Showing 1–1 of 1 results for author: Isaacs, R A
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Scaling analysis of the static and dynamic critical exponents in under, over, and optimally-doped Pr$_{2-x}$Ce$_x$CuO$_{4-y}$ films
Authors:
M. C. Sullivan,
R. A. Isaacs,
M. F. Salvaggio,
J. Sousa,
C. G. Stathis,
J. B. Olson
Abstract:
We report on current-voltage measurements of the zero-field normal-superconducting phase transition in thin films of Pr$_{2-x}$Ce$_x$CuO$_{4-y}$ as a function of do**. We find that the small size of the critical regime in these materials ($\approx 25$ mK) gives rise to mean-field behavior at the phase transition with a static exponent of $ν\approx 0.5$ for all do**s (in contrast to hole-doped…
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We report on current-voltage measurements of the zero-field normal-superconducting phase transition in thin films of Pr$_{2-x}$Ce$_x$CuO$_{4-y}$ as a function of do**. We find that the small size of the critical regime in these materials ($\approx 25$ mK) gives rise to mean-field behavior at the phase transition with a static exponent of $ν\approx 0.5$ for all do**s (in contrast to hole-doped $\mathrm{YBa_{2}Cu_{3}O_{7-δ}}$). We also find mean-field behavior in the dynamic exponent $z$. This indicates that Pr$_{2-x}$Ce$_x$CuO$_{4-y}$ behaves similarly to conventional superconductors in contrast to other cuprate superconductors. However, as the transition width in our samples decreases, the dynamic critical exponent approaches $z=1.5$, similar to the critical exponent found in hole-doped $\mathrm{YBa_{2}Cu_{3}O_{7-δ}}$.
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Submitted 11 March, 2010; v1 submitted 24 August, 2009;
originally announced August 2009.
