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Tuning acoustic impedance in load-bearing structures
Authors:
Sai Sharan Injeti,
Paolo Celli,
Kaushik Bhattacharya,
Chiara Daraio
Abstract:
Acoustic transparency is the capability of a medium to transmit mechanical waves to adjacent media, without scattering. This characteristic can be achieved by carefully engineering the acoustic impedance of the medium -- a combination of wave speed and density, to match that of the surroundings. Owing to the strong correlation between acoustic wave speed and static stiffness, it is challenging to…
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Acoustic transparency is the capability of a medium to transmit mechanical waves to adjacent media, without scattering. This characteristic can be achieved by carefully engineering the acoustic impedance of the medium -- a combination of wave speed and density, to match that of the surroundings. Owing to the strong correlation between acoustic wave speed and static stiffness, it is challenging to design acoustically transparent materials in a fluid, while maintaining their high structural rigidity. In this work, we propose a method to design architected lattices with independent control of the elastic wave speed at a chosen frequency, the mass density, and the static stiffness, along a chosen loading direction. We provide a sensitivity analysis to optimize these properties with respect to design parameters of the structure, that include localized masses at specific positions. We demonstrate the method on five different periodic, three dimensional lattices, to calculate bounds on the longitudinal wave speed as a function of their density and stiffness. We then perform experiments on 3-D printed structures, to validate our numerical simulations. The tools developed in this work can be used to design lightweight and stiff materials with optimized acoustic impedance for a plethora of applications, including ultrasound imaging, wave filtering and waveguiding.
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Submitted 19 June, 2021;
originally announced June 2021.
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A tuned mass amplifier for enhanced haptic feedback
Authors:
Sai Sharan Injeti,
Ali Israr,
Tianshu Liu,
Yiğit Mengüç,
Daniele Piazza,
Dongsuk D. Shin
Abstract:
Vibro-tactile feedback is, by far the most common haptic interface in wearable or touchable devices. This feedback can be amplified by controlling the wave propagation characteristics in devices, by utilizing phenomena such as structural resonance. However, much of the work in vibro-tactile haptics has focused on amplifying local displacements in a structure by increasing local compliance. In this…
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Vibro-tactile feedback is, by far the most common haptic interface in wearable or touchable devices. This feedback can be amplified by controlling the wave propagation characteristics in devices, by utilizing phenomena such as structural resonance. However, much of the work in vibro-tactile haptics has focused on amplifying local displacements in a structure by increasing local compliance. In this paper, we show that engineering the resonance mode shape of a structure with embedded localized mass amplifies the displacements without compromising on the stiffness or resonance frequency. The resulting structure, i.e., a tuned mass amplifier, produces higher tactile forces (7.7 times) compared to its counterpart without a mass, while maintaining a low frequency. We optimize the proposed design using a combination of a neural network and sensitivity analysis, and validate the results with experiments on 3-D printed structures. We also study the performance of the device on contact with a soft material, to evaluate the interaction with skin. Potential avenues for future work are also presented, including small form factor wearable haptic devices and remote haptics.
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Submitted 27 January, 2021; v1 submitted 27 January, 2021;
originally announced January 2021.
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Modified Stoney's equation with anisotropic substrates undergoing large deformations
Authors:
Sai Sharan Injeti,
Nihit Vyas,
Ratna Kumar Annabattula
Abstract:
Residual stresses in a thin film deposited on a substrate results in a curvature of the system, which can be measured using the well known Stoney equation. Isotropic elasticity of the substrate along with infinitesimal strains and rotations are two important assumptions used in the derivation of the Stoney equation. However, the transverse deflection in the substrate contributes significantly to t…
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Residual stresses in a thin film deposited on a substrate results in a curvature of the system, which can be measured using the well known Stoney equation. Isotropic elasticity of the substrate along with infinitesimal strains and rotations are two important assumptions used in the derivation of the Stoney equation. However, the transverse deflection in the substrate contributes significantly to the extensional strain in its plane, leading to non-linearity in its deformation. Moreover, Silicon wafers are predominantly used as substrate materials to measure the curvature of the system. In this paper, relations between normalized substrate curvature and normalized thin film mismatch are derived in the non-linear deformation regime, for substrates made of single crystal Si(001) and Si(111) wafers. Numerical results of curvature of thin film configurations with Si(001) and Si(111) wafer substrates, undergoing large deformations are presented and discussed.
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Submitted 21 December, 2017;
originally announced December 2017.
