Breakthrough in HAXPES Performance Combining Full-Field k-Imaging with Time-of-Flight Recording
Authors:
K. Medjanik,
S. V. Babenkov,
S. Chernov,
D. Vasilyev,
H. J. Elmers,
B. Schoenhense,
C. Schlueter,
A. Gloskowskii,
Yu. Matveyev,
W. Drube,
G. Schoenhense
Abstract:
We established a new approach to hard-X-ray photoelectron spectroscopy (HAXPES). The instrumental key feature is an increase of the dimensionality of the recording scheme from 2D to 3D. A high-energy momentum microscope can detect electrons with initial kinetic energies more than 6 keV with high angular resolution < 0.1°. The large k-space acceptance of the special objective lens allows for simult…
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We established a new approach to hard-X-ray photoelectron spectroscopy (HAXPES). The instrumental key feature is an increase of the dimensionality of the recording scheme from 2D to 3D. A high-energy momentum microscope can detect electrons with initial kinetic energies more than 6 keV with high angular resolution < 0.1°. The large k-space acceptance of the special objective lens allows for simultaneous full-field imaging of many Brillouin zones. Combined with time-of-flight parallel energy recording, this method yields maximum parallelization of data acquisition. In a pilot experiment at the new beamline P22 at PETRA III, Hamburg, count rates of more than $10^{6}$ counts per second in the d-band complex of transition metals established an unprecedented HAXPES recording speed. It was found that the concept of tomographic k-space map** previously demonstrated in the soft X-ray regime works equally well in the hard X-ray range. Sharp valence band k-patterns of Re collected at an excitation energy of 6 keV correspond to direct transitions to the 28th repeated Brillouin zone. Given the high X-ray brilliance (1.1x$10^{13}$ hv/s in a spot of less than 20x15 $mu^{2}$), the 3D bulk Brillouin zone can be mapped in a few hours. X-ray photoelectron diffraction (XPD) patterns with < 0.1° resolution are recorded within minutes. Previously unobserved fine details in the diffractograms reflect the large number of scatterers, several $10^{4}$ to $10^{6}$, depending on energy. The short photoelectron wavelength (an order of magnitude smaller than the interatomic distance) amplifies phase differences and makes hard X-ray XPD with high resolution a very sensitive structural tool. The high count rates pave the way towards spin-resolved HAXPES using an imaging spin filter.
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Submitted 26 October, 2018;
originally announced October 2018.
Bulk sensitive photo emission spectroscopy of C1b compounds
Authors:
Gerhard H. Fecher,
Andrei Gloskowskii,
Kristian Kroth,
Joachim Barth,
Benjamin Balke,
Claudia Felser,
Franz Schaefers,
Marcel Mertin,
Wolfgang Eberhardt,
Sven Maehl,
Oliver Schaff
Abstract:
This work reports about bulk-sensitive, high energy photoelectron spectroscopy from the valence band of CoTiSb excited by photons from 1.2 to 5 keV energy. The high energy photoelectron spectra were taken at the KMC-1 high energy beamline of BESSY II employing the recently developed Phoibos 225 HV analyser. The measurements show a good agreement to calculations of the electronic structure using…
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This work reports about bulk-sensitive, high energy photoelectron spectroscopy from the valence band of CoTiSb excited by photons from 1.2 to 5 keV energy. The high energy photoelectron spectra were taken at the KMC-1 high energy beamline of BESSY II employing the recently developed Phoibos 225 HV analyser. The measurements show a good agreement to calculations of the electronic structure using the LDA scheme. It is shown that the high energy spectra reveal the bulk electronic structure better compared to low energy XPS spectra.
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Submitted 6 September, 2006;
originally announced September 2006.
