-
Inner product regularized multi-energy X-ray tomography for material decomposition
Authors:
Salla-Maaria Latva-Äijö,
Filippo Zanetti,
Ari-Pekka Honkanen,
Simo Huotari,
Jacek Gondzio,
Matti Lassas,
Samuli Siltanen
Abstract:
Multi-energy X-ray tomography is studied for decomposing three materials using three X-ray energies and a classical energy-integrating detector. A novel regularization term comprises inner products between the material distribution functions, penalizing any overlap of different materials. The method is tested on real data measured of a phantom embedded with Na$_2$SeO$_3$, Na$_2$SeO$_4$, and elemen…
▽ More
Multi-energy X-ray tomography is studied for decomposing three materials using three X-ray energies and a classical energy-integrating detector. A novel regularization term comprises inner products between the material distribution functions, penalizing any overlap of different materials. The method is tested on real data measured of a phantom embedded with Na$_2$SeO$_3$, Na$_2$SeO$_4$, and elemental selenium. It is found that the two-dimensional distributions of selenium in different oxidation states can be mapped and distinguished from each other with the new algorithm. The results have applications in material science, chemistry, biology and medicine.
△ Less
Submitted 4 August, 2023;
originally announced September 2023.
-
Monochromatic computed tomography using laboratory-scale setup: proof-of-concept
Authors:
Ari-Pekka Honkanen,
Simo Huotari
Abstract:
In this article, we demonstrate the viability of highly monochromatic full-field X-ray absorption near edge structure based tomography using a laboratory-scale Johann-type X-ray absorption spectrometer based on a conventional X-ray tube source. In this proof-of-concept, by using a phantom embedded with elemental Se, Na$_2$SeO$_3$, and Na$_2$SeO$_4$, we show that the three-dimensional distributions…
▽ More
In this article, we demonstrate the viability of highly monochromatic full-field X-ray absorption near edge structure based tomography using a laboratory-scale Johann-type X-ray absorption spectrometer based on a conventional X-ray tube source. In this proof-of-concept, by using a phantom embedded with elemental Se, Na$_2$SeO$_3$, and Na$_2$SeO$_4$, we show that the three-dimensional distributions of Se in different oxidation states can be mapped and distinguished from the phantom matrix and each other with absorption edge contrast tomography. The presented method allows for volumetric analyses of chemical speciation in mm-scale samples using low-brilliance X-ray sources, and represents a new analytic tool for materials engineering and research in many fields including biology and chemistry.
△ Less
Submitted 3 October, 2022;
originally announced October 2022.
-
Redox oscillations in 18650-type lithium-ion cell revealed by in operando Compton scattering imaging
Authors:
Kosuke Suzuki,
Shunta Suzuki,
Yuji Otsuka,
Naruki Tsuji,
Kirsi Jalkanen,
Jari Koskinen,
Kazushi Hoshi,
Ari-Pekka Honkanen,
Hasnain Hafiz,
Yoshiharu Sakurai,
Mika Kanninen,
Simo Huotari,
Arun Bansil,
Hiroshi Sakurai,
Bernardo Barbiellini
Abstract:
Compton scattering imaging using high-energy synchrotron x-rays allows the visualization of the spatio-temporal lithiation state in lithium-ion batteries probed in-operando. Here, we apply this imaging technique to the commercial 18650-type cylindrical lithium-ion battery. Our analysis of the lineshapes of the Compton scattering spectra taken from different electrode layers reveals the emergence o…
▽ More
Compton scattering imaging using high-energy synchrotron x-rays allows the visualization of the spatio-temporal lithiation state in lithium-ion batteries probed in-operando. Here, we apply this imaging technique to the commercial 18650-type cylindrical lithium-ion battery. Our analysis of the lineshapes of the Compton scattering spectra taken from different electrode layers reveals the emergence of inhomogeneous lithiation patterns during the charge-discharge cycles. Moreover, these patterns exhibit oscillations in time where the dominant period corresponds to the time scale of the charging curve.
△ Less
Submitted 13 May, 2021;
originally announced May 2021.
-
General method to calculate the elastic deformation and X-ray diffraction properties of bent crystal wafers
Authors:
Ari-Pekka Honkanen,
Simo Huotari
Abstract:
Curved single crystals are widely employed in spectrometer designs in the hard X-ray regime. Due to their large solid angle coverage and focusing properties, toroidally bent crystals are extremely useful in applications where the output of photons is low. Spherically bent crystals, a subgroup of toroidally bent crystals, particularly have found their way in many instruments at synchtrotrons and fr…
▽ More
Curved single crystals are widely employed in spectrometer designs in the hard X-ray regime. Due to their large solid angle coverage and focusing properties, toroidally bent crystals are extremely useful in applications where the output of photons is low. Spherically bent crystals, a subgroup of toroidally bent crystals, particularly have found their way in many instruments at synchtrotrons and free electron laser lightsource end-stations but also in the re-emerging field of high-resolution laboratory-scale X-ray spectroscopy. A solid theoretical understanding of the diffraction properties of such crystals is essential when aiming for optimal spectrometer performance. In this work, we present a general method to calculate the internal stress and strain fields of toroidally bent crystals and how to apply it to predict their diffraction properties. Solutions are derived and discussed for circular and rectangular spherically bent wafers due to their prevalence in contemporary instrumentation.
△ Less
Submitted 18 May, 2020;
originally announced June 2020.
-
Johann-type laboratory-scale X-ray absorption spectrometer with versatile detection modes
Authors:
Ari-Pekka Honkanen,
Sami Ollikkala,
Taru Ahopelto,
Antti-Jussi Kallio,
Merja Blomberg,
Simo Huotari
Abstract:
We present a low-cost laboratory X-ray absorption spectrometer that uses a conventional X-ray tube source and bent Johann-type crystal monochromators. The instrument is designed for XAS studies in the 4-20 keV range which covers most K edges of 3d transition metals and L edges of 5d transition metals and actinides. The energy resolution is typically in the range of 1-5 eV at 10 keV depending on th…
▽ More
We present a low-cost laboratory X-ray absorption spectrometer that uses a conventional X-ray tube source and bent Johann-type crystal monochromators. The instrument is designed for XAS studies in the 4-20 keV range which covers most K edges of 3d transition metals and L edges of 5d transition metals and actinides. The energy resolution is typically in the range of 1-5 eV at 10 keV depending on the crystal analyser and the Bragg angle. Measurements can be performed in transmission, fluorescence, and imaging modes. Due to its simple and modular design, the spectrometer can be modified to accommodate additional equipment and complex sample environments required for e.g. in situ studies. A showcase of various applications is presented.
△ Less
Submitted 8 March, 2019; v1 submitted 3 December, 2018;
originally announced December 2018.
-
A finite element approach to dynamical diffraction problems
Authors:
Ari-Pekka Honkanen,
Claudio Ferrero,
Jean-Pierre Guigay,
Vito Mocella
Abstract:
A finite element approach to solve numerically the Takagi-Taupin equations expressed in a weak form is presented and applied to simulate X-ray reflectivity curves, spatial intensity distributions and focusing properties of bent perfect crystals in symmetric reflection geometry. The proposed framework encompasses a new formulation of the Takagi-Taupin equations, which appears to be promising in ter…
▽ More
A finite element approach to solve numerically the Takagi-Taupin equations expressed in a weak form is presented and applied to simulate X-ray reflectivity curves, spatial intensity distributions and focusing properties of bent perfect crystals in symmetric reflection geometry. The proposed framework encompasses a new formulation of the Takagi-Taupin equations, which appears to be promising in terms of robustness and stability and supports the Fresnel propagation of the diffracted waves. The presented method is very flexible and has the potential of dealing with dynamical X-ray or neutron diffraction problems related to crystals of arbitrary shapes and deformations. The reference implementation based on the commercial COMSOL Multiphysics software package is available to the relevant user community.
△ Less
Submitted 21 December, 2017; v1 submitted 19 September, 2017;
originally announced September 2017.
-
A computationally efficient method to solve the Takagi-Taupin equations for a large deformed crystal
Authors:
Ari-Pekka Honkanen,
Giulio Monaco,
Simo Huotari
Abstract:
We present a treatise on solving the Takagi-Taupin equations in the case of a strain field with an additional, spatially slowly varying component (owing to \emph{e.g.}~heat expansion or angular compression). We show that the presence of such a component in a typical case merely shifts the reflectivity curve as a function of wavelength or incidence angle, while having a negligible effect on its sha…
▽ More
We present a treatise on solving the Takagi-Taupin equations in the case of a strain field with an additional, spatially slowly varying component (owing to \emph{e.g.}~heat expansion or angular compression). We show that the presence of such a component in a typical case merely shifts the reflectivity curve as a function of wavelength or incidence angle, while having a negligible effect on its shape. On the basis of the derived result, we develop a computationally efficient method to calculate the reflectivity curve of a large deformed crystal. The validity of the method is demonstrated by comparing computed reflectivity curves with experimental ones for bent silicon wafers. A good agreement is observed.
△ Less
Submitted 2 June, 2016; v1 submitted 27 January, 2016;
originally announced January 2016.
-
Resonant X-ray Emission Spectroscopy With a Standing Wave Excitation
Authors:
Kari O. Ruotsalainen,
Ari-Pekka Honkanen,
Stephen P. Collins,
Giulio Monaco,
Marco Moretti Sala,
Michael Krisch,
Keijo Hämäläinen,
Mikko Hakala,
Simo Huotari
Abstract:
The Borrmann effect is the anomalous transmission of x rays in perfect crystals under diffraction conditions. It arises from the interference of the incident and diffracted waves, which creates a standing wave with nodes at strongly absorbing atoms. Dipolar absorption of x rays is thus diminished, which makes the crystal nearly transparent for certain x-ray wave vectors. Indeed, a relative enhance…
▽ More
The Borrmann effect is the anomalous transmission of x rays in perfect crystals under diffraction conditions. It arises from the interference of the incident and diffracted waves, which creates a standing wave with nodes at strongly absorbing atoms. Dipolar absorption of x rays is thus diminished, which makes the crystal nearly transparent for certain x-ray wave vectors. Indeed, a relative enhancement of electric quadrupole absorption via the Borrmann effect has been demonstrated recently. Here we show that the Borrmann effect has a significantly larger impact on resonant x-ray emission than is observable in x-ray absorption. Emission from a dipole forbidden intermediate state may even dominate the corresponding x-ray spectra. Our work extends the domain of x-ray standing wave methods to resonant x-ray emission spectroscopy and provides means for novel spectroscopic experiments in d- and f-electron systems.
△ Less
Submitted 13 January, 2017; v1 submitted 17 November, 2015;
originally announced November 2015.
