational motions of all constituent (spherical) particles in the observed volume. Though, particle deformations or rotational motions were hardly addressed. Here we present preparation and image processing techniques to also extract the deformation and rotational state of the particles. The deformation analysis is worked out for particles with a hollow sphere-like fluorescence intensity distribution that are more sensitive to small deformations. In the second case of rotations we utilize the angle dependence of the light absorption of the incorporated dye molecules to prepare optically anisotropic particles in analogy to polarized fluorescence after photobleaching. Rotations of these particles are expressed as intensity fluctuations in the confocal images. In contrast to existing methods our techniques do not reduce the quality of the actual particle localization. They can help understanding complex reorganization processes in arrested states of colloidal and granular materials during aging or under external stimuli such as shear or compression.
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Submitted 6 December, 2011; v1 submitted 18 June, 2011;
originally announced June 2011.
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Detecting molecules with plasmonic resonators - Analytic expressions and bounds for the sensitivity and figure of merit
Authors:
A. Unger,
M. Kreiter
Abstract:
We derive analytic expressions for the sensitivity and figure of merit for refractive index sensing with plasmonic resonators in the quasistatic limit. Based on these expressions the limits of detection and their origins are investigated. The critical role of limited energy concentration within the resonators surrounding is shown. The classical figure of merit is found to be solely dependent on th…
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We derive analytic expressions for the sensitivity and figure of merit for refractive index sensing with plasmonic resonators in the quasistatic limit. Based on these expressions the limits of detection and their origins are investigated. The critical role of limited energy concentration within the resonators surrounding is shown. The classical figure of merit is found to be solely dependent on the ratio of real to imaginary part of the resonators permittivity . Based on these findings we discuss the optimum resonance wavelength and resonator size and shape for single molecule detection.
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Submitted 6 July, 2010;
originally announced July 2010.
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Photonic mode density effects on single-molecule fluorescence blinking
Authors:
F. D. Stefani,
K. Vasilev,
N. Bocchio,
F. Gaul,
A. Pomozzi,
M. Kreiter
Abstract:
We investigated the influence of the photonic mode density (PMD) on the triplet dynamics of individual chromophores on a dielectric interface by comparing their response in the presence and absence of a nearby gold film. Lifetimes of the excited singlet state were evaluated in ordet to measure directly the PMD at the molecules position. Triplet state lifetimes were simultaneously determined by s…
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We investigated the influence of the photonic mode density (PMD) on the triplet dynamics of individual chromophores on a dielectric interface by comparing their response in the presence and absence of a nearby gold film. Lifetimes of the excited singlet state were evaluated in ordet to measure directly the PMD at the molecules position. Triplet state lifetimes were simultaneously determined by statistical analysis of the detection time of the fluorescence photons. The observed singlet decay rates are in agreement with the predicted PMD for molecules with different orientations. The triplet decay rate is modified in a fashion correlated to the singlet decay rate. These results show that PMD engineering can lead to an important suppression of the fluorescence, introducing a novel aspect of the physical mechanism to enhance fluorescence intensity in PMD-enhancing systems such as plasmonic devices.
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Submitted 19 September, 2006;
originally announced September 2006.
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Photoemission Electron Microscopy as a tool for the investigation of optical near fields
Authors:
M. Cinchetti,
A. Gloskovskii,
S. A. Nepjiko,
G. Schönhense,
H. Rochholz,
M. Kreiter
Abstract:
Photoemission electron microscopy was used to image the electrons photoemitted from specially tailored Ag nanoparticles deposited on a Si substrate (with its native oxide SiO$_{x}$). Photoemission was induced by illumination with a Hg UV-lamp (photon energy cutoff $\hbarω_{UV}=5.0$ eV, wavelength $λ_{UV}=250$ nm) and with a Ti:Sapphire femtosecond laser ($\hbarω_{l}=3.1$ eV, $λ_{l}=400$ nm, puls…
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Photoemission electron microscopy was used to image the electrons photoemitted from specially tailored Ag nanoparticles deposited on a Si substrate (with its native oxide SiO$_{x}$). Photoemission was induced by illumination with a Hg UV-lamp (photon energy cutoff $\hbarω_{UV}=5.0$ eV, wavelength $λ_{UV}=250$ nm) and with a Ti:Sapphire femtosecond laser ($\hbarω_{l}=3.1$ eV, $λ_{l}=400$ nm, pulse width below 200 fs), respectively. While homogeneous photoelectron emission from the metal is observed upon illumination at energies above the silver plasmon frequency, at lower photon energies the emission is localized at tips of the structure. This is interpreted as a signature of the local electrical field therefore providing a tool to map the optical near field with the resolution of emission electron microscopy.
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Submitted 25 May, 2005;
originally announced May 2005.
