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Correcting directional dark-field x-ray imaging artefacts using position-dependent image deblurring and attenuation removal
Authors:
Michelle K Croughan,
David M Paganin,
Samantha J Alloo,
Jannis N Ahlers,
Ying Ying How,
Stephanie A Harker,
Kaye S. Morgan
Abstract:
In recent years, a novel x-ray imaging modality has emerged that reveals unresolved sample microstructure via a "dark-field image", which provides complementary information to conventional "bright-field" images, such as attenuation and phase-contrast modalities. This x-ray dark-field signal is produced by unresolved microstructures scattering the x-ray beam resulting in localised image blur. Dark-…
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In recent years, a novel x-ray imaging modality has emerged that reveals unresolved sample microstructure via a "dark-field image", which provides complementary information to conventional "bright-field" images, such as attenuation and phase-contrast modalities. This x-ray dark-field signal is produced by unresolved microstructures scattering the x-ray beam resulting in localised image blur. Dark-field retrieval techniques extract this blur to reconstruct a dark-field image. Unfortunately, the presence of non-dark-field blur such as source-size blur or the detector point-spread-function can affect the dark-field retrieval as they also blur the experimental image. In addition, dark-field images can be degraded by the artefacts induced by large intensity gradients from attenuation and propagation-based phase contrast, particularly around sample edges. By measuring any non-dark-field blurring across the image plane and removing it from experimental images, as well as removing attenuation and propagation-based phase contrast, we show that a directional dark-field image can be retrieved with fewer artefacts and more consistent quantitative measures. We present the details of these corrections and provide "before and after" directional dark-field images of samples imaged at a synchrotron source. This paper utilises single-grid directional dark-field imaging, but these corrections have the potential to be broadly applied to other x-ray imaging techniques.
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Submitted 6 May, 2024; v1 submitted 26 April, 2024;
originally announced April 2024.
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Single-exposure x-ray dark-field imaging: quantifying sample microstructure using a single-grid setup
Authors:
Ying Ying How,
David M. Paganin,
Kaye S. Morgan
Abstract:
The size of the smallest detectable sample feature in an x-ray imaging system is usually restricted by the spatial resolution of the system. This limitation can now be overcome using the diffusive dark-field signal, which is generated by unresolved phase effects or the ultra-small-angle x-ray scattering from unresolved sample microstructures. A quantitative measure of this dark-field signal can be…
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The size of the smallest detectable sample feature in an x-ray imaging system is usually restricted by the spatial resolution of the system. This limitation can now be overcome using the diffusive dark-field signal, which is generated by unresolved phase effects or the ultra-small-angle x-ray scattering from unresolved sample microstructures. A quantitative measure of this dark-field signal can be useful in revealing the microstructure size or material for medical diagnosis, security screening and materials science. Recently, we derived a new method to quantify the diffusive dark-field signal in terms of a scattering angle using a single-exposure grid-based approach. In this manuscript, we look at the problem of quantifying the sample microstructure size from this single-exposure dark-field signal. We do this by quantifying the diffusive dark-field signal produced by 5 different sizes of polystyrene microspheres, ranging from 1.0 $μ$m to 10.8 $μ$m, to investigate how the strength of the dark-field signal changes with the sample microstructure size, $S$. We also explore the feasibility of performing single-exposure dark-field imaging with a simple equation for the optimal propagation distance given microstructure with a specific size and thickness, and successfully verify this equation with experimental data. Our theoretical model predicts that the dark-field scattering angle is inversely proportional to $\sqrt{S}$, which is consistent with our experimental data.
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Submitted 1 December, 2022;
originally announced December 2022.
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Directional dark-field retrieval with single-grid x-ray imaging
Authors:
Michelle K Croughan,
Ying Ying How,
Allan Pennings,
Kaye S Morgan
Abstract:
Directional dark-field imaging is an emerging x-ray modality that is sensitive to unresolved anisotropic scattering from sub-pixel sample microstructures. A single-grid imaging set-up can be used to capture dark-field images by looking at changes in a grid pattern projected upon the sample. By creating analytical models for the experiment, we have developed a single-grid directional dark field ret…
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Directional dark-field imaging is an emerging x-ray modality that is sensitive to unresolved anisotropic scattering from sub-pixel sample microstructures. A single-grid imaging set-up can be used to capture dark-field images by looking at changes in a grid pattern projected upon the sample. By creating analytical models for the experiment, we have developed a single-grid directional dark field retrieval algorithm that can extract dark-field parameters such as the dominant scattering direction, and the semi-major and -minor scattering angles. We show that this method is effective even in the presence of high image noise, allowing for low dose and time sequence imaging.
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Submitted 6 April, 2023; v1 submitted 20 November, 2022;
originally announced November 2022.
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Quantifying the x-ray dark-field signal in single-grid imaging
Authors:
Ying Ying How,
Kaye Morgan
Abstract:
X-ray dark-field imaging reveals the sample microstructure that is unresolved when using conventional methods of x-ray imaging. In this paper, we derive a new method to extract and quantify the x-ray dark-field signal collected using a single-grid imaging set-up, and relate the signal strength to the number of sample microstructures, $N$. This was achieved by modelling sample-induced changes to th…
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X-ray dark-field imaging reveals the sample microstructure that is unresolved when using conventional methods of x-ray imaging. In this paper, we derive a new method to extract and quantify the x-ray dark-field signal collected using a single-grid imaging set-up, and relate the signal strength to the number of sample microstructures, $N$. This was achieved by modelling sample-induced changes to the shadow of the upstream grid, and fitting experimental data to this model. Our results suggested that the dark-field scattering angle from our spherical microstructures is proportional to $^{2.19}\sqrt{N}$, which deviated from the theoretical model of $\sqrt{N}$, but was not inconsistent with results from other experimental methods. We believe the approach outlined here can equip quantitative dark-field imaging of small samples, particularly in cases where only one sample exposure is possible, either due to sample movement or radiation dose limitations. Future directions include an extension into directional dark-field imaging.
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Submitted 27 December, 2021;
originally announced December 2021.
