Noise Measurements of High-Speed, Light-Emitting GaN Resonant-Tunneling Diodes
Authors:
E. R. Brown,
W-D. Zhang,
T. A. Growden,
P. R. Berger,
R. Droopad,
D. F. Storm,
D. J. Meyer
Abstract:
We report here the first RF noise measurements on two designs of n-doped GaN/AlN double-barrier resonant tunneling diodes (RTDs), each having a room-temperature negative differential resistance (NDR) and also strong near-UV light emission. The measurements are made with a standard, un-isolated RF receiver and calibration is made using a substitution-resistor/hot-cold radiometric technique which wo…
▽ More
We report here the first RF noise measurements on two designs of n-doped GaN/AlN double-barrier resonant tunneling diodes (RTDs), each having a room-temperature negative differential resistance (NDR) and also strong near-UV light emission. The measurements are made with a standard, un-isolated RF receiver and calibration is made using a substitution-resistor/hot-cold radiometric technique which works in the positive differential resistance (PDR) region but not the NDR region. A high-quality InGaAs/AlAs double-barrier RTD is used as a control sample and displays shot noise suppression down to $Γ\approx$0.5 in the PDR region, as expected. The GaN/AlN RTDs display both shot-noise enhancement and suppression in the PDR regions, but no obvious sign of sudden shot-noise enhancement in the threshold bias region of light emission. This supports the hypothesis that the holes required for light emission are created by electronic (Zener) interband tunneling, not impact ionization. Further the minimum shot-noise factor of $Γ\sim$ 0.34 suggests that the GaN/AlN RTDs are acting like triple-barrier devices.
△ Less
Submitted 24 June, 2018;
originally announced June 2018.
Strong Band-Edge Light Emission from InGaAs RTDs: Evidence for the Universal Nature of Resonant- and Zener- Co-Tunneling
Authors:
E. R. Brown,
W-D. Zhang,
T. A. Growden,
P. R. Berger,
R. Droopad
Abstract:
We report strong light emission from a room-temperature n-type unipolar-doped In0.53Ga0.47As/AlAs double-barrier resonant-tunneling diode (DBRTD) precisely at the In0.53Ga0.47As band-edge near 1650 nm. The emission characteristics are very similar to what was observed recently in GaN/AlN DBRTDs, both of which suggest that the mechanism for emission is cross-gap electron-hole recombination via reso…
▽ More
We report strong light emission from a room-temperature n-type unipolar-doped In0.53Ga0.47As/AlAs double-barrier resonant-tunneling diode (DBRTD) precisely at the In0.53Ga0.47As band-edge near 1650 nm. The emission characteristics are very similar to what was observed recently in GaN/AlN DBRTDs, both of which suggest that the mechanism for emission is cross-gap electron-hole recombination via resonant- and Zener co-tunneling of electrons, the latter mechanism generating the required holes. Analysis shows that because of the relatively small bandgap, the Zener tunneling probability can be large in this In0.53Ga0.47As/AlAs DBRTD, and is a mechanism that may have been overlooked in the longstanding literature. The universal nature of the co-tunneling is best supported by the factor (EG)2/F in the Kane tunneling probability, which is nearly the same at the peak voltage of the In0.53Ga0.47As and GaN DBRTDs.
△ Less
Submitted 20 April, 2018;
originally announced April 2018.
