Tracking radiation damage of Euclid VIS detectors after 1 year in space
Authors:
Jesper Skottfelt,
Matt Wander,
Mark Cropper,
Ben Dryer,
David J. Hall,
Richard Hayes,
Bradley Kelman,
Tom Kitching,
Ralf Kohley,
David Lagattuta,
Zoe Lee-Payne,
Patricia Liebing,
Richard Massey,
Henry Joy McCracken,
Reiko Nakajima,
James Nightingale
Abstract:
Due to the space radiation environment at L2, ESA's Euclid mission will be subject to a large amount of highly energetic particles over its lifetime. These particles can cause damage to the detectors by creating defects in the silicon lattice. These defects degrade the returned image in several ways, one example being a degradation of the Charge Transfer Efficiency, which appears as readout trails…
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Due to the space radiation environment at L2, ESA's Euclid mission will be subject to a large amount of highly energetic particles over its lifetime. These particles can cause damage to the detectors by creating defects in the silicon lattice. These defects degrade the returned image in several ways, one example being a degradation of the Charge Transfer Efficiency, which appears as readout trails in the image data. This can be problematic for the Euclid VIS instrument, which aims to measure the shapes of galaxies to a very high degree of accuracy. Using a special clocking technique called trap pum**, the single defects in the CCDs can be detected and characterised. Being the first instrument in space with this capability, it will provide novel insights into the creation and evolution of radiation-induced defects and give input to the radiation damage correction of the scientific data. We present the status of the radiation damage of the Euclid VIS CCDs and how it has evolved over the first year in space.
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Submitted 1 July, 2024;
originally announced July 2024.
Importance of charge capture in inter-phase regions during readout of charge-coupled devices
Authors:
Jesper Skottfelt,
David J. Hall,
Ben Dryer,
Nathan Bush,
Jason Gow,
Andrew Holland
Abstract:
The current understanding of charge transfer dynamics in Charge-Coupled Devices (CCDs) is that charge is moved so quickly from one phase to the next in a clocking sequence and with a density so low that trap** of charge in the inter-phase regions is negligible. However, new simulation capabilities developed at the Centre for Electronic Imaging, that includes direct input of electron density simu…
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The current understanding of charge transfer dynamics in Charge-Coupled Devices (CCDs) is that charge is moved so quickly from one phase to the next in a clocking sequence and with a density so low that trap** of charge in the inter-phase regions is negligible. However, new simulation capabilities developed at the Centre for Electronic Imaging, that includes direct input of electron density simulations, has made it possible to investigate this assumption further. As part of the radiation testing campaign of the Euclid CCD273 devices, data has been obtained using the trap pum** method, that can be used to identify and characterise single defects CCDs. Combining this data with simulations, we find that trap** during the transfer of charge between phases is indeed necessary in order to explain the results of the data analysis. This result could influence not only trap pum** theory and how trap pum** should be performed, but also how a radiation damaged CCD is read out in the most optimal way.
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Submitted 3 January, 2018;
originally announced January 2018.
