Showing 1–4 of 4 results for author: Klaes, B

Crystallographic dependence of Field Evaporation Energy Barrier in metals using Field Evaporation Energy Loss Spectroscopy map**

Authors: François Vurpillot, Constantinos Hatzoglou, Benjamin Klaes, Loic Rousseau, Jean-Baptiste Maillet, Ivan Blum, Baptiste Gault, Alfred Cerezo

Abstract: Atom probe tomography data is composed of a list of coordinates of the reconstructed atoms in the probed volume. The elemental identity of each atom is derived from time-of-flight mass spectrometry, with no local energetic or chemical information readily available within the mass spectrum. Here, we used a new data processing technique referred to as field evaporation energy loss spectroscopy (FEEL… ▽ More Atom probe tomography data is composed of a list of coordinates of the reconstructed atoms in the probed volume. The elemental identity of each atom is derived from time-of-flight mass spectrometry, with no local energetic or chemical information readily available within the mass spectrum. Here, we used a new data processing technique referred to as field evaporation energy loss spectroscopy (FEELS), which analyses the tails of mass peaks. FEELS was used to extract critical energetic parameters that characterize the field evaporation process, which are related to the binding energy of atoms to the surface under intense electrostatic field and dependent of the path followed by the departing atoms during the field evaporation process. We focused our study on different pure face centered cubic metals (Al, Ni, Rh). We demonstrate that the energetic parameters extracted from mass spectra can be mapped in 2D with nanometric resolution. A dependence on the considered crystallographic planes is observed, with sets of planes of low Miller indices showing a lower sensitivity to the intensity of the electric field, which indicates a lower effective attachment energy. The temperature is also an important parameter in particular for Al, which we attribute to an energetic transition between two paths of field evaporation between 25K and 60K close to (002) pole at the specimen's surface. This paper shows that the complex information that can be retrieved from the measured energy loss of surface atoms is important both instrumentally and fundamentally. △ Less

Submitted 3 April, 2024; originally announced April 2024.

Reflections on the spatial performance of atom probe tomography in the analysis of atomic neighbourhoods

Authors: Baptiste Gault, Benjamin Klaes, Felipe F. Morgado, Christoph Freysoldt, Yue Li, Frederic De Geuser, Leigh T. Stephenson, François Vurpillot

Abstract: Atom probe tomography is often introduced as providing "atomic-scale" map** of the composition of materials and as such is often exploited to analyse atomic neighbourhoods within a material. Yet quantifying the actual spatial performance of the technique in a general case remains challenging, as they depend on the material system being investigated as well as on the specimen's geometry. Here, by… ▽ More Atom probe tomography is often introduced as providing "atomic-scale" map** of the composition of materials and as such is often exploited to analyse atomic neighbourhoods within a material. Yet quantifying the actual spatial performance of the technique in a general case remains challenging, as they depend on the material system being investigated as well as on the specimen's geometry. Here, by using comparisons with field-ion microscopy experiments and field-ion imaging and field evaporation simulations, we provide the basis for a critical reflection on the spatial performance of atom probe tomography in the analysis of pure metals, low alloyed systems and concentrated solid solutions (i.e. akin to high-entropy alloys). The spatial resolution imposes strong limitations on the possible interpretation of measured atomic neighbourhoods, and directional neighbourhood analyses restricted to the depth are expected to be more robust. We hope this work gets the community to reflect on its practices, in the same way, it got us to reflect on our work. △ Less

Submitted 19 July, 2021; v1 submitted 2 March, 2021; originally announced March 2021.

Comments: Submitted to Microscopy & Microanalysis to be part of the special issue assocaited to the APT&M 2020 conference

Revealing atomic-scale vacancy-solute interaction in nickel

Authors: Felipe F. Morgado, Shyam Katnagallu, Christoph Freysoldt, Benjamin Klaes, François Vurpillot, Jörg Neugebauer, Dierk Raabe, Steffen Neumeier, Baptiste Gault, Leigh T. Stephenson

Abstract: Imaging individual vacancies in solids and revealing their interactions with solute atoms remains one of the frontiers in microscopy and microanalysis. Here we study a creep-deformed binary Ni-2 at.% Ta alloy. Atom probe tomography reveals a random distribution of Ta. Field ion microscopy, with contrast interpretation supported by density-functional theory and time-of-flight mass spectrometry, evi… ▽ More Imaging individual vacancies in solids and revealing their interactions with solute atoms remains one of the frontiers in microscopy and microanalysis. Here we study a creep-deformed binary Ni-2 at.% Ta alloy. Atom probe tomography reveals a random distribution of Ta. Field ion microscopy, with contrast interpretation supported by density-functional theory and time-of-flight mass spectrometry, evidences a positive correlation of tantalum with vacancies. Our results support solute-vacancy binding, which explains improvement in creep resistance of Ta-containing Ni-based superalloys and helps guide future material design strategies. △ Less

Submitted 16 June, 2021; v1 submitted 2 March, 2021; originally announced March 2021.

Comments: Submitted to Physics Review Letter

A model to predict image formation in the three-dimensional field ion microscope

Authors: Benjamin Klaes, Rodrigue Larde, Fabien Delaroche, Stefan Parviainen, Nicolas Rolland, Shyam Katnagallu, Baptiste Gault, François Vurpillot

Abstract: This article presents a numerical model dedicated to the simulation of field ion microscopy (FIM). FIM was the first technique to image individual atoms on the surface of a material. By a careful control of the field evaporation of the atoms from the surface, the bulk of the material exposed, and, through a digitally processing a sequence of micrographs, a three-dimensional reconstruction can be a… ▽ More This article presents a numerical model dedicated to the simulation of field ion microscopy (FIM). FIM was the first technique to image individual atoms on the surface of a material. By a careful control of the field evaporation of the atoms from the surface, the bulk of the material exposed, and, through a digitally processing a sequence of micrographs, a three-dimensional reconstruction can be achieved. 3DFIM is particularly suited to the direct observation of crystalline defects such as vacancies, interstitials, vacancy clusters, dislocations, and any combinations of theses defects that underpin the physical properties of materials. This makes 3DFIM extremely valuable for many material science and engineering applications, and further develo** this technique is becoming crucial. The proposed model enables the simulation of imaging artefacts that are induced by non-regular field evaporation and by the impact of the perturbation of the electric field distribution of the distorted distribution of atoms close to defects. The model combines the meshless algorithm for field evaporation proposed by Rolland et al. (Robin-Rolland Model, or RRM) with fundamental aspects of the field ionization process of the gas image involved in FIM. △ Less

Submitted 19 November, 2019; originally announced November 2019.