Gas gun shock experiments with single-pulse x-ray phase contrast imaging and diffraction at the Advanced Photon Source
Authors:
S. N. Luo,
B. J. Jensen,
D. E. Hooks,
K. Fezzaa,
K. J. Ramos,
J. D. Yeager,
K. Kwiatkowski,
1,
T. Shimada
Abstract:
The highly transient nature of shock loading and pronounced microstructure effects on dynamic materials response call for {\it in situ}, temporally and spatially resolved, x-ray-based diagnostics. Third-generation synchrotron x-ray sources are advantageous for x-ray phase contrast imaging (PCI) and diffraction under dynamic loading, due to their high photon energy, high photon fluxes, high coheren…
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The highly transient nature of shock loading and pronounced microstructure effects on dynamic materials response call for {\it in situ}, temporally and spatially resolved, x-ray-based diagnostics. Third-generation synchrotron x-ray sources are advantageous for x-ray phase contrast imaging (PCI) and diffraction under dynamic loading, due to their high photon energy, high photon fluxes, high coherency, and high pulse repetition rates. The feasibility of bulk-scale gas gun shock experiments with dynamic x-ray PCI and diffraction measurements was investigated at the beamline 32ID-B of the Advanced Photon Source. The x-ray beam characteristics, experimental setup, x-ray diagnostics, and static and dynamic test results are described. We demonstrate ultrafast, multiframe, single-pulse PCI measurements with unprecedented temporal ($<$100 ps) and spatial ($\sim$2 $μ$m) resolutions for bulk-scale shock experiments, as well as single-pulse dynamic Laue diffraction. The results not only substantiate the potential of synchrotron-based experiments for addressing a variety of shock physics problems, but also allow us to identify the technical challenges related to image detection, x-ray source, and dynamic loading.
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Submitted 26 April, 2012;
originally announced April 2012.
