-
Solid-to-solid phase transition from amorphous carbon to graphite nanocrystal induced by intense femtosecond x-ray pulses
Authors:
J. Gaudin,
J. Chalupský,
M. Toufarová,
L. Vyšín,
V. Hájková,
R. Sobierajski,
T. Burian,
Sh. Dastjani-Farahani,
A. Graf,
M. Amati,
L. Gregoratti,
S. P. Hau-Riege,
G. Hoffmann,
L. Juha,
J. Krzywinski,
R. A. London,
S. Moeller,
H. Sinn,
S. Schorb,
M. Störmer,
Th. Tschentscher,
V. Vorlíček,
H. Vu,
J. Bozek,
C. Bostedt
Abstract:
We present the results of an experiment where amorphous carbon was irradiated by femtosecond x-ray free electron laser pulses. The 830 eV laser pulses induce a phase transition in the material which is characterized ex-situ. The phase transition energy threshold is determined by measuring the surface of each irradiated area using an optical Nomarski microscope. The threshold fluence is found to be…
▽ More
We present the results of an experiment where amorphous carbon was irradiated by femtosecond x-ray free electron laser pulses. The 830 eV laser pulses induce a phase transition in the material which is characterized ex-situ. The phase transition energy threshold is determined by measuring the surface of each irradiated area using an optical Nomarski microscope. The threshold fluence is found to be 282 +/- 11 mJ/cm^2, corresponding to an absorbed dose at the surface of 131 +/-5 meV/atom. Atomic force microscopy measurements show volume expansion of the irradiated sample area, suggesting a solid to solid phase transition. Deeper insight into the phase transition is gained by using scanning photoelectron microscopy and micro-Raman spectroscopy. Photoelectron microscopy shows graphitization, i.e. modification from sp3 to sp2 hybridization, of the irradiated material. The micro-Raman spectra show the appearance of local order, i.e. formation of graphite nanocrystals. Finally, the nature of the phase transition is discussed, taking into account previous theory and experimental results.
△ Less
Submitted 9 November, 2011;
originally announced November 2011.
-
Ultrafast, ultrabright, X-ray holography using a uniformly-redundant array
Authors:
S. Marchesini,
S. Boutet,
A. E. Sakdinawat,
M. J. Bogan,
S. Bajt,
A. Barty,
H. N. Chapman,
M. Frank,
S. P. Hau-Riege,
A. Szoke,
C. Cui,
M. R. Howells,
D. A. Shapiro,
J. C. H. Spence,
J. W. Shaevitz,
J. Y. Lee,
J. Hajdu,
M. M. Seibert
Abstract:
Advances in the development of free-electron lasers offer the realistic prospect of high-resolution imaging to study the nanoworld on the time-scale of atomic motions. We identify X-ray Fourier Transform holography, (FTH) as a promising but, so far, inefficient scheme to do this. We show that a uniformly redundant array (URA) placed next to the sample, multiplies the efficiency of X-ray FTH by m…
▽ More
Advances in the development of free-electron lasers offer the realistic prospect of high-resolution imaging to study the nanoworld on the time-scale of atomic motions. We identify X-ray Fourier Transform holography, (FTH) as a promising but, so far, inefficient scheme to do this. We show that a uniformly redundant array (URA) placed next to the sample, multiplies the efficiency of X-ray FTH by more than one thousand (approaching that of a perfect lens) and provides holographic images with both amplitude- and phase-contrast information. The experiments reported here demonstrate this concept by imaging a nano-fabricated object at a synchrotron source, and a bacterial cell at a soft X-ray free-electron-laser, where illumination by a single 15 fs pulse was successfully used in producing the holographic image. We expect with upcoming hard X-ray lasers to achieve considerably higher spatial resolution and to obtain ultrafast movies of excited states of matter.
△ Less
Submitted 8 February, 2008; v1 submitted 31 January, 2008;
originally announced January 2008.
-
Interaction of ultrashort X-ray pulses with B4C, SiC and Si
Authors:
M. Bergh,
N. Timneanu,
S. P. Hau-Riege,
H. A. Scott
Abstract:
The interaction of 32.5 and 6 nm ultrashort X-ray pulses with the solid materials B4C, SiC and Si is simulated with a non-local thermodynamic equilibrium (NLTE) radiation transfer code. We study the ionization dynamics as function of depth in the material, modifications of the opacity during irradiation and estimate crater depth. Furthermore, we compare the estimated crater depth with experiment…
▽ More
The interaction of 32.5 and 6 nm ultrashort X-ray pulses with the solid materials B4C, SiC and Si is simulated with a non-local thermodynamic equilibrium (NLTE) radiation transfer code. We study the ionization dynamics as function of depth in the material, modifications of the opacity during irradiation and estimate crater depth. Furthermore, we compare the estimated crater depth with experimental data, for fluences up to 2.2 J/cm2. Our results show that at 32.5 nm irradiation, the opacity changes with less than a factor of 2 for B4C and Si and a factor of 3 for SiC, for fluences up to 200 J/cm2. At a laser wavelength of 6 nm, the model predicts a dramatic decrease in opacity due to the weak inverse bremsstrahlung, increasing the crater depth for high fluences.
△ Less
Submitted 27 September, 2007;
originally announced September 2007.
-
Three-dimensional coherent X-ray diffraction imaging of a ceramic nanofoam: determination of structural deformation mechanisms
Authors:
A. Barty,
S. Marchesini,
H. N. Chapman,
C. Cui,
M. R. Howells,
D. A. Shapiro,
A. M. Minor,
J. C. H. Spence,
U. Weierstall,
J. Ilavsky,
A. Noy,
S. P. Hau-Riege,
A. B. Artyukhin,
T. Baumann,
T. Willey,
J. Stolken,
T. van Buuren,
J. H. Kinney
Abstract:
Ultra-low density polymers, metals, and ceramic nanofoams are valued for their high strength-to-weight ratio, high surface area and insulating properties ascribed to their structural geometry. We obtain the labrynthine internal structure of a tantalum oxide nanofoam by X-ray diffractive imaging. Finite element analysis from the structure reveals mechanical properties consistent with bulk samples…
▽ More
Ultra-low density polymers, metals, and ceramic nanofoams are valued for their high strength-to-weight ratio, high surface area and insulating properties ascribed to their structural geometry. We obtain the labrynthine internal structure of a tantalum oxide nanofoam by X-ray diffractive imaging. Finite element analysis from the structure reveals mechanical properties consistent with bulk samples and with a diffusion limited cluster aggregation model, while excess mass on the nodes discounts the dangling fragments hypothesis of percolation theory.
△ Less
Submitted 25 June, 2008; v1 submitted 30 August, 2007;
originally announced August 2007.
-
Femtosecond Diffractive Imaging with a Soft-X-ray Free-Electron Laser
Authors:
Henry N. Chapman,
Anton Barty,
Michael J. Bogan,
Sebastien Boutet,
Matthias Frank,
Stefan P. Hau-Riege,
Stefano Marchesini,
Bruce W. Woods,
Sasa Bajt,
W. Henry Benner,
Richard A. London,
Elke Plonjes,
Marion Kuhlmann,
Rolf Treusch,
Stefan Dusterer,
Thomas Tschentscher,
Jochen R. Schneider,
Eberhard Spiller,
Thomas Moller,
Christoph Bostedt,
Matthias Hoener,
David A. Shapiro,
Keith O. Hodgson,
David van der Spoel,
Florian Burmeister
, et al. (9 additional authors not shown)
Abstract:
Theory predicts that with an ultrashort and extremely bright coherent X-ray pulse, a single diffraction pattern may be recorded from a large macromolecule, a virus, or a cell before the sample explodes and turns into a plasma. Here we report the first experimental demonstration of this principle using the FLASH soft X-ray free-electron laser. An intense 25 fs, 4 10^13 W/cm^2 pulse, containing 10…
▽ More
Theory predicts that with an ultrashort and extremely bright coherent X-ray pulse, a single diffraction pattern may be recorded from a large macromolecule, a virus, or a cell before the sample explodes and turns into a plasma. Here we report the first experimental demonstration of this principle using the FLASH soft X-ray free-electron laser. An intense 25 fs, 4 10^13 W/cm^2 pulse, containing 10^12 photons at 32 nm wavelength, produced a coherent diffraction pattern from a nano-structured non-periodic object, before destroying it at 60,000 K. A novel X-ray camera assured single photon detection sensitivity by filtering out parasitic scattering and plasma radiation. The reconstructed image, obtained directly from the coherent pattern by phase retrieval through oversampling, shows no measurable damage, and extends to diffraction-limited resolution. A three-dimensional data set may be assembled from such images when copies of a reproducible sample are exposed to the beam one by one.
△ Less
Submitted 10 October, 2006; v1 submitted 7 October, 2006;
originally announced October 2006.
-
Progress in Three-Dimensional Coherent X-Ray Diffraction Imaging
Authors:
S. Marchesini,
H. N. Chapman,
A. Barty,
A. Noy,
S. P. Hau-Riege,
J. M. Kinney,
C. Cui,
M. R. Howells,
R. Rosen,
J. C. H. Spence,
U. Weierstall,
D. Shapiro,
T. Beetz,
C. Jacobsen,
E. Lima,
A. M. Minor,
H. He
Abstract:
The Fourier inversion of phased coherent diffraction patterns offers images without the resolution and depth-of-focus limitations of lens-based tomographic systems. We report on our recent experimental images inverted using recent developments in phase retrieval algorithms, and summarize efforts that led to these accomplishments. These include ab-initio reconstruction of a two-dimensional test p…
▽ More
The Fourier inversion of phased coherent diffraction patterns offers images without the resolution and depth-of-focus limitations of lens-based tomographic systems. We report on our recent experimental images inverted using recent developments in phase retrieval algorithms, and summarize efforts that led to these accomplishments. These include ab-initio reconstruction of a two-dimensional test pattern, infinite depth of focus image of a thick object, and its high-resolution (~10 nm resolution) three-dimensional image. Developments on the structural imaging of low density aerogel samples are discussed.
△ Less
Submitted 6 October, 2005; v1 submitted 4 October, 2005;
originally announced October 2005.
-
SPEDEN: Reconstructing single particles from their diffraction patterns
Authors:
S. P. Hau-Riege,
H. Szoke,
H. N. Chapman,
A. Szoke,
S. Marchesini,
A. Noy,
H. He,
M. R. Howells,
U. Weierstall,
J. C. H. Spence
Abstract:
Speden is a computer program that reconstructs the electron density of single particles from their x-ray diffraction patterns, using a single-particle adaptation of the Holographic Method in crystallography. (Szoke, A., Szoke, H., and Somoza, J.R., 1997. Acta Cryst. A53, 291-313.) The method, like its parent, is unique that it does not rely on ``back'' transformation from the diffraction pattern…
▽ More
Speden is a computer program that reconstructs the electron density of single particles from their x-ray diffraction patterns, using a single-particle adaptation of the Holographic Method in crystallography. (Szoke, A., Szoke, H., and Somoza, J.R., 1997. Acta Cryst. A53, 291-313.) The method, like its parent, is unique that it does not rely on ``back'' transformation from the diffraction pattern into real space and on interpolation within measured data. It is designed to deal successfully with sparse, irregular, incomplete and noisy data. It is also designed to use prior information for ensuring sensible results and for reliable convergence. This article describes the theoretical basis for the reconstruction algorithm, its implementation and quantitative results of tests on synthetic and experimentally obtained data. The program could be used for determining the structure of radiation tolerant samples and, eventually, of large biological molecular structures without the need for crystallization.
△ Less
Submitted 18 March, 2004;
originally announced March 2004.
-
Coherent X-ray Diffractive Imaging; applications and limitations
Authors:
S. Marchesini,
H. N. Chapman,
S. P. Hau-Riege,
R. A. London,
A. Szoke,
H. He,
M. R. Howells,
H. Padmore,
R. Rosen,
J. C. H. Spence,
U. Weierstall
Abstract:
The inversion of a diffraction pattern offers aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems, the only limitation being radiation damage. We review our experimental results, discuss the fundamental limits of this technique and future plans.
The inversion of a diffraction pattern offers aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems, the only limitation being radiation damage. We review our experimental results, discuss the fundamental limits of this technique and future plans.
△ Less
Submitted 15 August, 2003;
originally announced August 2003.
-
X-ray image reconstruction from a diffraction pattern alone
Authors:
S. Marchesini,
H. He,
H. N. Chapman,
S. P. Hau-Riege,
A. Noy,
M. R. Howells,
U. Weierstall,
J. C. H. Spence
Abstract:
A solution to the inversion problem of scattering would offer aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems. Powerful algorithms are increasingly being used to act as lenses to form such images. Current image reconstruction methods, however, require the knowledge of the shape of the object and the low spatial…
▽ More
A solution to the inversion problem of scattering would offer aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems. Powerful algorithms are increasingly being used to act as lenses to form such images. Current image reconstruction methods, however, require the knowledge of the shape of the object and the low spatial frequencies unavoidably lost in experiments. Diffractive imaging has thus previously been used to increase the resolution of images obtained by other means. We demonstrate experimentally here a new inversion method, which reconstructs the image of the object without the need for any such prior knowledge.
△ Less
Submitted 12 September, 2003; v1 submitted 24 June, 2003;
originally announced June 2003.
