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Neural network analysis of neutron and X-ray reflectivity data: Incorporating prior knowledge for tackling the phase problem
Authors:
Valentin Munteanu,
Vladimir Starostin,
Alessandro Greco,
Linus Pithan,
Alexander Gerlach,
Alexander Hinderhofer,
Stefan Kowarik,
Frank Schreiber
Abstract:
Due to the lack of phase information, determining the physical parameters of multilayer thin films from measured neutron and X-ray reflectivity curves is, on a fundamental level, an underdetermined inverse problem. This so-called phase problem poses limitations on standard neural networks, constraining the range and number of considered parameters in previous machine learning solutions. To overcom…
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Due to the lack of phase information, determining the physical parameters of multilayer thin films from measured neutron and X-ray reflectivity curves is, on a fundamental level, an underdetermined inverse problem. This so-called phase problem poses limitations on standard neural networks, constraining the range and number of considered parameters in previous machine learning solutions. To overcome this, we present an approach that utilizes prior knowledge to regularize the training process over larger parameter spaces. We demonstrate the effectiveness of our method in various scenarios, including multilayer structures with box model parameterization and a physics-inspired special parameterization of the scattering length density profile for a multilayer structure. By leveraging the input of prior knowledge, we can improve the training dynamics and address the underdetermined ("ill-posed") nature of the problem. In contrast to previous methods, our approach scales favorably when increasing the complexity of the inverse problem, working properly even for a 5-layer multilayer model and an N-layer periodic multilayer model with up to 17 open parameters.
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Submitted 28 June, 2023;
originally announced July 2023.
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Closing the loop: Autonomous experiments enabled by machine-learning-based online data analysis in synchrotron beamline environments
Authors:
Linus Pithan,
Vladimir Starostin,
David Mareček,
Lukas Petersdorf,
Constantin Völter,
Valentin Munteanu,
Maciej Jankowski,
Oleg Konovalov,
Alexander Gerlach,
Alexander Hinderhofer,
Bridget Murphy,
Stefan Kowarik,
Frank Schreiber
Abstract:
Recently, there has been significant interest in applying machine learning (ML) techniques to X-ray scattering experiments, which proves to be a valuable tool for enhancing research that involves large or rapidly generated datasets. ML allows for the automated interpretation of experimental results, particularly those obtained from synchrotron or neutron facilities. The speed at which ML models ca…
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Recently, there has been significant interest in applying machine learning (ML) techniques to X-ray scattering experiments, which proves to be a valuable tool for enhancing research that involves large or rapidly generated datasets. ML allows for the automated interpretation of experimental results, particularly those obtained from synchrotron or neutron facilities. The speed at which ML models can process data presents an important opportunity to establish a closed-loop feedback system, enabling real-time decision-making based on online data analysis. In this study, we describe the incorporation of ML into a closed-loop workflow for X-ray reflectometry (XRR), using the growth of organic thin films as an example. Our focus lies on the beamline integration of ML-based online data analysis and closed-loop feedback. We present solutions that provide an elementary data analysis in real time during the experiment without introducing the additional software dependencies in the beamline control software environment. Our data demonstrates the accuracy and robustness of ML methods for analyzing XRR curves and Bragg reflections and its autonomous control over a vacuum deposition setup.
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Submitted 20 June, 2023;
originally announced June 2023.
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Fast Fitting of Reflectivity Data of Growing Thin Films Using Neural Networks
Authors:
Alessandro Greco,
Vladimir Starostin,
Christos Karapanagiotis,
Alexander Hinderhofer,
Alexander Gerlach,
Linus Pithan,
Sascha Liehr,
Frank Schreiber,
Stefan Kowarik
Abstract:
X-ray reflectivity (XRR) is a powerful and popular scattering technique that can give valuable insight into the growth behavior of thin films. In this study, we show how a simple artificial neural network model can be used to predict the thickness, roughness and density of thin films of different organic semiconductors (diindenoperylene, copper(II) phthalocyanine and $α$-sexithiophene) on silica f…
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X-ray reflectivity (XRR) is a powerful and popular scattering technique that can give valuable insight into the growth behavior of thin films. In this study, we show how a simple artificial neural network model can be used to predict the thickness, roughness and density of thin films of different organic semiconductors (diindenoperylene, copper(II) phthalocyanine and $α$-sexithiophene) on silica from their XRR data with millisecond computation time and with minimal user input or a priori knowledge. For a large experimental dataset of 372 XRR curves, we show that a simple fully connected model can already provide good predictions with a mean absolute percentage error of 8-18 % when compared to the results obtained by a genetic least mean squares fit using the classical Parratt formalism. Furthermore, current drawbacks and prospects for improvement are discussed.
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Submitted 7 October, 2019;
originally announced October 2019.
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Absolute Seebeck coefficient of thin platinum films
Authors:
M. Kockert,
R. Mitdank,
A. Zykov,
S. Kowarik,
S. F. Fischer
Abstract:
The influence of size effects on the thermoelectric properties of thin platinum films is investigated and compared to the bulk. Structural properties, like the film thickness and the grain size, are varied. We correlate the electron mean free path with the temperature dependence of the electrical conductivity and the absolute Seebeck coefficient $S_{\text{Pt}}$ of platinum. We use a measurement pl…
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The influence of size effects on the thermoelectric properties of thin platinum films is investigated and compared to the bulk. Structural properties, like the film thickness and the grain size, are varied. We correlate the electron mean free path with the temperature dependence of the electrical conductivity and the absolute Seebeck coefficient $S_{\text{Pt}}$ of platinum. We use a measurement platform as a standardized method to determine $S_{\text{Pt}}$ and show that $S_{\text{Pt,film}}$ is reduced compared to $S_{\text{Pt,bulk}}$. Boundary and surface scattering reduce the thermodiffusion and the phonon drag contribution to $S_{\text{Pt,film}}$ by nearly the same factor. A detailed discussion and a model to describe the temperature dependence of the absolute Seebeck coefficient and the influence of size effects of electron-phonon and phonon-phonon interaction on $S_{\text{Pt}}$ is given.
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Submitted 28 March, 2019;
originally announced March 2019.
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Uncovering the (un-)occupied electronic structure of a buried hybrid interface
Authors:
S. Vempati,
J. -C. Deinert,
L. Gierster,
L. Bogner,
C. Richter,
N. Mutz,
S. Blumstengel,
A. Zykov,
S. Kowarik,
Y. Garmshausen,
J. Hildebrandt,
S. Hecht,
J. Stähler
Abstract:
The energy level alignment at organic/inorganic (o/i) semiconductor interfaces is crucial for any light-emitting or -harvesting functionality. Essential is the access to both occupied and unoccupied electronic states directly at the interface, which is often deeply buried underneath thick organic films and challenging to characterize. We use several complementary experimental techniques to determi…
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The energy level alignment at organic/inorganic (o/i) semiconductor interfaces is crucial for any light-emitting or -harvesting functionality. Essential is the access to both occupied and unoccupied electronic states directly at the interface, which is often deeply buried underneath thick organic films and challenging to characterize. We use several complementary experimental techniques to determine the electronic structure of p-quinquephenyl pyridine (5P-Py) adsorbed on ZnO(10-10). The parent anchoring group, pyridine, significantly lowers the work function by up to 2.9 eV and causes an occupied in-gap state (IGS) directly below the Fermi level $E_\text{F}$. Adsorption of upright-standing 5P-Py also leads to a strong work function reduction of up to 2.1 eV and to a similar IGS. The latter is then used as an initial state for the transient population of three normally unoccupied molecular levels through optical excitation and, due to its localization right at the o/i interface, provides interfacial sensitivity, even for thick 5P-Py films. We observe two final states above the vacuum level and one bound state at around 2 eV above $E_\text{F}$, which we attribute to the 5P-Py LUMO. By the separate study of anchoring group and organic dye combined with the exploitation of the occupied IGS for selective interfacial photoexcitation this work provides a new pathway for characterizing the electronic structure at buried o/i interfaces.
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Submitted 2 November, 2018;
originally announced November 2018.
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Strain-gradient-induced magnetic anisotropy in straight-stripe mixed-phase bismuth ferrites: An insight into flexomagnetic phenomenon
Authors:
** Hong Lee,
Kwang-Eun Kim,
Byung-Kweon Jang,
Ahmet A. Ünal,
Sergio Valencia,
Florian Kronast,
Kyung-Tae Ko,
Stefan Kowarik,
Jan Seidel,
Chan-Ho Yang
Abstract:
Implementation of antiferromagnetic compounds as active elements in spintronics has been hindered by their insensitive nature against external perturbations which causes difficulties in switching among different antiferromagnetic spin configurations. Electrically-controllable strain gradient can become a key parameter to tune the antiferromagnetic states of multiferroic materials. We have discover…
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Implementation of antiferromagnetic compounds as active elements in spintronics has been hindered by their insensitive nature against external perturbations which causes difficulties in switching among different antiferromagnetic spin configurations. Electrically-controllable strain gradient can become a key parameter to tune the antiferromagnetic states of multiferroic materials. We have discovered a correlation between an electrically-written straight-stripe mixed-phase boundary and an in-plane antiferromagnetic spin axis in highly-elongated La-5%-doped BiFeO$_{3}$ thin films by performing polarization-dependent photoemission electron microscopy in conjunction with cluster model calculations. Model Hamiltonian calculation for the single-ion anisotropy including the spin-orbit interaction has been performed to figure out the physical origin of the link between the strain gradient present in the mixed phase area and its antiferromagnetic spin axis. Our findings enable estimation of the strain-gradient-induced magnetic anisotropy energy per Fe ion at around 5$\times$10$^{-12}$ eV m, and provide a new pathway towards an electric-field-induced 90$^{\circ}$ rotation of antiferromagnetic spin axis at room temperature by flexomagnetism.
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Submitted 21 April, 2017;
originally announced April 2017.
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Polymorphism in $α$-sexithiophene crystals: Relative stability and transition path
Authors:
Bernhard Klett,
Caterina Cocchi,
Linus Pithan,
Stefan Kowarik,
Claudia Draxl
Abstract:
We present a joint theoretical and experimental study to investigate polymorphism in $α$-sexithiophene (6T) crystals. By means of density-functional theory calculations, we clarify that the low-temperature phase is favorable over the high-temperature one, with higher relative stability by about 50 meV/molecule. This result is in agreement with our thermal desorption measurements. We also propose a…
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We present a joint theoretical and experimental study to investigate polymorphism in $α$-sexithiophene (6T) crystals. By means of density-functional theory calculations, we clarify that the low-temperature phase is favorable over the high-temperature one, with higher relative stability by about 50 meV/molecule. This result is in agreement with our thermal desorption measurements. We also propose a transition path between the high- and low-temperature 6T polymorphs, estimating an upper bound for the energy barrier of about 1 eV/molecule. The analysis of the electronic properties of the investigated 6T crystal structures complements our study.
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Submitted 12 February, 2016;
originally announced February 2016.
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Comparative study of the growth of sputtered aluminum oxide films on organic and inorganic substrates
Authors:
Stefan Sellner,
Alexander Gerlach,
Stefan Kowarik,
Frank Schreiber,
Helmut Dosch,
Stephan Meyer,
Jens Pflaum,
Gerhard Ulbricht
Abstract:
We present a comparative study of the growth of the technologically highly relevant gate dielectric and encapsulation material aluminum oxide in inorganic and also organic heterostructures. Atomic force microscopy studies indicate strong similarities in the surface morphology of aluminum oxide films grown on these chemically different substrates. In addition, from X-ray reflectivity measurements…
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We present a comparative study of the growth of the technologically highly relevant gate dielectric and encapsulation material aluminum oxide in inorganic and also organic heterostructures. Atomic force microscopy studies indicate strong similarities in the surface morphology of aluminum oxide films grown on these chemically different substrates. In addition, from X-ray reflectivity measurements we extract the roughness exponent βof aluminum oxide growth on both substrates. By renormalising the aluminum oxide roughness by the roughness of the underlying organic film we find good agreement with βas obtained from the aluminum oxide on silicon oxide (β= 0.38 \pm 0.02), suggesting a remarkable similarity of the aluminum oxide growth on the two substrates under the conditions employed.
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Submitted 30 November, 2007;
originally announced November 2007.
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Optical Properties of Pentacene and Perfluoropentacene Thin Films
Authors:
Alexander Hinderhofer,
Ute Heinemeyer,
Alexander Gerlach,
Stefan Kowarik,
Robert M. J. Jacobs,
Youichi Sakamoto,
Toshiyasu Suzuki,
Frank Schreiber
Abstract:
The optical properties of pentacene (PEN) and perfluoropentacene(PFP) thin films on various SiO2 substrates were studied using variable angle spectroscopic ellipsometry. Structural characterization was performed using X-ray reflectivity and atomic force microscopy. A uniaxial model with the optic axis normal to the sample surface was used to analyze the ellipsometry data. A Strong optical anisot…
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The optical properties of pentacene (PEN) and perfluoropentacene(PFP) thin films on various SiO2 substrates were studied using variable angle spectroscopic ellipsometry. Structural characterization was performed using X-ray reflectivity and atomic force microscopy. A uniaxial model with the optic axis normal to the sample surface was used to analyze the ellipsometry data. A Strong optical anisotropy was observed and enabled the direction of the transition dipole of the absorption bands to be determined. Furthermore, comparison of the optical constants of PEN and PFP thin films with the absorption spectra of the monomers in solution shows significant changes due to the crystalline environment. Relative to the monomer spectrum the HOMO-LUMO transition observed in PEN (PFP) thin film is reduced by 210 meV (280 meV). Surprisingly, a second absorption band in the PFP thin film shows a slight blueshift (40 meV) compared to the spectrum of the monomer with its transition dipole perpendicular to that of the first absorption band.
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Submitted 25 July, 2007;
originally announced July 2007.
