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U-SLADS: Unsupervised Learning Approach for Dynamic Dendrite Sampling
Authors:
Yan Zhang,
Xiang Huang,
Nicola Ferrier,
Emine B. Gulsoy,
Charudatta Phatak
Abstract:
Novel data acquisition schemes have been an emerging need for scanning microscopy based imaging techniques to reduce the time in data acquisition and to minimize probing radiation in sample exposure. Varies sparse sampling schemes have been studied and are ideally suited for such applications where the images can be reconstructed from a sparse set of measurements. Dynamic sparse sampling methods,…
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Novel data acquisition schemes have been an emerging need for scanning microscopy based imaging techniques to reduce the time in data acquisition and to minimize probing radiation in sample exposure. Varies sparse sampling schemes have been studied and are ideally suited for such applications where the images can be reconstructed from a sparse set of measurements. Dynamic sparse sampling methods, particularly supervised learning based iterative sampling algorithms, have shown promising results for sampling pixel locations on the edges or boundaries during imaging. However, dynamic sampling for imaging skeleton-like objects such as metal dendrites remains difficult. Here, we address a new unsupervised learning approach using Hierarchical Gaussian Mixture Mod- els (HGMM) to dynamically sample metal dendrites. This technique is very useful if the users are interested in fast imaging the primary and secondary arms of metal dendrites in solidification process in materials science.
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Submitted 5 July, 2018;
originally announced July 2018.
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SLADS-Net: Supervised Learning Approach for Dynamic Sampling using Deep Neural Networks
Authors:
Yan Zhang,
G. M. Dilshan Godaliyadda,
Nicola Ferrier,
Emine B. Gulsoy,
Charles A. Bouman,
Charudatta Phatak
Abstract:
In scanning microscopy based imaging techniques, there is a need to develop novel data acquisition schemes that can reduce the time for data acquisition and minimize sample exposure to the probing radiation. Sparse sampling schemes are ideally suited for such applications where the images can be reconstructed from a sparse set of measurements. In particular, dynamic sparse sampling based on superv…
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In scanning microscopy based imaging techniques, there is a need to develop novel data acquisition schemes that can reduce the time for data acquisition and minimize sample exposure to the probing radiation. Sparse sampling schemes are ideally suited for such applications where the images can be reconstructed from a sparse set of measurements. In particular, dynamic sparse sampling based on supervised learning has shown promising results for practical applications. However, a particular drawback of such methods is that it requires training image sets with similar information content which may not always be available. In this paper, we introduce a Supervised Learning Approach for Dynamic Sampling (SLADS) algorithm that uses a deep neural network based training approach. We call this algorithm SLADS- Net. We have performed simulated experiments for dynamic sampling using SLADS-Net in which the training images either have similar information content or completely different information content, when compared to the testing images. We compare the performance across various methods for training such as least- squares, support vector regression and deep neural networks. From these results we observe that deep neural network based training results in superior performance when the training and testing images are not similar. We also discuss the development of a pre-trained SLADS-Net that uses generic images for training. Here, the neural network parameters are pre-trained so that users can directly apply SLADS-Net for imaging experiments.
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Submitted 8 March, 2018;
originally announced March 2018.
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Reduced Electron Exposure for Energy-Dispersive Spectroscopy using Dynamic Sampling
Authors:
Yan Zhang,
G. M. Dilshan Godaliyadda,
Nicola Ferrier,
Emine B. Gulsoy,
Charles A. Bouman,
Charudatta Phatak
Abstract:
Analytical electron microscopy and spectroscopy of biological specimens, polymers, and other beam sensitive materials has been a challenging area due to irradiation damage. There is a pressing need to develop novel imaging and spectroscopic imaging methods that will minimize such sample damage as well as reduce the data acquisition time. The latter is useful for high-throughput analysis of materia…
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Analytical electron microscopy and spectroscopy of biological specimens, polymers, and other beam sensitive materials has been a challenging area due to irradiation damage. There is a pressing need to develop novel imaging and spectroscopic imaging methods that will minimize such sample damage as well as reduce the data acquisition time. The latter is useful for high-throughput analysis of materials structure and chemistry. In this work, we present a novel machine learning based method for dynamic sparse sampling of EDS data using a scanning electron microscope. Our method, based on the supervised learning approach for dynamic sampling algorithm and neural networks based classification of EDS data, allows a dramatic reduction in the total sampling of up to 90%, while maintaining the fidelity of the reconstructed elemental maps and spectroscopic data. We believe this approach will enable imaging and elemental map** of materials that would otherwise be inaccessible to these analysis techniques.
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Submitted 27 June, 2017;
originally announced July 2017.