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Radiation Hardness Study of the ePix100 Sensor and ASIC under Direct Illumination at the European XFEL
Authors:
I. Klačková,
K. Ahmed,
G. Blaj,
M. Cascella,
V. Cerantola,
C. Chang,
A. Dragone,
S. Göde,
S. Hauf,
C. Kenney,
J. Segal,
M. Kuster,
A. Šagátová
Abstract:
The ePix detector family provides multiple variants of hybrid pixel detectors to support a wide range of applications at free electron laser facilities. We present the results of a systematic study of the influence of radiation induced damage on the performance and lifetime of an ePix100a detector module using a direct attenuated beam of the EuXFEL at 9 keV photon energy and an average power of 10…
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The ePix detector family provides multiple variants of hybrid pixel detectors to support a wide range of applications at free electron laser facilities. We present the results of a systematic study of the influence of radiation induced damage on the performance and lifetime of an ePix100a detector module using a direct attenuated beam of the EuXFEL at 9 keV photon energy and an average power of 10 $μ$W. An area of 20 x 20 pixels was irradiated with an average photon flux of approx. 7 x $10^{9}$ photons/s to a dose of approximately 760$\pm$65 kGy at the location of the Si/SiO$_2$ interfaces in the sensor. A dose dependent increase in both offset and noise of the ePix100a detector have been observed originating from an increase of the sensor leakage current. Moreover, we observed an effect directly after irradiation resulting in the saturation of individual pixels by their dark current. Changes in gain are evaluated one and half hours post irradiation and suggest damage to occur also on the ASIC level. Based on the obtained results, thresholds for beam parameters are deduced and the detector lifetime is estimated with respect to the requirements to the data quality in order to satisfy the scientific standards defined by the experiments. We conclude the detector can withstand a beam with an energy up to 1 $μ$J at a photon energy of 9 keV impacting on an area of 1 mm$^2$. The detector can be used without significant degradation of its performance for several years if the incident photon beam intensities do not exceed the detector's dynamic range by at least three orders of magnitude. Our results provide valuable input for the operation of the ePix100a detector at FEL facilities and for the design of future detector technology.
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Submitted 17 August, 2021;
originally announced August 2021.
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Characterization of the ePix100a and the FastCCD Semiconductor Detectors for the European XFEL
Authors:
I. Klačková,
G. Blaj,
P. Denes,
A. Dragone,
S. Göde,
S. Hauf,
F. Januschek,
J. Joseph,
M. Kuster
Abstract:
The European X-ray Free Electron Laser (EuXFEL) is a research facility providing spatially coherent X-ray flashes in the energy range from 0.25keV to 25keV of unprecedented brilliance and with unique time structure: X-ray pulses with a 4.5 MHz repetition rate arranged in trains with 2700 pulses every 100 ms. The facility operates three photon beamlines called SASE 1, SASE 2 and SASE 3. Each of the…
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The European X-ray Free Electron Laser (EuXFEL) is a research facility providing spatially coherent X-ray flashes in the energy range from 0.25keV to 25keV of unprecedented brilliance and with unique time structure: X-ray pulses with a 4.5 MHz repetition rate arranged in trains with 2700 pulses every 100 ms. The facility operates three photon beamlines called SASE 1, SASE 2 and SASE 3. Each of the beamlines is hosting two scientific experiments. The SASE 1 beamline started its user operation in September 2017, followed by successful first lasing at the SASE 2 beamline in May 2018. Early user experiments are planned to start in 2019 at this beamline, while early user experiments for the SASE 3 beamline are scheduled for the end of 2018. The quality of the experimental data will gain substantial benefits from an accurate characterization and calibration of the X-ray detectors. Supplementing high repetition rate detectors at MHz speeds, slower detectors such as the ePix100a and the FastCCD will be operated at the train repetition rate of 10 Hz. These 2D silicon pixelized detectors use fast parallel column-wise readout implemented as a CCD or as a hybrid pixel detector. In the following, characterization and analysis approaches for the FastCCD and the ePix100a detectors are discussed and the performance of the detectors is evaluated using appropriate state-of-the-art analysis techniques.
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Submitted 12 December, 2018; v1 submitted 4 December, 2018;
originally announced December 2018.
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Performance of the LBNL FastCCD for the European XFEL
Authors:
Friederike Januschek,
Ivana Klackova,
Nord Andresen,
Peter Denes,
Steffen Hauf,
John Joseph,
Markus Kuster,
Craig Tindall
Abstract:
The European X-ray Free Electron Laser (XFEL.EU) is currently being commissioned in Schenefeld, Germany. From 2017 onwards it will provide spatially coherent X-rays of energies between 0.25\,keV and 25\,keV with a unique timing structure. One of the detectors foreseen at XFEL.EU for the soft X-ray regime (energies below 6\,keV) is a quasi column-parallel readout FastCCD developed by Lawrence Berke…
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The European X-ray Free Electron Laser (XFEL.EU) is currently being commissioned in Schenefeld, Germany. From 2017 onwards it will provide spatially coherent X-rays of energies between 0.25\,keV and 25\,keV with a unique timing structure. One of the detectors foreseen at XFEL.EU for the soft X-ray regime (energies below 6\,keV) is a quasi column-parallel readout FastCCD developed by Lawrence Berkeley National Lab (LBNL) specifically for the XFEL.EU requirements. Its sensor has 1920$\times$960 pixels of 30\,$μ$m $\times$30\,$μ$m size with a beam hole in the middle of the sensor. The camera can be operated in full frame and frame store mode. With the FastCCD a frame rate of up to 120~fps can be achieved, but at XFEL.EU the camera settings are optimized for the 10\,Hz XFEL bunch-mode. The detector has been delivered to XFEL.EU. Results of the performance tests and calibration done using the XFEL.EU detector calibration infrastructure are presented quantifying noise level, gain and energy resolution.
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Submitted 12 December, 2016;
originally announced December 2016.
