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Accelerating X-Ray Tracing for Exascale Systems using Kokkos
Authors:
Felix Wittwer,
Nicholas K. Sauter,
Derek Mendez,
Billy K. Poon,
Aaron S. Brewster,
James M. Holton,
Michael E. Wall,
William E. Hart,
Deborah J. Bard,
Johannes P. Blaschke
Abstract:
The upcoming exascale computing systems Frontier and Aurora will draw much of their computing power from GPU accelerators. The hardware for these systems will be provided by AMD and Intel, respectively, each supporting their own GPU programming model. The challenge for applications that harness one of these exascale systems will be to avoid lock-in and to preserve performance portability.
We rep…
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The upcoming exascale computing systems Frontier and Aurora will draw much of their computing power from GPU accelerators. The hardware for these systems will be provided by AMD and Intel, respectively, each supporting their own GPU programming model. The challenge for applications that harness one of these exascale systems will be to avoid lock-in and to preserve performance portability.
We report here on our results of using Kokkos to accelerate a real-world application on NERSC's Perlmutter Phase 1 (using NVIDIA A100 accelerators) and the testbed system for OLCF's Frontier (using AMD MI250X). By porting to Kokkos, we were able to successfully run the same X-ray tracing code on both systems and achieved speed-ups between 13% and 66% compared to the original CUDA code. These results are a highly encouraging demonstration of using Kokkos to accelerate production science code.
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Submitted 16 May, 2022;
originally announced May 2022.
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DeepFreak: Learning Crystallography Diffraction Patterns with Automated Machine Learning
Authors:
Artur Souza,
Leonardo B. Oliveira,
Sabine Hollatz,
Matt Feldman,
Kunle Olukotun,
James M. Holton,
Aina E. Cohen,
Luigi Nardi
Abstract:
Serial crystallography is the field of science that studies the structure and properties of crystals via diffraction patterns. In this paper, we introduce a new serial crystallography dataset comprised of real and synthetic images; the synthetic images are generated through the use of a simulator that is both scalable and accurate. The resulting dataset is called DiffraNet, and it is composed of 2…
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Serial crystallography is the field of science that studies the structure and properties of crystals via diffraction patterns. In this paper, we introduce a new serial crystallography dataset comprised of real and synthetic images; the synthetic images are generated through the use of a simulator that is both scalable and accurate. The resulting dataset is called DiffraNet, and it is composed of 25,457 512x512 grayscale labeled images. We explore several computer vision approaches for classification on DiffraNet such as standard feature extraction algorithms associated with Random Forests and Support Vector Machines but also an end-to-end CNN topology dubbed DeepFreak tailored to work on this new dataset. All implementations are publicly available and have been fine-tuned using off-the-shelf AutoML optimization tools for a fair comparison. Our best model achieves 98.5% accuracy on synthetic images and 94.51% accuracy on real images. We believe that the DiffraNet dataset and its classification methods will have in the long term a positive impact in accelerating discoveries in many disciplines, including chemistry, geology, biology, materials science, metallurgy, and physics.
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Submitted 3 May, 2019; v1 submitted 26 April, 2019;
originally announced April 2019.
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An assessment of the resolution limitation due to radiation-damage in x-ray diffraction microscopy
Authors:
M. R. Howells,
T. Beetz,
H. N. Chapman,
C. Cui,
J. M. Holton,
C. J. Jacobsen,
J. Kirz E. Lima,
S. Marchesini,
H. Miao,
D. Sayre,
D. A. Shapiro,
J. C. H. Spence
Abstract:
X-ray diffraction microscopy (XDM) is a new form of x-ray imaging that is being practiced at several third-generation synchrotron-radiation x-ray facilities. Although only five years have elapsed since the technique was first introduced, it has made rapid progress in demonstrating high-resolution threedimensional imaging and promises few-nm resolution with much larger samples than can be imaged…
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X-ray diffraction microscopy (XDM) is a new form of x-ray imaging that is being practiced at several third-generation synchrotron-radiation x-ray facilities. Although only five years have elapsed since the technique was first introduced, it has made rapid progress in demonstrating high-resolution threedimensional imaging and promises few-nm resolution with much larger samples than can be imaged in the transmission electron microscope. Both life- and materials-science applications of XDM are intended, and it is expected that the principal limitation to resolution will be radiation damage for life science and the coherent power of available x-ray sources for material science. In this paper we address the question of the role of radiation damage. We use a statistical analysis based on the so-called "dose fractionation theorem" of Hegerl and Hoppe to calculate the dose needed to make an image of a lifescience sample by XDM with a given resolution. We conclude that the needed dose scales with the inverse fourth power of the resolution and present experimental evidence to support this finding. To determine the maximum tolerable dose we have assembled a number of data taken from the literature plus some measurements of our own which cover ranges of resolution that are not well covered by reports in the literature. The tentative conclusion of this study is that XDM should be able to image frozen-hydrated protein samples at a resolution of about 10 nm with "Rose-criterion" image quality.
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Submitted 10 February, 2005;
originally announced February 2005.
