Revealing three-dimensional structure of individual colloidal crystal grain by coherent x-ray diffractive imaging
Authors:
A. G. Shabalin,
J. -M. Meijer,
R. Dronyak,
O. M. Yefanov,
A. Singer,
R. P. Kurta,
U. Lorenz,
O. Y. Gorobtsov,
D. Dzhigaev,
S. Kalbfleisch,
J. Gulden,
A. V. Zozulya,
M. Sprung,
A. V. Petukhov,
I. A. Vartanyants
Abstract:
We present results of a coherent x-ray diffractive imaging experiment performed on a single colloidal crystal grain. The full three-dimensional (3D) reciprocal space map measured by an azimuthal rotational scan contained several orders of Bragg reflections together with the coherent interference signal between them. Applying the iterative phase retrieval approach, the 3D structure of the crystal g…
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We present results of a coherent x-ray diffractive imaging experiment performed on a single colloidal crystal grain. The full three-dimensional (3D) reciprocal space map measured by an azimuthal rotational scan contained several orders of Bragg reflections together with the coherent interference signal between them. Applying the iterative phase retrieval approach, the 3D structure of the crystal grain was reconstructed and positions of individual colloidal particles were resolved. As a result, an exact stacking sequence of hexagonal close-packed layers including planar and linear defects were identified.
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Submitted 29 May, 2016;
originally announced May 2016.
Grain rotation and lattice deformation during photoinduced chemical reactions revealed by in-situ X-ray nanodiffraction
Authors:
Zhifeng Huang,
Matthias Bartels,
Rui Xu,
Markus Osterhoff,
Sebastian Kalbfleisch,
Michael Sprung,
Akihiro Suzuki,
Yukio Takahashi,
Thomas N. Blanton,
Tim Salditt,
Jianwei Miao
Abstract:
In-situ X-ray diffraction (XRD) and transmission electron microscopy (TEM) have been used to investigate many physical science phenomena, ranging from phase transitions, chemical reaction and crystal growth to grain boundary dynamics. A major limitation of in-situ XRD and TEM is a compromise that has to be made between spatial and temporal resolution. Here, we report the development of in-situ X-r…
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In-situ X-ray diffraction (XRD) and transmission electron microscopy (TEM) have been used to investigate many physical science phenomena, ranging from phase transitions, chemical reaction and crystal growth to grain boundary dynamics. A major limitation of in-situ XRD and TEM is a compromise that has to be made between spatial and temporal resolution. Here, we report the development of in-situ X-ray nanodiffraction to measure atomic-resolution diffraction patterns from single grains with up to 5 millisecond temporal resolution, and make the first real-time observation of grain rotation and lattice deformation during photoinduced chemical reactions. The grain rotation and lattice deformation associated with the chemical reactions are quantified to be as fast as 3.25 rad./sec. and as large as 0.5 Angstroms, respectively. The ability to measure atomic-resolution diffraction patterns from individual grains with several millisecond temporal resolution is expected to find broad applications in materials science, physics, chemistry, and nanoscience.
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Submitted 11 December, 2014;
originally announced December 2014.
