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Antenna enhanced infrared photoinduced force imaging in aqueous environment with super-resolution and hypersensitivity
Authors:
Jian Li,
Jie Pang,
Zhen-dong Yan,
Junghoon Jahng,
** Li,
William Morrison,
**g Liang,
Qing-Ying Zhang,
Xing-Hua Xia
Abstract:
Tip enhanced IR spectra and imaging have been widely used in cutting-edge studies for the in-depth understanding of the composition, structure and function of interfaces at the nanoscale. However, molecular monolayer sensitivity has only been demonstrated on solid/gas interfaces. In aqueous environment, the reduced sensitivity due to strong dam** of the cantilever oscillation and background IR a…
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Tip enhanced IR spectra and imaging have been widely used in cutting-edge studies for the in-depth understanding of the composition, structure and function of interfaces at the nanoscale. However, molecular monolayer sensitivity has only been demonstrated on solid/gas interfaces. In aqueous environment, the reduced sensitivity due to strong dam** of the cantilever oscillation and background IR absorption extremely limits the practical applications of tip enhanced IR nanospectroscopy. Here, we demonstrate hypersensitive nanoscale IR spectra and imaging in aqueous environment with the combination of photoinduced force (PiF) microscopy and resonant antennas. The highly confined electromagnetic field inbetween the tip end and antenna extremely amplifies the photoinduced force to the detectable level, while the excitation via plasmon internal reflection mode minimizes the environmental absorption. A polydimethylsiloxane (PDMS) layer (~1-2 nm thickness) functionalized on the AFM tip has been successfully identified in water with antennas of different sizes. Sampling volume of ~604 chemical bonds from PDMS was demonstrated with sub-10 nm spatial resolution confirmed by electric (E) field distribution map** on antennas, which strongly suggests the desired requirements for interfacial spectroscopy. This platform demonstrates for the first time the application of photoinduced force microscopy in aqueous environments, providing a brand-new configuration to achieve highly enhanced nanoscale IR signals, which is extremely promising for future research of interfaces and nanosystems in aqueous environments.
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Submitted 29 August, 2021; v1 submitted 24 September, 2020;
originally announced September 2020.
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Tip enhanced IR imaging with sub-10 nm resolution and hypersensitivity
Authors:
Jian Li,
Junghoon Jahng,
Jie Pang,
William Morrison,
** Li,
Eun Seong Lee,
**g-Juan Xu,
Hong-Yuan Chen,
Xing-Hua Xia
Abstract:
IR spectroscopy has been widely used for chemical identification and quantitative analysis of reactions occurring in a specific time and space domains by measuring an average signal of the entire system1. Achieving IR measurements with nanometer-scale spatial resolution is highly desirable to obtain a detailed understanding of the composition, structure and function of interfaces2-5. The challenge…
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IR spectroscopy has been widely used for chemical identification and quantitative analysis of reactions occurring in a specific time and space domains by measuring an average signal of the entire system1. Achieving IR measurements with nanometer-scale spatial resolution is highly desirable to obtain a detailed understanding of the composition, structure and function of interfaces2-5. The challenges in IR nanoscopy yet exist owing to the small molecular cross section and pristine optical diffraction limit. Although atomic force microscopy (AFM) based techniques, such as scattering-type scanning near-field optical microscopy and photothermal-induced resonance microscopy (PTIR), can acquire IR spectroscopy in a few tens of nanometer scale resolution6-9, IR measurements with monolayer level sensitivity remains elusive and can only be realized under critical conditions10,11. Herein, we demonstrate sub-10 nm spatial resolution sampling a volume of ~360 molecules with a strong field enhancement at the sample-tip junction by implementing noble metal substrates (Au, Ag, Pt) in photo-induced force microscopy (PiFM). This technique shows versatility and robustness of PiFM, and is promising for application in interfacial studies with hypersensitivity and super spatial resolution.
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Submitted 30 September, 2019;
originally announced September 2019.
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Nanoscale spectroscopic studies of two different physical origins of the tip-enhanced force: dipole and thermal
Authors:
Junghoon Jahng,
Sung Park,
Will A. Morrison,
Hyuksang Kwon,
Derek Nowak,
Eric O. Potma,
Eun Seong Lee
Abstract:
When light illuminates the junction formed between a sharp metal tip and a sample, different mechanisms can con-tribute to the measured photo-induced force simultaneously. Of particular interest are the instantaneous force be-tween the induced dipoles in the tip and in the sample and the force related to thermal heating of the junction. A key difference between these two force mechanisms is their…
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When light illuminates the junction formed between a sharp metal tip and a sample, different mechanisms can con-tribute to the measured photo-induced force simultaneously. Of particular interest are the instantaneous force be-tween the induced dipoles in the tip and in the sample and the force related to thermal heating of the junction. A key difference between these two force mechanisms is their spectral behaviors. The magnitude of the thermal response follows a dissipative Lorentzian lineshape, which measures the heat exchange between light and matter, while the induced dipole response exhibits a dispersive spectrum and relates to the real part of the material polarizability. Be-cause the two interactions are sometimes comparable in magnitude, the origin of the nanoscale chemical selectivity in the recently developed photo-induced force microscopy (PiFM) is often unclear. Here, we demonstrate theoretically and experimentally how light absorption followed by nanoscale thermal expansion generates a photo-induced force in PiFM. Furthermore, we explain how this thermal force can be distinguished from the induced dipole force by tuning the relaxation time of samples. Our analysis presented here helps the interpretation of nanoscale chemical measure-ments of heterogeneous materials and sheds light on the nature of light-matter coupling in van der Waals materials.
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Submitted 7 March, 2018; v1 submitted 7 November, 2017;
originally announced November 2017.
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Eigenmodes of a quartz tuning fork and their application to photo-induced force microscopy
Authors:
Bongsu Kim,
Junghoon Jahng,
Ryan Muhammad Khan,
Sung Park,
Eric O. Potma
Abstract:
We examine the mechanical eigenmodes of a quartz tuning fork (QTF) for the purpose of facilitat- ing its use as a probe for multi-frequency atomic force microscopy (AFM). We perform simulations based on the three-dimensional finite element method (FEM) and compare the observed motions of the beams with experimentally measured resonance frequencies of two QTF systems. The com- parison enabled us to…
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We examine the mechanical eigenmodes of a quartz tuning fork (QTF) for the purpose of facilitat- ing its use as a probe for multi-frequency atomic force microscopy (AFM). We perform simulations based on the three-dimensional finite element method (FEM) and compare the observed motions of the beams with experimentally measured resonance frequencies of two QTF systems. The com- parison enabled us to assign the first seven asymmetric eigenmodes of the QTF. We also find that a modified version of single beam theory can be used to guide the assignment of mechanical eigen- modes of QTFs. The usefulness of the QTF for multi-frequency AFM measurements is demonstrated through photo-induced force microscopy (PiFM) measurements. By using the QTF in different con- figurations, we show that the vectorial components of the photo-induced force can be independently assessed, and that lateral forces can be probed in true non-contact mode.
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Submitted 21 December, 2016;
originally announced December 2016.
