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A surface-normal photodetector as nonlinear activation function in diffractive optical neural networks
Authors:
Farshid Ashtiani,
Mohamad Hossein Idjadi,
Ting-Chen Hu,
Stefano Grillanda,
David Neilson,
Mark Earnshaw,
Mark Cappuzzo,
Rose Kopf,
Alaric Tate,
Andrea Blanco-Redondo
Abstract:
Optical neural networks (ONNs) enable high speed parallel and energy efficient processing compared to conventional digital electronic counterparts. However, realizing large scale systems is an open problem. Among various integrated and non-integrated ONNs, free-space diffractive ONNs benefit from a large number of pixels of spatial light modulators to realize millions of neurons. However, a signif…
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Optical neural networks (ONNs) enable high speed parallel and energy efficient processing compared to conventional digital electronic counterparts. However, realizing large scale systems is an open problem. Among various integrated and non-integrated ONNs, free-space diffractive ONNs benefit from a large number of pixels of spatial light modulators to realize millions of neurons. However, a significant fraction of computation time and energy is consumed by the nonlinear activation function that is typically implemented using a camera sensor. Here, we propose a novel surface-normal photodetector (SNPD) with a nonlinear response to replace the camera sensor that enables about three orders of magnitude faster (5.7 us response time) and more energy efficient (less than 10 nW/pixel) response. Direct efficient vertical optical coupling, polarization insensitivity, inherent nonlinearity with no control electronics, low optical power requirements, and the possibility of implementing large scale arrays make the SNPD a promising nonlinear activation function for diffractive ONNs. To show the applicability, successful classification simulation of MNIST and Fashion MNIST datasets using the measured response of SNPD with accuracy comparable to that of an ideal ReLU function are demonstrated.
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Submitted 5 May, 2023;
originally announced May 2023.
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ContactLess Integrated Photonic Probe for light monitoring in InP-based devices
Authors:
Daniele Melati,
Marco Carminati,
Stefano Grillanda,
Giorgio Ferrari,
Francesco Morichetti,
Marco Sampietro,
Andrea Melloni
Abstract:
The increasing complexity of photonic integrated circuits requires the possibility to monitor the state of the circuit in order to stabilize the working point against environmental fluctuations or to perform reliable reconfiguration procedures. Although InP technologies can naturally integrate high-quality photodiodes, their use as tap monitors necessarily affects the circuit response and is restr…
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The increasing complexity of photonic integrated circuits requires the possibility to monitor the state of the circuit in order to stabilize the working point against environmental fluctuations or to perform reliable reconfiguration procedures. Although InP technologies can naturally integrate high-quality photodiodes, their use as tap monitors necessarily affects the circuit response and is restricted to few units per chip. They are hence unsuited for very large circuits, where transparent power monitors become key components. In this paper we present the implementation of a ContactLess Integrated Photonic Probe (CLIPP) realizing a non invasive integrated light monitor on InP-based devices. We describe an innovative vertical scheme of the CLIPP monitor which exploits the back side of the chip as a common electrode, thus enabling a reduction of the device footprint and a simplification of the electrical connectivity. We characterize the response of the CLIPP and demonstrate its functionality as power monitor. Lastly, we provide a direct demonstration that CLIPP monitor allows to access more accurate information on the working point of photonic integrated circuits compared to conventional external or integrated photodetectors.
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Submitted 18 December, 2014;
originally announced December 2014.
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Non-invasive monitoring and control in silicon photonics by CMOS integrated electronics
Authors:
Stefano Grillanda,
Marco Carminati,
Francesco Morichetti,
Pietro Ciccarella,
Andrea Annoni,
Giorgio Ferrari,
Michael Strain,
Marc Sorel,
Marco Sampietro,
Andrea Melloni
Abstract:
As photonics breaks away from today's device level toward large scale of integration and complex systems-on-a-chip, concepts like monitoring, control and stabilization of photonic integrated circuits emerge as new paradigms. Here, we show non-invasive monitoring and feedback control of high quality factor silicon photonics resonators assisted by a transparent light detector directly integrated ins…
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As photonics breaks away from today's device level toward large scale of integration and complex systems-on-a-chip, concepts like monitoring, control and stabilization of photonic integrated circuits emerge as new paradigms. Here, we show non-invasive monitoring and feedback control of high quality factor silicon photonics resonators assisted by a transparent light detector directly integrated inside the cavity. Control operations are entirely managed by a CMOS microelectronic circuit, hosting many parallel electronic read-out channels, that is bridged to the silicon photonics chip. Advanced functionalities, such as wavelength tuning, locking, labeling and swap** are demonstrated. The non-invasive nature of the transparent monitor and the scalability of the CMOS read-out system offer a viable solution for the control of arbitrarily reconfigurable photonic integrated circuits aggregating many components on a single chip.
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Submitted 22 May, 2014;
originally announced May 2014.
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Non-invasive light observer
Authors:
Francesco Morichetti,
Stefano Grillanda,
Marco Carminati,
Giorgio Ferrari,
Marco Sampietro,
Michael Strain,
Marc Sorel,
Andrea Melloni
Abstract:
Photonic technologies lack non-invasive monitoring tools to inspect the light inside optical waveguides. This is one of the main barriers to large scale of integration, even though photonic platforms are potentially ready to host several thousands of elements on a single chip. Here, we demonstrate non-invasive light observation in silicon photonics devices by exploiting photon interaction with int…
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Photonic technologies lack non-invasive monitoring tools to inspect the light inside optical waveguides. This is one of the main barriers to large scale of integration, even though photonic platforms are potentially ready to host several thousands of elements on a single chip. Here, we demonstrate non-invasive light observation in silicon photonics devices by exploiting photon interaction with intra-gap energy states localized at the waveguide surface. Light intensity is measured through a ContactLess Integrated Photonic Probe (CLIPP) that introduces no measurable extra-photon absorption and a phase perturbation as low as 0.2 mrad, comparable to thermal fluctuations of less than 3 mK. Multipoint light monitoring is demonstrated with a sensitivity of -30 dBm and a dynamic range of 40 dB. CLIPP technology is simple, inherently CMOS compatible, and scalable to hundreds of probing points per chip. This concept provides a viable way to real-time conditioning and feedback control of densely-integrated photonic systems.
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Submitted 28 October, 2013;
originally announced October 2013.