Showing 1–5 of 5 results for author: Haan, A M J d

A method for mechanical generation of radio frequency fields in nuclear magnetic resonance force microscopy

Authors: J. J. T. Wagenaar, A. M. J. den Haan, R. J. Donkersloot, F. Marsman, M. de Wit, L. Bossoni, T. H. Oosterkamp

Abstract: We present an innovative method for magnetic resonance force microscopy (MRFM) with ultra-low dissipation, by using the higher modes of the mechanical detector as radio frequency (rf) source. This method allows MRFM on samples without the need to be close to an rf source. Furthermore, since rf sources require currents that give dissipation, our method enables nuclear magnetic resonance experiments… ▽ More We present an innovative method for magnetic resonance force microscopy (MRFM) with ultra-low dissipation, by using the higher modes of the mechanical detector as radio frequency (rf) source. This method allows MRFM on samples without the need to be close to an rf source. Furthermore, since rf sources require currents that give dissipation, our method enables nuclear magnetic resonance experiments at ultra-low temperatures. Removing the need for an on-chip rf source is an important step towards a MRFM which can be widely used in condensed matter physics. △ Less

Submitted 19 September, 2016; originally announced September 2016.

Comments: 7 pages, 5 figures, to be submitted to Physical Review Applied

Journal ref: Phys. Rev. Applied 7, 024019 (2017)

Probing the Nuclear Spin-Lattice Relaxation Time at the Nanoscale

Authors: J. J. T. Wagenaar, A. M. J. den Haan, J. M. de Voogd, L. Bossoni, T. A. de Jong, M. de Wit, K. M. Bastiaans, D. J. Thoen, A. Endo, T. M. Klapwijk, J. Zaanen, T. H. Oosterkamp

Abstract: Nuclear spin-lattice relaxation times are measured on copper using magnetic resonance force microscopy performed at temperatures down to 42 mK. The low temperature is verified by comparison with the Korringa relation. Measuring spin-lattice relaxation times locally at very low temperatures opens up the possibility to measure the magnetic properties of inhomogeneous electron systems realized in oxi… ▽ More Nuclear spin-lattice relaxation times are measured on copper using magnetic resonance force microscopy performed at temperatures down to 42 mK. The low temperature is verified by comparison with the Korringa relation. Measuring spin-lattice relaxation times locally at very low temperatures opens up the possibility to measure the magnetic properties of inhomogeneous electron systems realized in oxide interfaces, topological insulators and other strongly correlated electron systems such as high-Tc superconductors. △ Less

Submitted 27 June, 2016; v1 submitted 14 March, 2016; originally announced March 2016.

Comments: We revised the manuscript by including the supplemental material. The manuscript is changed from a Letter to a Research Article after change of journal

Spin-mediated dissipation and frequency shifts of a cantilever at milliKelvin temperatures

Authors: A. M. J. den Haan, J. J. T. Wagenaar, J. M. de Voogd, G. Koning, T. H. Oosterkamp

Abstract: We measure the dissipation and frequency shift of a magnetically coupled cantilever in the vicinity of a silicon chip, down to $25$ mK. The dissipation and frequency shift originates from the interaction with the unpaired electrons, associated with the dangling bonds in the native oxide layer of the silicon, which form a two dimensional system of electron spins. We approach the sample with a… ▽ More We measure the dissipation and frequency shift of a magnetically coupled cantilever in the vicinity of a silicon chip, down to $25$ mK. The dissipation and frequency shift originates from the interaction with the unpaired electrons, associated with the dangling bonds in the native oxide layer of the silicon, which form a two dimensional system of electron spins. We approach the sample with a $3.43$ $μ$m-diameter magnetic particle attached to an ultrasoft cantilever, and measure the frequency shift and quality factor as a function of temperature and the distance. Using a recent theoretical analysis [J. M. de Voogd et al., arXiv:1508.07972 (2015)] of the dynamics of a system consisting of a spin and a magnetic resonator, we are able to fit the data and extract the relaxation time $T_1=0.39\pm0.08$ ms and spin density $σ=0.14\pm0.01$ spins per nm$^2$. Our analysis shows that at temperatures $\leq500$ mK magnetic dissipation is an important source of non-contact friction. △ Less

Submitted 21 January, 2016; v1 submitted 3 September, 2015; originally announced September 2015.

Comments: 5 pages, 3 figures

Journal ref: Phys. Rev. B 92, 235441 (2015)

Probing the magnetic moment of FePt micromagnets prepared by Focused Ion Beam milling

Authors: H. C. Overweg, A. M. J. den Haan, H. J. Eerkens, P. F. A. Alkemade, A. L. La Rooij, R. J. C. Spreeuw, L. Bossoni, T. H. Oosterkamp

Abstract: We investigate the degradation of the magnetic moment of a 300 nm thick FePt film induced by Focused Ion Beam (FIB) milling. A $1~μ\mathrm{m} \times 8~μ\mathrm{m}$ rod is milled out of a film by a FIB process and is attached to a cantilever by electron beam induced deposition. Its magnetic moment is determined by frequency-shift cantilever magnetometry. We find that the magnetic moment of the rod… ▽ More We investigate the degradation of the magnetic moment of a 300 nm thick FePt film induced by Focused Ion Beam (FIB) milling. A $1~μ\mathrm{m} \times 8~μ\mathrm{m}$ rod is milled out of a film by a FIB process and is attached to a cantilever by electron beam induced deposition. Its magnetic moment is determined by frequency-shift cantilever magnetometry. We find that the magnetic moment of the rod is $μ= 1.1 \pm 0.1 \times 10 ^{-12} \mathrm{Am}^2$, which implies that 70% of the magnetic moment is preserved during the FIB milling process. This result has important implications for atom trap** and magnetic resonance force microscopy (MRFM), that are addressed in this paper. △ Less

Submitted 23 August, 2015; v1 submitted 27 April, 2015; originally announced April 2015.

Comments: 4 pages, 4 figures

Journal ref: Appl. Phys. Lett. 107, 072402 (2015)

Atomic resolution STM in a cryogen free dilution refrigerator at 15 mK

Authors: A. M. J. den Haan, G. H. C. J. Wijts, F. Galli, O. Usenko, G. J. C. van Baarle, D. J. van der Zalm, T. H. Oosterkamp

Abstract: Pulse tube refrigerators are becoming more common, because they are cost efficient and demand less handling than conventional (wet) refrigerators. However, a downside of a pulse tube system is the vibration level at the cold-head, which is in most designs several micrometers. We implemented vibration isolation techniques which significantly reduced vibration levels at the experiment. These optimiz… ▽ More Pulse tube refrigerators are becoming more common, because they are cost efficient and demand less handling than conventional (wet) refrigerators. However, a downside of a pulse tube system is the vibration level at the cold-head, which is in most designs several micrometers. We implemented vibration isolation techniques which significantly reduced vibration levels at the experiment. These optimizations were necessary for the vibration sensitive Magnetic Resonance Force Microscopy experiments (MRFM) at milli-kelvin temperatures for which the cryostat is intended. With these modifications we show atomic resolution STM on graphite. This is promising for scanning probe microscopy applications at very low temperatures. △ Less

Submitted 2 February, 2014; v1 submitted 20 December, 2013; originally announced December 2013.

Comments: 6 pages, 10 figures and 1 video 1st revision: added label a and b to figures 2 and 3 typo at page 5 at the end of section 4 (Results): replaced 10^-10 m/sqrt(Hz) to 10^-12 m/sqrt(Hz) (contact [email protected] for the calculation)

Journal ref: Rev. Sci. Instrum. 85, 035112 (2014)