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Showing 1–3 of 3 results for author: Hölscher, H

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  1. arXiv:2208.11390  [pdf, other

    quant-ph cond-mat.mes-hall

    Out-of-equilibrium optomechanical resonance self-excitation

    Authors: P. Milde, M. Langenhorst, H. Hölscher, J. Rottmann-Matthes, D. Hundertmark, L. M. Eng, R. Hoffmann-Vogel

    Abstract: The fundamental sensitivity limit of atomic force microscopy is strongly correlated to the thermal noise of the cantilever oscillation. A method to suppress this unwanted noise is to reduce the bandwidth of the measurement, but this approach is limited by the speed of the measurement and the width of the cantilever resonance, commonly defined through the quality factor Q. However, it has been show… ▽ More

    Submitted 24 August, 2022; originally announced August 2022.

    Comments: 10 pages

    Journal ref: J. Appl. Phys. 130, 035303 (2021)

  2. arXiv:0811.2087  [pdf, other

    cond-mat.mtrl-sci cond-mat.stat-mech

    Role of tip size, orientation, and structural relaxations in first-principles studies of magnetic exchange force microscopy and spin-polarized scanning tunneling microscopy

    Authors: C. Lazo, V. Caciuc H. Hoelscher, S. Heinze

    Abstract: Using first-principles calculations based on density functional theory (DFT), we investigate the exchange interaction between a magnetic tip and a magnetic sample which is detected in magnetic exchange force microscopy (MExFM) and also occurs in spin-polarized scanning tunneling microscopy (SP-STM) experiments. As a model tip-sample system, we choose Fe tips and one monolayer Fe on W(001) which… ▽ More

    Submitted 13 November, 2008; originally announced November 2008.

    Comments: 14 pages, 13 figures

  3. arXiv:0810.0165  [pdf, ps, other

    cond-mat.other

    Friction at Atomic-Scale Surface Steps: Experiment and Theory

    Authors: Hendrik Holscher, Daniel Ebeling, Udo D. Schwarz

    Abstract: Experiments performed by friction force microscopy at atomic-scale surface steps on graphite, MoS$_2$, and NaCl in ambient conditions are presented. Both step-down and step-up scans exhibit higher frictional forces at the edge, but distinguish in their load dependence: While the additional frictional force due to the step edge increases linearly with load if the tip has to jump a step up, it rem… ▽ More

    Submitted 1 October, 2008; originally announced October 2008.