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Showing 1–5 of 5 results for author: Kacher, J

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  1. arXiv:2112.08263  [pdf

    cond-mat.mtrl-sci

    Discovering the nanoscale origins of localized corrosion in additive manufactured stainless steel 316L by in situ liquid cell TEM

    Authors: Mengkun Tian, Jahnavi Desai Choundraj, Thomas Voisin, Y. Morris Wang, Josh Kacher

    Abstract: Additive manufacturing (AM) by laser powder bed fusion (L-PBF) leads to the formation of a rich, hierarchical microstructure, including dislocation cell structures and elemental segregation. This structure has profound impacts on the corrosion behavior and mechanical properties of printed materials. In this study, we use in situ liquid cell scanning transmission electron microscope (STEM) to direc… ▽ More

    Submitted 15 December, 2021; originally announced December 2021.

  2. arXiv:2104.10811  [pdf

    cond-mat.mtrl-sci physics.app-ph

    Antiferroelectric negative capacitance from a structural phase transition in zirconia

    Authors: Michael Hoffmann, Zheng Wang, Nujhat Tasneem, Ahmad Zubair, Prasanna Venkat Ravindran, Mengkun Tian, Anthony Gaskell, Dina Triyoso, Steven Consiglio, Kanda Tapily, Robert Clark, Jae Hur, Sai Surya Kiran Pentapati, Milan Dopita, Shimeng Yu, Winston Chern, Josh Kacher, Sebastian E. Reyes-Lillo, Dimitri Antoniadis, Jayakanth Ravichandran, Stefan Slesazeck, Thomas Mikolajick, Asif Islam Khan

    Abstract: Crystalline materials with broken inversion symmetry can exhibit a spontaneous electric polarization, which originates from a microscopic electric dipole moment. Long-range polar or anti-polar order of such permanent dipoles gives rise to ferroelectricity or antiferroelectricity, respectively. However, the recently discovered antiferroelectrics of fluorite structure (HfO$_2$ and ZrO$_2$) are diffe… ▽ More

    Submitted 21 April, 2021; originally announced April 2021.

  3. arXiv:2104.08688  [pdf, other

    cs.CV

    Signal Processing Challenges and Examples for {\it in-situ} Transmission Electron Microscopy

    Authors: Josh Kacher, Yao Xie, Sven P. Voigt, Shixiang Zhu, Henry Yuchi, Jordan Key, Surya R. Kalidindi

    Abstract: Transmission Electron Microscopy (TEM) is a powerful tool for imaging material structure and characterizing material chemistry. Recent advances in data collection technology for TEM have enabled high-volume and high-resolution data collection at a microsecond frame rate. Taking advantage of these advances in data collection rates requires the development and application of data processing tools, i… ▽ More

    Submitted 20 August, 2021; v1 submitted 17 April, 2021; originally announced April 2021.

  4. Volume 78, 1 October 2014, Pages 56-64

    Authors: A. Lupinacci, J. Kacher, A. A. Shapiro, P. Hosemann, A. M. Minor

    Abstract: Characterizing plasticity mechanisms below the ductile-to-brittle transition temperature is traditionally difficult to accomplish in asystematic fashion. Here, we use a new experimental setup to perform in situ cryogenic mechanical testing of pure Sn micropillars at room temperature and at 142°C. Subsequent electron microscopy characterization of the micropillars shows a clear difference in the de… ▽ More

    Submitted 1 April, 2021; originally announced April 2021.

    Journal ref: Acta Materialia Volume 78, 1 October 2014, Pages 56-64

  5. arXiv:1710.11297  [pdf, other

    stat.AP

    Sequential Adaptive Detection for In-Situ Transmission Electron Microscopy (TEM)

    Authors: Y. Cao, S. Zhu, Y. Xie, J. Key, J. Kacher, R. R. Unocic, C. M. Rouleau

    Abstract: We develop new efficient online algorithms for detecting transient sparse signals in TEM video sequences, by adopting the recently developed framework for sequential detection jointly with online convex optimization [1]. We cast the problem as detecting an unknown sparse mean shift of Gaussian observations, and develop adaptive CUSUM and adaptive SSRS procedures, which are based on likelihood rati… ▽ More

    Submitted 30 October, 2017; originally announced October 2017.