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Band gap opening at the Dirac point in Co/BiSbTeSe2(0001) system
Authors:
A. K. Kaveev,
A. G. Banshchikov,
A. N. Terpitskiy,
V. A. Golyashov,
O. E. Tereshchenko,
K. A. Kokh,
D. A. Estyunin,
A. M. Shikin,
E. F. Schwier
Abstract:
Sub-angstrom Co coverage, being deposited on BiSbTeSe2(0001) surface at 200-330 C, opens a band gap at the Dirac point, with the shift of the Dirac point position caused by RT adsorbate pre-deposition. Temperature dependent measurements in 15-150 K range have shown no band gap width change. This fact indicates the nonmagnetic nature of the gap which may be attributed to the chemical hybridization…
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Sub-angstrom Co coverage, being deposited on BiSbTeSe2(0001) surface at 200-330 C, opens a band gap at the Dirac point, with the shift of the Dirac point position caused by RT adsorbate pre-deposition. Temperature dependent measurements in 15-150 K range have shown no band gap width change. This fact indicates the nonmagnetic nature of the gap which may be attributed to the chemical hybridization of surface states upon the introduction of Co adatoms, which decrease crystallographic symmetry and eliminate topological protection of the surface states.
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Submitted 26 December, 2019;
originally announced December 2019.
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Crystalline structure and XMCD studies of Co40Fe40B20 grown on Bi2Te3, BiTeI and Bi2Se3
Authors:
A. K. Kaveev,
N. S. Sokolov,
S. M. Suturin,
N. S. Zhiltsov,
V. A. Golyashov,
O. E. Tereshchenko,
I. P. Prosvirin,
K. A. Kokh,
M. Sawada
Abstract:
Epitaxial films of Co40Fe40B20 (further - CoFeB) were grown on Bi2Te3(001) and Bi2Se3(001) substrates by laser molecular beam epitaxy (LMBE) technique at 200-400C. Bcc-type crystalline structure of CoFeB with (111) plane parallel to (001) plane of Bi2Te3 was observed, in contrast to polycrystalline CoFeB film formed on Bi2Se3(001) at RT using high-temperature seeding layer. Therefore, structurally…
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Epitaxial films of Co40Fe40B20 (further - CoFeB) were grown on Bi2Te3(001) and Bi2Se3(001) substrates by laser molecular beam epitaxy (LMBE) technique at 200-400C. Bcc-type crystalline structure of CoFeB with (111) plane parallel to (001) plane of Bi2Te3 was observed, in contrast to polycrystalline CoFeB film formed on Bi2Se3(001) at RT using high-temperature seeding layer. Therefore, structurally ordered ferromagnetic thin films were obtained on the topological insulator surface for the first time. Using high energy electron diffraction (RHEED) 3D reciprocal space map**, epitaxial relations of main crystallographic axes for the CoFeB/ Bi2Te3 heterostructure were revealed. MOKE and AFM measurements showed the isotropic azimuthal in-plane behavior of magnetization vector in CoFeB/ Bi2Te3, in contrast to 2nd order magnetic anisotropy seen in CoFeB/Bi2Se3. XPS measurements showed more stable behavior of CoFeB grown on Bi2Te3 to the oxidation, in compare to CoFeB grown on Bi2Se3. XAS and XMCD measurements of both concerned nanostructures allowed calculation of spin and orbital magnetic moments for Co and Fe. Additionally, crystalline structure and XMCD response of the CoFeB/BiTeI and Co55Fe45/BiTeI systems were studied, epitaxial relations of main crystallographic axes were found, and spin and orbital magnetic moments were calculated.
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Submitted 30 January, 2018;
originally announced January 2018.
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Studies of CoFeB crystalline structure grown on PbSnTe topological insulator substrate
Authors:
Andrey K. Kaveev,
Nikolay S. Sokolov,
Sergey M. Suturin,
Nikita S. Zhiltsov,
Alexander E. Klimov,
Oleg E. Tereshchenko
Abstract:
Co40Fe40B20 layers were grown on the Pb0.71Sn0.29Te topological insulator substrates by laser molecular beam epitaxy (LMBE) method, and the growth conditions were studied. The possibility of growing epitaxial layers of a ferromagnet on the surface of a topological insulator was demonstrated for the first time. The Co40Fe40B20 layers obtained have a bcc crystal structure with a crystalline (111) pl…
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Co40Fe40B20 layers were grown on the Pb0.71Sn0.29Te topological insulator substrates by laser molecular beam epitaxy (LMBE) method, and the growth conditions were studied. The possibility of growing epitaxial layers of a ferromagnet on the surface of a topological insulator was demonstrated for the first time. The Co40Fe40B20 layers obtained have a bcc crystal structure with a crystalline (111) plane parallel to the (111) PbSnTe plane. The use of three-dimensional map** in the reciprocal space of reflection high electron diffraction (RHEED) patterns made it possible to determine the epitaxial relationship of main crystallographic axes between the film and the substrate of topological insulator. Quenching of some reflections in diffraction pattern allows confirmation of the substrate stoichiometry.
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Submitted 18 December, 2017; v1 submitted 5 December, 2017;
originally announced December 2017.
