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Influence of deep levels on the electrical transport properties of CdZnTeSe detectors
Authors:
M Rejhon,
J Franc,
V Dědič,
J Pekárek,
U N Roy,
R Grill,
R B James
Abstract:
We investigated the influence of deep levels on the electrical transport properties of CdZnTeSe radiation detectors by comparing experimental data with numerical simulations based on simultaneous solution of drift-diffusion and Posisson equations, including the Shockley-Read-Hall model of the carrier trap**. We determined the Schottky barrier height and the Fermi level position from I-V measurem…
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We investigated the influence of deep levels on the electrical transport properties of CdZnTeSe radiation detectors by comparing experimental data with numerical simulations based on simultaneous solution of drift-diffusion and Posisson equations, including the Shockley-Read-Hall model of the carrier trap**. We determined the Schottky barrier height and the Fermi level position from I-V measurements. We measured the time evolution of the electric field and the electrical current after application of a voltage bias. We observed that the electrical properties of CZTS are fundamentally governed by two deep levels close to the mid-bandgap - one recombination and one hole trap. We show that the hole trap indirectly increases the mobility-lifetime product of electrons. We conclude that the structure of deep levels in CZTS are favorable for high electrical charge transport.
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Submitted 1 October, 2018;
originally announced October 2018.
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Investigation of deep levels in CdZnTeSe crystal and their effect on the internal electric field of CdZnTeSe gamma-ray detector
Authors:
M Rejhon,
V Dědič,
L Beran,
U N Roy,
J Franc,
R B James
Abstract:
We present a study of deep levels in CdZnTeSe radiation-detection materials. The approach relies on electrical methods that combine time and temperature evolution of the electric field and electric current after switching on the bias voltage. We also applied two optical methods to study the deep levels. The first method utilizes the temperature and temporal analysis of the electric-field evolution…
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We present a study of deep levels in CdZnTeSe radiation-detection materials. The approach relies on electrical methods that combine time and temperature evolution of the electric field and electric current after switching on the bias voltage. We also applied two optical methods to study the deep levels. The first method utilizes the temperature and temporal analysis of the electric-field evolution after switching off an additional light illuminating the sample at a wavelength of 940 nm. The second method involved measuring of the electric-field spectral dependence during near infrared illumination. We compare the results with those obtained with high-quality CdZnTe detector-grade material. We conclude that the introduction of Se into the lattice leads to a shift of the second ionization level of the Cd vacancy towards the conduction band, as predicted recently by first-principles calculations based on screened hybrid functionals.
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Submitted 27 September, 2018;
originally announced September 2018.
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Crystal Growth and Characterization of Doped CZT Crystals
Authors:
N. N. Kolesnikov,
S. P. Vesnovskii,
R. B. James,
N. S. Berzigiarova,
D. L. Alov,
A. G. Zvenigorodskii
Abstract:
Cd1-xZnxTe crystals with x in the range of 0.1-0.2 were grown by the high-pressure vertical Bridgman method from pre-synthesized CZT. Resistive graphite heaters were used to control the temperature profiles within the furnaces, and an argon overpressure was used to reduce the cadmium loss. The crystals were doped with either Al, Ni, In, Ga, Ge or Sn. The do** was carried out by three different…
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Cd1-xZnxTe crystals with x in the range of 0.1-0.2 were grown by the high-pressure vertical Bridgman method from pre-synthesized CZT. Resistive graphite heaters were used to control the temperature profiles within the furnaces, and an argon overpressure was used to reduce the cadmium loss. The crystals were doped with either Al, Ni, In, Ga, Ge or Sn. The do** was carried out by three different ways: 1) by adding of the pure metals during growth runs; 2) by adding of the tellurides of the metals during growth runs; or 3) by inserting of the metal tellurides during synthesis of the starting CZT material. Some of the growth process parameters were also varied. The as-grown CZT ingots had diameters of either 15 or 38 mm. The influence of the do** on CZT properties, particularly the conductivity type and specific electrical resistivity, will be discussed. Energy spectra from alpha particles (U-233, Ra-226, and U-233+Pu-239+Pu-238) and from different gamma sources (Cs-137, Co-60, Co-57, Am-241) will be reported.
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Submitted 4 July, 2001;
originally announced July 2001.
