Tunable on-chip electro-optic frequency-comb generation at 8 μm wavelength
Authors:
Victor Turpaud,
Thi-Hao-Nhi Nguyen,
Natnicha Koompai,
Jonathan Peltier,
Jacopo Frigerio,
Stefano Calcaterra,
Jean-René Coudevylle,
David Bouville,
Carlos Alonso-Ramos,
Laurent Vivien,
Giovanni Isella,
Delphine Marris-Morini
Abstract:
Dual-comb spectroscopy is a powerful technique to measure optical spectra in a wide spectral range with high-frequency resolution. The development of compact systems operating in the long-wave infrared wavelength range is of high interest for spectroscopic and sensing applications. Amongst the different techniques to obtain optical frequency-combs, electro-optic frequency-comb generation presents…
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Dual-comb spectroscopy is a powerful technique to measure optical spectra in a wide spectral range with high-frequency resolution. The development of compact systems operating in the long-wave infrared wavelength range is of high interest for spectroscopic and sensing applications. Amongst the different techniques to obtain optical frequency-combs, electro-optic frequency-comb generation presents major advantages thanks to the tunable repetition rate only limited by the bandwidth of the used electro-optical modulator. However, the development of integrated and efficient electro-optical modulators operating in a wide long-wave infrared spectral band is still at its infancy, and electro-optical frequency-comb has not been demonstrated so far beyond the telecom band. In this work, a Schottky-based modulator embedded in a Ge-rich graded SiGe waveguide is used for electro-optic frequency-comb generation. Considering the limited efficiency of the modulator, harmonically-rich RF signals are used to enhance the generation of comb lines around the optical carrier. Interestingly, this allows us to demonstrate the generation of electro-optical combs spanning over 2.4 GHz around 8 μm wavelength. This paves the way towards fully integrated and tunable mid-infrared electro-optic frequency-comb generation systems.
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Submitted 12 February, 2024;
originally announced February 2024.
Mid-infrared Fourier-transform spectrometer based on metamaterial lateral cladding suspended silicon waveguides
Authors:
Thi Thuy Duong Dinh,
Xavier Le Roux,
Natnicha Koompai,
Daniele Melati,
Miguel Montesinos-Ballester,
David González-Andrade,
Pavel Cheben,
Aitor V. Velasco,
Eric Cassan,
Delphine Marris-Morini,
Laurent Vivien,
Carlos Alonso-Ramos
Abstract:
Integrated mid-infrared micro-spectrometers have a great potential for applications in environmental monitoring and space exploration. Silicon-on-insulator (SOI) is a promising platform to tackle this integration challenge, due to its unique capability for large volume and low-cost production of ultra-compact photonic circuits. However, the use of SOI in the mid-infrared is restricted by the stron…
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Integrated mid-infrared micro-spectrometers have a great potential for applications in environmental monitoring and space exploration. Silicon-on-insulator (SOI) is a promising platform to tackle this integration challenge, due to its unique capability for large volume and low-cost production of ultra-compact photonic circuits. However, the use of SOI in the mid-infrared is restricted by the strong absorption of the buried oxide layer for wavelengths beyond 4 μm. Here, we overcome this limitation by utilizing metamaterial-cladded suspended silicon waveguides to implement a spatial heterodyne Fourier-transform (SHFT) spectrometer operating near 5.5μm wavelength. The metamaterial-cladded geometry allows removal of the buried oxide layer, yielding measured propagation loss below 2 dB/cm between 5.3μm and 5.7μm wavelengths. The SHFT spectrometer comprises 19 Mach-Zehnder interferometers with a maximum arm length imbalance of 200 μm, achieving a measured spectral resolution of 13cm-1 and a free-spectral range of 100 cm-1 near 5.5μm wavelength.
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Submitted 3 December, 2021;
originally announced December 2021.
