Showing 1–8 of 8 results for author: Koppell, S

Analysis and Applications of a Heralded Electron Source

Authors: Stewart A. Koppell, John W. Simonaitis, Maurice A. R. Krielaart, William P. Putnam, Karl K. Berggren, Phillip D. Keathley

Abstract: We analytically describe the noise properties of a heralded electron source made from a standard electron gun, a weak photonic coupler, a single photon counter, and an electron energy filter. We argue the traditional heralding figure of merit, the Klyshko efficiency, is an insufficient statistic for characterizing performance in dose-control and dose-limited applications. Instead, we describe the… ▽ More We analytically describe the noise properties of a heralded electron source made from a standard electron gun, a weak photonic coupler, a single photon counter, and an electron energy filter. We argue the traditional heralding figure of merit, the Klyshko efficiency, is an insufficient statistic for characterizing performance in dose-control and dose-limited applications. Instead, we describe the sub-Poissonian statistics of the source using the fractional reduction in variance and the fractional increase in Fisher Information. Using these figures of merit, we discuss the engineering requirements for efficient heralding and evaluate potential applications using simple models of electron lithography, bright-field scanning transmission electron microscopy (BFSTEM), and scanning electron microscopy (SEM). We find that the advantage in each of these applications is situational, but potentially significant: dynamic control of the trade-off between write speed and shot noise in electron lithography; an order of magnitude dose reduction in BFSTEM for thin samples (e.g. 2D materials); and a doubling of dose efficiency for wall-steepness estimation in SEM. △ Less

Submitted 26 June, 2024; originally announced June 2024.

Photon counting from the vacuum ultraviolet to the short wavelength infrared using semiconductor and superconducting technologies

Authors: Jonathan Asaadi, Dan Baxter, Karl K. Berggren, Davide Braga, Serge A. Charlebois, Clarence Chang, Angelo Dragone, Alex Drlica-Wagner, Carlos O. Escobar, Juan Estrada, Farah Fahim, Michael Febbraro, Guillermo Fernandez Moroni, Stephen Holland, Todd Hossbach, Stewart Koppell, Christopher Leitz, Agustina Magnoni, Benjamin A. Mazin, Jean-François Pratte, Bernie Rauscher, Dario Rodrigues, Lingjia Shen, Miguel Sofo-Haro, Javier Tiffenberg , et al. (5 additional authors not shown)

Abstract: In the last decade, several photon counting technologies have been developed opening a new window for experiments in the low photon number regime. Several ongoing and future projects in HEP benefit from these developments, which will also have a large impact outside HEP. During the next decade there is a clear technological opportunity to fully develop these sensors and produce a large impact in H… ▽ More In the last decade, several photon counting technologies have been developed opening a new window for experiments in the low photon number regime. Several ongoing and future projects in HEP benefit from these developments, which will also have a large impact outside HEP. During the next decade there is a clear technological opportunity to fully develop these sensors and produce a large impact in HEP. In this white paper we discuss the need for photon counting technologies in future projects, and present some technological opportunities to address those needs. △ Less

Submitted 23 March, 2022; originally announced March 2022.

Optimal Dose-Limited Phase Estimation without Entanglement

Authors: Stewart A. Koppell, Mark A. Kasevich

Abstract: Phase estimation is one of the most important facets of quantum metrology, with applications in sensing, microscopy, and quantum computation. When estimating a phase shift in a lossy medium, there is an upper bound on the attainable information per particle sent through the phase shift. Previously, only entanglement-enhanced measurements have been shown to saturate this bound. We introduce a measu… ▽ More Phase estimation is one of the most important facets of quantum metrology, with applications in sensing, microscopy, and quantum computation. When estimating a phase shift in a lossy medium, there is an upper bound on the attainable information per particle sent through the phase shift. Previously, only entanglement-enhanced measurements have been shown to saturate this bound. We introduce a measurement scheme which can saturate the bound without relying on entanglement. △ Less

Submitted 18 March, 2022; originally announced March 2022.

Transmission Electron Microscopy at the Quantum Limit

Authors: Stewart A. Koppell, Yonatan Israel, Adam J. Bowman, Brannon B. Klopfer, Mark A. Kasevich

Abstract: A number of visions for a new generation of dose-efficient electron microscopes have been advanced. These proposals, while inspired by quantum principles, make little contact with the broader field of quantum metrology. We discuss a framework calculating the amount of information carried by each electron. This makes it possible to evaluate the potential effectiveness of any particular microscope a… ▽ More A number of visions for a new generation of dose-efficient electron microscopes have been advanced. These proposals, while inspired by quantum principles, make little contact with the broader field of quantum metrology. We discuss a framework calculating the amount of information carried by each electron. This makes it possible to evaluate the potential effectiveness of any particular microscope architecture relative to the quantum limit for information per dose. In the case of phase imaging, we argue this limit is at least an order of magnitude beyond what is possible with aberration-free Zernike phase contrast. △ Less

Submitted 23 January, 2022; originally announced January 2022.

Comments: The following article has been submitted to Applied Physics Letters

RF pulse sha** for gated electron mirrors

Authors: Brannon B. Klopfer, Stewart A. Koppell, Adam J. Bowman, Yonatan Israel, Mark A. Kasevich

Abstract: We present the design and prototype of a switchable electron mirror, along with a technique for driving it with a flat-top pulse. We employ a general technique for electronic pulse-sha**, where high fidelity of the pulse shape is required but the characteristics of the system, which are possibly nonlinear, are not known. This driving technique uses an arbitrary waveform generator to pre-compensa… ▽ More We present the design and prototype of a switchable electron mirror, along with a technique for driving it with a flat-top pulse. We employ a general technique for electronic pulse-sha**, where high fidelity of the pulse shape is required but the characteristics of the system, which are possibly nonlinear, are not known. This driving technique uses an arbitrary waveform generator to pre-compensate the pulse, with a simple iterative algorithm used to generate the input waveform. We demonstrate improvement in RMS error of roughly two orders of magnitude over an uncompensated waveform. This is a broadly applicable, general method for arbitrary pulse sha**. △ Less

Submitted 3 December, 2020; originally announced December 2020.

Information Transfer as a Framework for Optimized Phase Imaging

Authors: Stewart Koppell, Mark Kasevich

Abstract: In order to efficiently image a non-absorbing sample (a phase object), dedicated phase contrast optics are required. Typically, these optics are designed with the assumption that the sample is weakly scattering, implying a linear relation between a sample's phase and its transmission function. In the strongly scattering, non-linear case, the standard optics are ineffective and the transfer functio… ▽ More In order to efficiently image a non-absorbing sample (a phase object), dedicated phase contrast optics are required. Typically, these optics are designed with the assumption that the sample is weakly scattering, implying a linear relation between a sample's phase and its transmission function. In the strongly scattering, non-linear case, the standard optics are ineffective and the transfer functions used to characterize them are uninformative. We use the Fisher Information (FI) to assess the efficiency of various phase imaging schemes and to calculate an Information Transfer Function (ITF). We show that a generalized version of Zernike phase contrast is efficient given sufficient foreknowledge of the sample. We show that with no foreknowledge, a random sensing measurement yields a significant fraction of the available information. Finally, we introduce a generalized approach to common path interferometry which can be optimized to prioritize sensitivity to particular sample features. Each of these measurements can be performed using Fourier lenses and phase masks. △ Less

Submitted 20 October, 2020; v1 submitted 19 October, 2020; originally announced October 2020.

Design for a 10 KeV Multi-Pass Transmission Electron Microscope

Authors: Stewart A. Koppell, Marian Mankos, Adam J. Bowman, Yonatan Israel, Thomas Juffmann, Brannon B. Klopfer, Mark A. Kasevich

Abstract: Multi-pass transmission electron microscopy (MPTEM) has been proposed as a way to reduce damage to radiation-sensitive materials. For the field of cryo-electron microscopy (cryo-EM), this would significantly reduce the number of projections needed to create a 3D model and would allow the imaging of lower-contrast, more heterogeneous samples. We have designed a 10 keV proof-of-concept MPTEM. The co… ▽ More Multi-pass transmission electron microscopy (MPTEM) has been proposed as a way to reduce damage to radiation-sensitive materials. For the field of cryo-electron microscopy (cryo-EM), this would significantly reduce the number of projections needed to create a 3D model and would allow the imaging of lower-contrast, more heterogeneous samples. We have designed a 10 keV proof-of-concept MPTEM. The column features fast-switching gated electron mirrors which cause each electron to interrogate the sample multiple times. A linear approximation for the multi-pass contrast transfer function (CTF) is developed to explain how the resolution depends on the number of passes through the sample. △ Less

Submitted 24 April, 2019; originally announced April 2019.

Multi-pass transmission electron microscopy

Authors: Thomas Juffmann, Stewart A. Koppell, Brannon B. Klopfer, Colin Ophus, Robert Glaeser, Mark A. Kasevich

Abstract: Feynman once asked physicists to build better electron microscopes to be able to watch biology at work. While electron microscopes can now provide atomic resolution, electron beam induced specimen damage precludes high resolution imaging of sensitive materials, such as single proteins or polymers. Here, we use simulations to show that an electron microscope based on a simplemulti-pass measurement… ▽ More Feynman once asked physicists to build better electron microscopes to be able to watch biology at work. While electron microscopes can now provide atomic resolution, electron beam induced specimen damage precludes high resolution imaging of sensitive materials, such as single proteins or polymers. Here, we use simulations to show that an electron microscope based on a simplemulti-pass measurement protocol enables imaging of single proteins at reduced damage and at nanometer resolution, without averaging structures overmultiple images. Whilewe demonstrate the method for particular imaging targets, the approach is broadly applicable and is expected to improve resolution and sensitivity for a range of electron microscopy imaging modalities, including, for example, scanning and spectroscopic techniques. The approach implements a quantum mechanically optimal strategy which under idealized conditions can be considered interaction-free. In practice, an order-of-magnitude reduction in damage at equivalent resolution appears feasible. △ Less

Submitted 15 December, 2016; originally announced December 2016.

Comments: 3 figures