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Janus graphene nanoribbons with a single ferromagnetic zigzag edge
Authors:
Shaotang Song,
Yu Teng,
Weichen Tang,
Zhen Xu,
Yuanyuan He,
Jiawei Ruan,
Takahiro Kojima,
Wen** Hu,
Franz J Giessibl,
Hiroshi Sakaguchi,
Steven G Louie,
Jiong Lu
Abstract:
Topological design of pi-electrons in zigzag-edged graphene nanoribbons (ZGNRs) leads to a wealth of magnetic quantum phenomena and exotic quantum phases. Symmetric ZGNRs typically exhibit antiferromagnetically coupled spin-ordered edge states. Eliminating cross-edge magnetic coupling in ZGNRs not only enables the realization of a new class of ferromagnetic quantum spin chains, enabling the explor…
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Topological design of pi-electrons in zigzag-edged graphene nanoribbons (ZGNRs) leads to a wealth of magnetic quantum phenomena and exotic quantum phases. Symmetric ZGNRs typically exhibit antiferromagnetically coupled spin-ordered edge states. Eliminating cross-edge magnetic coupling in ZGNRs not only enables the realization of a new class of ferromagnetic quantum spin chains, enabling the exploration of quantum spin physics and entanglement of multiple qubits in the 1D limit, but also establishes a long-sought carbon-based ferromagnetic transport channel, pivotal for ultimate scaling of GNR-based quantum electronics. However, designing such GNRs entails overcoming daunting challenges, including simultaneous breaking of structural and spin symmetries, and designing elegant precursors for asymmetric fabrication of reactive zigzag edges. Here, we report a general approach for designing and fabricating such ferromagnetic GNRs in the form of Janus GNRs with two distinct edge configurations. Guided by Lieb's theorem and topological classification theory, we devised two JGNRs by asymmetrically introduced a topological defect array of benzene motifs to one zigzag edge, while kee** the opposing zigzag edge unchanged. This breaks structural symmetry and creates a sublattice imbalance within each unit cell, initiating a spin symmetry breaking. Three Z-shape precursors are designed to fabricate one parent ZGNR and two JGNRs with an optimal lattice spacing of the defect array for a complete quench of the magnetic edge states at the defective edge. Characterization via scanning probe microscopy/spectroscopy and first-principles density functional theory confirms the successful fabrication of Janus GNRs with ferromagnetic ground state delocalised along the pristine zigzag edge.
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Submitted 8 June, 2024;
originally announced June 2024.
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Tracing Dirac points of topological surface states by ferromagnetic resonance
Authors:
Laura Pietanesi,
Magdalena Marganska,
Thomas Mayer,
Michael Barth,
Lin Chen,
Ji Zou,
Adrian Weindl,
Alexander Liebig,
Rebeca Díaz-Pardo,
Dhavala Suri,
Florian Schmid,
Franz J. Gießibl,
Klaus Richter,
Yaroslav Tserkovnyak,
Matthias Kronseder,
Christian H. Back
Abstract:
Ferromagnetic resonance is used to reveal features of the buried electronic band structure at interfaces between ferromagnetic metals and topological insulators. By monitoring the evolution of magnetic dam**, the application of this method to a hybrid structure consisting of a ferromagnetic layer and a 3D topological insulator reveals a clear fingerprint of the Dirac point and exhibits additiona…
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Ferromagnetic resonance is used to reveal features of the buried electronic band structure at interfaces between ferromagnetic metals and topological insulators. By monitoring the evolution of magnetic dam**, the application of this method to a hybrid structure consisting of a ferromagnetic layer and a 3D topological insulator reveals a clear fingerprint of the Dirac point and exhibits additional features of the interfacial band structure not otherwise observable. The underlying spin-pum** mechanism is discussed in the framework of dissipation of angular momentum by topological surface states (TSSs). Tuning of the Fermi level within the TSS was verified both by varying the stoichiometry of the topological insulator layer and by electrostatic backgating and the dam** values obtained in both cases show a remarkable agreement. The high energy resolution of this method additionally allows us to resolve the energetic shift of the local Dirac points generated by local variations of the electrostatic potential. Calculations based on the chiral tunneling process naturally occurring in TSS agree well with the experimental results.
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Submitted 7 March, 2024; v1 submitted 6 March, 2024;
originally announced March 2024.
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A Next-Generation qPlus-Sensor-Based AFM Setup: Resolving Archaeal S-layer Protein Structures in Air and Liquid
Authors:
Theresa Seeholzer,
Daniela Tarau,
Lea Hollendonner,
Andrea Auer,
Reinhard Rachel,
Dina Grohmann,
Franz J. Giessibl,
Alfred J. Weymouth
Abstract:
Surface-layer (S-layer) proteins form the outermost envelope in many bacteria and most archaea and arrange in 2D quasi-crystalline structures via self-assembly. We investigated S-layer proteins extracted from the archaeon Pyrobaculum aerophilium with a qPlus sensor-based atomic force microscope (AFM) in both liquid and ambient conditions and compared it to transmission electron microscopy (TEM) im…
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Surface-layer (S-layer) proteins form the outermost envelope in many bacteria and most archaea and arrange in 2D quasi-crystalline structures via self-assembly. We investigated S-layer proteins extracted from the archaeon Pyrobaculum aerophilium with a qPlus sensor-based atomic force microscope (AFM) in both liquid and ambient conditions and compared it to transmission electron microscopy (TEM) images under vacuum conditions. For AFM scanning, a next-generation liquid cell and a new protocol for creating long and sharp sapphire tips was introduced. Initial AFM images showed only layers of residual detergent molecules (SDS), which are used to isolate the S-layer proteins from the cells. SDS was not visible in the TEM images, requiring a more thorough sample preparation for AFM measurements. These improvements allowed us to resolve the crystal-like structure of the S-layer samples with frequency-modulation AFM in both air and liquid.
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Submitted 13 July, 2023;
originally announced July 2023.
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Unexpected Gaussian line shapes reveal electron-adsorbate interaction as dominant broadening mechanism in quantum corrals
Authors:
Marco Weiss,
Michael Schelchshorn,
Fabian Stilp,
Alfred J. Weymouth,
Franz J. Giessibl
Abstract:
Understanding the factors influencing the lifetime of electronic states in artificial quantum structures is of great significance for advancing quantum technologies. This study focuses on CO-based quantum corrals on Cu(111). Tunneling spectroscopy measurements reveal a strong correlation between the size of the quantum corral and spectral width, characterized by a predominant Gaussian line shape.…
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Understanding the factors influencing the lifetime of electronic states in artificial quantum structures is of great significance for advancing quantum technologies. This study focuses on CO-based quantum corrals on Cu(111). Tunneling spectroscopy measurements reveal a strong correlation between the size of the quantum corral and spectral width, characterized by a predominant Gaussian line shape. We attribute this dominant Gaussian-shaped lifetime broadening to the interaction of surface state electrons with the corral boundary. To further investigate this phenomenon, we constructed corrals of varying wall densities. Our findings indicate that elastic processes, such as tunneling, are more sensitive to wall density than coupling to the bulk.
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Submitted 15 March, 2024; v1 submitted 13 April, 2023;
originally announced April 2023.
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On the origin and elimination of cross coupling between tunneling current and excitation in scanning probe experiments that utilize the qPlus sensor
Authors:
Michael Schelchshorn,
Fabian Stilp,
Marco Weiss,
Franz J. Giessibl
Abstract:
The qPlus sensor allows simultaneous measurements of scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Its design for use in frequency modulation AFM (FM-AFM) involves separate electrodes, applied on an oscillating quartz cantilever, for the detection of an electronic tunneling current and the deflection signal. Cable resistance and capacities in the electronic setup can induc…
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The qPlus sensor allows simultaneous measurements of scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Its design for use in frequency modulation AFM (FM-AFM) involves separate electrodes, applied on an oscillating quartz cantilever, for the detection of an electronic tunneling current and the deflection signal. Cable resistance and capacities in the electronic setup can induce cross talk phenomena. We report a tunneling current-induced cross coupling observed in a combined STM/AFM setup which uses the qPlus sensor. This cross coupling can induce a positive or negative change of the amplitude excitation signal, thus acting as an apparent dissipation or drive. The experimental data is explained well by tunneling current-induced fluctuations of the electric potential on the sensor electrodes.
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Submitted 29 March, 2023;
originally announced March 2023.
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Designer magnetic topological graphene nanoribbons
Authors:
Shaotang Song,
Pei Wen Ng,
Shayan Edalatmanesh,
Andrés Pinar Solé,
Xinnan Peng,
**dřich Kolorenč,
Zdenka Sosnová,
Oleksander Stetsovych,
Jie Su,
**g Li,
Hongli Sun,
Alexander Liebig,
Chenliang Su,
Jishan Wu,
Franz J. Giessibl,
Pavel Jelinek,
Chunyan Chi,
Jiong Lu
Abstract:
The interplay of magnetism and topology lies at the heart of condensed matter physics, which offers great opportunities to design intrinsic magnetic topological materials hosting a variety of exotic topological quantum states including the quantum anomalous Hall effect (QAHE), axion insulator state, and Majorana bound states. Extending this concept to one-dimension (1D) systems offers additional r…
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The interplay of magnetism and topology lies at the heart of condensed matter physics, which offers great opportunities to design intrinsic magnetic topological materials hosting a variety of exotic topological quantum states including the quantum anomalous Hall effect (QAHE), axion insulator state, and Majorana bound states. Extending this concept to one-dimension (1D) systems offers additional rich quantum spin physics with great promise for molecular-scale spintronics. Despite recent progress in the discovery of symmetry-protected topological quantum phases in 1D graphene nanoribbons (GNRs), the rational design and realization of magnetic topological GNRs (MT-GNRs) represents a grand challenge, as one must tackle multiple dimensions of complexity including time-reversal symmetry (TRS), spatial symmetry (width, edge, end geometry) and many-electron correlations. Here, we devised a new route involving the real- and reciprocal-space descriptions by unifying the chemists and physicists perspectives, for the design of such MT-GNRs with non-trivial electronic topology and robust magnetic terminal. Classic Clar's rule offers a conceptually qualitative real-space picture to predict the transition from closed-shell to open-shell with terminal magnetism, and band gap reopening with possible non-trivial electronic topology in a series of wave-like GNRs, which are further verified by first principle calculations of band-structure topology in a momentum-space. With the advance of on-surface synthesis and careful design of molecular precursors, we have fabricated these MT-GNRs with observation of topological edge bands, whose terminal pi-magnetism can be directly captured using a single-nickelocene spin sensor. Moreover, the transition from strong anti-ferromagnetic to weak coupling (paramagnetism-like) between terminal spins can be controlled by tuning the length of MT-GNRs.
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Submitted 27 April, 2022;
originally announced April 2022.
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Dynamic friction unraveled using an atomically defined model system
Authors:
Norio Okabayashi,
Thomas Frederiksen,
Alexander Liebig,
Franz J. Giessibl
Abstract:
The pervasive phenomenon of friction has been studied at the nanoscale by controlled manipulation of single atoms and molecules, which permitted a precise determination of the static friction force necessary to initiate motion. However, much less is known about the atomistic dynamics during manipulation. Here we reveal the complete manipulation process of a carbon monoxide molecule on a copper sur…
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The pervasive phenomenon of friction has been studied at the nanoscale by controlled manipulation of single atoms and molecules, which permitted a precise determination of the static friction force necessary to initiate motion. However, much less is known about the atomistic dynamics during manipulation. Here we reveal the complete manipulation process of a carbon monoxide molecule on a copper surface at low temperatures using a combination of atomic force microscopy, vibrational spectroscopy for different isotope molecules and density functional theory. We measured the energy dissipation associated with manipulation and relate its origin to hysteresis involving an intermediate state, which enables an atomistic interpretation of dynamic friction. Our results show how friction forces can be controlled and optimized, facilitating new fundamental insights for tribology.
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Submitted 22 December, 2021;
originally announced December 2021.
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Evidence for temporary and local transition of sp2 graphite-type to sp3 diamond-type bonding induced by the tip of an atomic force microscope
Authors:
Thomas Hofmann,
Xinguo Ren,
Alfred J. Weymouth,
Daniel Meuer,
Alexander Liebig,
Andrea Donarini,
Franz J. Giessibl
Abstract:
Artificial diamond is created by exposing graphite to pressures on the order of 10\,GPa and temperatures of about 2000\,K. Here, we provide evidence that the pressure exerted by the tip of an atomic force microscope onto graphene over the carbon buffer layer of silicon carbide can lead to a temporary transition of graphite to diamond on the atomic scale. We perform atomic force microscopy with CO…
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Artificial diamond is created by exposing graphite to pressures on the order of 10\,GPa and temperatures of about 2000\,K. Here, we provide evidence that the pressure exerted by the tip of an atomic force microscope onto graphene over the carbon buffer layer of silicon carbide can lead to a temporary transition of graphite to diamond on the atomic scale. We perform atomic force microscopy with CO terminated tips and copper oxide (CuOx) tips to image graphene and to induce the structural transition. For a local transition, DFT predicts that a repulsive barrier of $\approx13$\,nN, followed by a force reduction by $\approx4$\,nN is overcome when inducing the graphite-diamond transition. Experimental evidence for this transition is provided by the observation of third harmonics in the cantilever oscillation for relative flexible CO terminated tips and a kink in the force versus distance curve for rigid CuOx tips. The experimental observation of the third harmonic with a magnitude of about 200\,fm fits to a force with an amplitude of $\pm 3$\,nN. The large repulsive overall force of $\approx 10$\,nN is only compatible with the experiment if one assumes that the repulsive force acting on the tip when inducing the transition is compensated by an increased van-der-Waals attraction of the tip due to form fitting of tip and sample by local indentation. The transition changes flat sp$^2$ bonds to corrugated sp$^3$ bonds, resulting in a different height of the two basis atoms in the elementary cell of graphene. Both tip types show a strong asysmmetry between the two basis atoms of the lattice when using large repulsive tip forces that induce the transition. Experimental data of tunneling current, frequency shift and dissipation are consistent with the proposed transition. The experiment also shows that atomic force microscopy allows to perform high pressure physics on the atomic scale.
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Submitted 31 July, 2022; v1 submitted 23 March, 2021;
originally announced March 2021.
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Edge Channels of Broken-Symmetry Quantum Hall States in Graphene probed by Atomic Force Microscopy
Authors:
Sungmin Kim,
Johannes Schwenk,
Daniel Walkup,
Yihang Zeng,
Fereshte Ghahari,
Son T. Le,
Marlou R. Slot,
Julian Berwanger,
Steven R. Blankenship,
Kenji Watanabe,
Takashi Taniguchi,
Franz J. Giessibl,
Nikolai B. Zhitenev,
Cory R. Dean,
Joseph A. Stroscio
Abstract:
The quantum Hall (QH) effect, a topologically non-trivial quantum phase, expanded and brought into focus the concept of topological order in physics. The topologically protected quantum Hall edge states are of crucial importance to the QH effect but have been measured with limited success. The QH edge states in graphene take on an even richer role as graphene is distinguished by its four-fold dege…
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The quantum Hall (QH) effect, a topologically non-trivial quantum phase, expanded and brought into focus the concept of topological order in physics. The topologically protected quantum Hall edge states are of crucial importance to the QH effect but have been measured with limited success. The QH edge states in graphene take on an even richer role as graphene is distinguished by its four-fold degenerate zero energy Landau level (zLL), where the symmetry is broken by electron interactions on top of lattice-scale potentials but has eluded spatial measurements. In this report, we map the quantum Hall broken-symmetry edge states comprising the graphene zLL at integer filling factors of $ν=0,\pm 1$ across the quantum Hall edge boundary using atomic force microscopy (AFM). Measurements of the chemical potential resolve the energies of the four-fold degenerate zLL as a function of magnetic field and show the interplay of the moiré superlattice potential of the graphene/boron nitride system and spin/valley symmetry-breaking effects in large magnetic fields.
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Submitted 18 June, 2020;
originally announced June 2020.
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Experimental demonstration of pitfalls and remedies for precise force deconvolution in frequency-modulation atomic force microscopy
Authors:
Ferdinand Huber,
Franz J. Giessibl
Abstract:
Frequency-modulation atomic force microscopy provides an outstanding precision of the measurement of chemical bonding forces. However, as the cantilever oscillates with an amplitude A that is usually on the order of atomic dimensions or even larger, blurring occurs. To extract a force versus distance curve from an experimental frequency versus distance spectrum, a deconvolution algorithm to recove…
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Frequency-modulation atomic force microscopy provides an outstanding precision of the measurement of chemical bonding forces. However, as the cantilever oscillates with an amplitude A that is usually on the order of atomic dimensions or even larger, blurring occurs. To extract a force versus distance curve from an experimental frequency versus distance spectrum, a deconvolution algorithm to recover the force from the experimental frequency shift is required. It has been recently shown that this deconvolution can be an ill-posed inversion problem causing false force-distance curves. Whether an inversion problem is well- or ill-posed is determined by two factors: the shape of the force-distance curve and the oscillation amplitude used for the measurement. A proper choice of the oscillation amplitude as proposed by the in ection point test of Sader et al. [Nat. Nanotechnol. 13, 1088 (2018)] should avoid ill-posedness. Here, we experimentally validate their in ection point test by means of two experimental data sets: force-distance spectra over a single carbon monoxide molecule as well as a Fe trimer on Cu(111) measured with a set of deliberately chosen amplitudes. Furthermore, we comment on typical pitfalls which are caused by the discrete nature of experimental data and provide MATLAB code which can be used by everyone to perform this test with their own data.
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Submitted 30 January, 2020;
originally announced January 2020.
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Characterization of Hydrogen Plasma Defined Graphene Edges
Authors:
Mirko K. Rehmann,
Yemliha B. Kalyoncu,
Marcin Kisiel,
Nikola Pascher,
Franz J. Giessibl,
Fabian Muller,
Kenji Watanabe,
Takashi Taniguchi,
Ernst Meyer,
Ming-Hao Liu,
Dominik M. Zumbuhl
Abstract:
We investigate the quality of hydrogen plasma defined graphene edges by Raman spectroscopy, atomic resolution AFM and low temperature electronic transport measurements. The exposure of graphite samples to a remote hydrogen plasma leads to the formation of hexagonal shaped etch pits, reflecting the anisotropy of the etch. Atomic resolution AFM reveals that the sides of these hexagons are oriented a…
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We investigate the quality of hydrogen plasma defined graphene edges by Raman spectroscopy, atomic resolution AFM and low temperature electronic transport measurements. The exposure of graphite samples to a remote hydrogen plasma leads to the formation of hexagonal shaped etch pits, reflecting the anisotropy of the etch. Atomic resolution AFM reveals that the sides of these hexagons are oriented along the zigzag direction of the graphite crystal lattice and the absence of the D-peak in the Raman spectrum indicates that the edges are high quality zigzag edges. In a second step of the experiment, we investigate hexagon edges created in single layer graphene on hexagonal boron nitride and find a substantial D-peak intensity. Polarization dependent Raman measurements reveal that hydrogen plasma defined edges consist of a mixture of zigzag and armchair segments. Furthermore, electronic transport measurements were performed on hydrogen plasma defined graphene nanoribbons which indicate a high quality of the bulk but a relatively low edge quality, in agreement with the Raman data. These findings are supported by tight-binding transport simulations. Hence, further optimization of the hydrogen plasma etching technique is required to obtain pure crystalline graphene edges.
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Submitted 16 March, 2019;
originally announced March 2019.
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Lateral manipulation with combined atomic force and scanning tunneling microscopy using CO-terminated tips
Authors:
Julian Berwanger,
Ferdinand Huber,
Fabian Stilp,
Franz J. Giessibl
Abstract:
CO-terminated tips currently provide the best spatial resolution obtainable in atomic force microscopy. Due to their chemical inertness, they allow to probe interactions dominated by Pauli repulsion. The small size and inertness of the oxygen front atom yields unprecedented resolution of organic molecules, metal clusters and surfaces. We study the capability of CO-terminated tips to laterally mani…
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CO-terminated tips currently provide the best spatial resolution obtainable in atomic force microscopy. Due to their chemical inertness, they allow to probe interactions dominated by Pauli repulsion. The small size and inertness of the oxygen front atom yields unprecedented resolution of organic molecules, metal clusters and surfaces. We study the capability of CO-terminated tips to laterally manipulate single iron adatoms on the Cu(111) surface with combined atomic force and scanning tunneling microscopy at 7\,K. Furthermore, we find that even a slight asymmetry of the tip results in a distortion of the lateral force field. In addition, the influence of the tilt of the CO tip on the lateral force field is inverted compared to the use of a monoatomic metal tip which we can attribute to the inverted dipole moment of a CO tip with respect to a metal tip. Moreover, we demonstrate atom-by-atom assembly of iron clusters with CO tips while using the high-resolution capability of the CO tips in between to determine the arrangement of the individual iron atoms within the cluster. Additionally, we were able to laterally manipulate single copper and silicon adatoms without changing or losing the CO from the tip's apex.
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Submitted 12 October, 2018; v1 submitted 12 April, 2018;
originally announced April 2018.
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Interatomic force laws that corrupt their own measurement
Authors:
John E. Sader,
Barry D. Hughes,
Ferdinand Huber,
Franz J. Giessibl
Abstract:
Atomically-resolved imaging and force measurements using the atomic force microscope (AFM) are performed most commonly in a frequency-modulation (FM) mode. This has led to spectacular results, including direct observation of the atomic structure of complex molecules and quantification of chemical and frictional forces at the atomic scale. We address here a critical question: Is recovery of force f…
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Atomically-resolved imaging and force measurements using the atomic force microscope (AFM) are performed most commonly in a frequency-modulation (FM) mode. This has led to spectacular results, including direct observation of the atomic structure of complex molecules and quantification of chemical and frictional forces at the atomic scale. We address here a critical question: Is recovery of force from the measured frequency shift experienced by the AFM cantilever ill-posed - that is, unreliable in the presence of (unavoidable) measurement uncertainty? Resolution of this issue underlies all force measurements using FM-AFM, but remains outstanding. It is shown that concavity of the force law's distance dependence controls ill-posed behavior, with a rapid concavity change corrupting force measurements by inducing spurious and unphysical effects - such rapid change is not uncommon. Practical conditions to eliminate ill-posed behavior are formulated which are verified experimentally. This study lays the foundations for robust atomically-resolved force spectroscopy and future work that will seek to regularize ill-posed force measurements.
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Submitted 21 September, 2017;
originally announced September 2017.
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Analysis of STM images with pure and CO-functionalized tips: A first-principles and experimental study
Authors:
Alexander Gustafsson,
Norio Okabayashi,
Angelo Peronio,
Franz J. Giessibl,
Magnus Paulsson
Abstract:
We describe a first principles method to calculate scanning tunneling microscopy (STM) images, and compare the results to well-characterized experiments combining STM with atomic force microscopy (AFM). The theory is based on density functional theory (DFT) with a localized basis set, where the wave functions in the vacuum gap are computed by propagating the localized-basis wave functions into the…
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We describe a first principles method to calculate scanning tunneling microscopy (STM) images, and compare the results to well-characterized experiments combining STM with atomic force microscopy (AFM). The theory is based on density functional theory (DFT) with a localized basis set, where the wave functions in the vacuum gap are computed by propagating the localized-basis wave functions into the gap using a real-space grid. Constant-height STM images are computed using Bardeen's approximation method, including averaging over the reciprocal space. We consider copper adatoms and single CO molecules adsorbed on Cu(111), scanned with a single-atom copper tip with and without CO functionalization. The calculated images agree with state-of-the-art experiments, where the atomic structure of the tip apex is determined by AFM. The comparison further allows for detailed interpretation of the STM images.
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Submitted 13 September, 2018; v1 submitted 22 March, 2017;
originally announced March 2017.
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Attempts to test an alternative electrodynamic theory of superconductors by low-temperature scanning tunneling and atomic force microscopy
Authors:
Angelo Peronio,
Franz J. Giessibl
Abstract:
We perform an experiment to test between two theories of the electrodynamics of superconductors: the standard London theory and an alternative proposed by J. E. Hirsch [Phys. Rev. B 69, 214515 (2004)]. The two alternatives give different predictions with respect to the screening of an electric field by a superconductor, and we try to detect this effect using atomic force microscopy on a niobium sa…
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We perform an experiment to test between two theories of the electrodynamics of superconductors: the standard London theory and an alternative proposed by J. E. Hirsch [Phys. Rev. B 69, 214515 (2004)]. The two alternatives give different predictions with respect to the screening of an electric field by a superconductor, and we try to detect this effect using atomic force microscopy on a niobium sample. We also perform the reverse experiment, where we demonstrate a superconductive tip mounted on a qPlus force sensor. Due to limited accuracy, we are able neither to prove nor to disprove Hirsch's hypothesis. Within our accuracy of 0.17 N/m, the superconductive transition does not alter the atomic-scale interaction between tip and sample.
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Submitted 16 September, 2016; v1 submitted 18 July, 2016;
originally announced July 2016.
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Amplitude dependence of image quality in atomically-resolved bimodal atomic microscopy
Authors:
Hiroaki Ooe,
Dominik Kirpal,
Daniel S. Wastl,
Alfred J. Weymouth,
Toyoko Arai,
Franz J. Giessibl
Abstract:
In bimodal FM-AFM, two flexural modes are excited simultaneously. The total vertical oscillation deflection range of the tip is the sum of the peak-to-peak amplitudes of both flexural modes (sum amplitude). We show atomically resolved images of KBr(100) in ambient conditions in bimodal AFM that display a strong correlation between image quality and sum amplitude. When the sum amplitude becomes lar…
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In bimodal FM-AFM, two flexural modes are excited simultaneously. The total vertical oscillation deflection range of the tip is the sum of the peak-to-peak amplitudes of both flexural modes (sum amplitude). We show atomically resolved images of KBr(100) in ambient conditions in bimodal AFM that display a strong correlation between image quality and sum amplitude. When the sum amplitude becomes larger than about 200 pm, the signal-to-noise ratio (SNR) is drastically decreased. We propose this is caused by the temporary presence of one or more water layers in the tip-sample gap. These water layers screen the short range interaction and must be displaced with each oscillation cycle. Further decreasing the sum amplitude, however, causes a decrease in SNR. Therefore, the highest SNR in ambient conditions is achieved when the sum amplitude is slightly less than the thickness of the primary hydration layer.
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Submitted 21 May, 2016;
originally announced May 2016.
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Influence of atomic tip structure on the intensity of inelastic tunneling spectroscopy data analyzed by combined scanning tunneling spectroscopy, force microscopy and density functional theory
Authors:
Norio Okabayashi,
Alexander Gustafsson,
Angelo Peronio,
Magnus Paulsson,
Toyoko Arai,
Franz J. Giessibl
Abstract:
Achieving a high intensity in inelastic scanning tunneling spectroscopy (IETS) is important for precise measurements. The intensity of the IETS signal can vary up to a factor three for various tips without an apparent reason accessible by scanning tunneling microscopy (STM) alone. Here, we show that combining STM and IETS with atomic force microscopy enables carbon monoxide front atom identificati…
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Achieving a high intensity in inelastic scanning tunneling spectroscopy (IETS) is important for precise measurements. The intensity of the IETS signal can vary up to a factor three for various tips without an apparent reason accessible by scanning tunneling microscopy (STM) alone. Here, we show that combining STM and IETS with atomic force microscopy enables carbon monoxide front atom identification, revealing that high IETS intensities for CO/Cu(111) are obtained for single atom tips, while the intensity drops sharply for multi-atom tips. Adsorbing the CO molecule on a Cu adatom [CO/Cu/Cu(111)] such that it is elevated over the substrate strongly diminishes the tip dependence of IETS intensity, showing that an elevated position channels most of the tunneling current through the CO molecule even for multi-atom tips, while a large fraction of the tunneling current bypasses the CO molecule in the case of CO/Cu(111).
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Submitted 8 March, 2016; v1 submitted 19 April, 2015;
originally announced April 2015.
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Response of the topological surface state to surface disorder in TlBiSe$_2$
Authors:
Florian Pielmeier,
Gabriel Landolt,
Bartosz Slomski,
Stefan Muff,
Julian Berwanger,
Andreas Eich,
Alexander A. Khajetoorians,
Jens Wiebe,
Ziya S. Aliev,
Mahammad B. Babanly,
Roland Wiesendanger,
Jürg Osterwalder,
Evgeniy V. Chulkov,
Franz J. Giessibl,
J. Hugo Dil
Abstract:
Through a combination of experimental techniques we show that the topmost layer of the topo- logical insulator TlBiSe$_2$ as prepared by cleavage is formed by irregularly shaped Tl islands at cryogenic temperatures and by mobile Tl atoms at room temperature. No trivial surface states are observed in photoemission at low temperatures, which suggests that these islands can not be re- garded as a cle…
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Through a combination of experimental techniques we show that the topmost layer of the topo- logical insulator TlBiSe$_2$ as prepared by cleavage is formed by irregularly shaped Tl islands at cryogenic temperatures and by mobile Tl atoms at room temperature. No trivial surface states are observed in photoemission at low temperatures, which suggests that these islands can not be re- garded as a clear surface termination. The topological surface state is, however, clearly resolved in photoemission experiments. This is interpreted as a direct evidence of its topological self-protection and shows the robust nature of the Dirac cone like surface state. Our results can also help explain the apparent mass acquisition in S-doped TlBiSe$_2$.
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Submitted 4 February, 2015;
originally announced February 2015.
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CO Tip Functionalization Inverts Atomic Force Microscopy Contrast via Short-Range Electrostatic Forces
Authors:
Maximilian Schneiderbauer,
Matthias Emmrich,
Alfred J. Weymouth,
Franz J. Giessibl
Abstract:
We investigated insulating Cu$_2$N islands grown on Cu(100) by means of combined scanning tunneling microscopy and atomic force microscopy with two vastly different tips: a bare metal tip and a CO-terminated tip. We use scanning tunneling microscopy data as proposed by Choi et al. [T. Choi et al., PRB 78, 035430 (2008).] to unambiguously identify atomic positions. Atomic force microscopy images ta…
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We investigated insulating Cu$_2$N islands grown on Cu(100) by means of combined scanning tunneling microscopy and atomic force microscopy with two vastly different tips: a bare metal tip and a CO-terminated tip. We use scanning tunneling microscopy data as proposed by Choi et al. [T. Choi et al., PRB 78, 035430 (2008).] to unambiguously identify atomic positions. Atomic force microscopy images taken with the two different tips show an inverted contrast over Cu$_2$N. The observed force contrast can be explained with an electrostatic model, where the two tips have dipole moments of opposite directions. This highlights the importance of short-range electrostatic forces in the formation of atomic contrast on polar surfaces in non-contact atomic force microscopy.
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Submitted 21 February, 2014;
originally announced February 2014.
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Chemical and Crystallographic Characterization of the Tip Apex in Scanning Probe Microscopy
Authors:
Thomas Hofmann,
Florian Pielmeier,
Franz J. Giessibl
Abstract:
The apex atom of a W scanning probe tip reveals a non-spherical charge distribution as probed by a CO molecule bonded to a Cu(111) surface [Welker et al. Science, 336, 444 (2012)]. Three high-symmetry images were observed and related to three low-index crystallographic directions of the W bcc crystal. Open questions remained, however, including the verification that the tip was indeed W-terminated…
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The apex atom of a W scanning probe tip reveals a non-spherical charge distribution as probed by a CO molecule bonded to a Cu(111) surface [Welker et al. Science, 336, 444 (2012)]. Three high-symmetry images were observed and related to three low-index crystallographic directions of the W bcc crystal. Open questions remained, however, including the verification that the tip was indeed W-terminated, and whether this method can be easily applied to distinguish other atomic species. In this work, we investigate bulk Cu and Fe tips. In both cases we can associate our data with the fcc (Cu) and bcc (Fe) crystal structures. A model is presented, based on the partial filling of d orbitals, to relate the AFM images to the angular orientation of the tip structure.
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Submitted 12 February, 2014; v1 submitted 24 October, 2013;
originally announced October 2013.
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Spin Resolution and Evidence for Superexchange on NiO(001) observed by Force Microscopy
Authors:
Florian Pielmeier,
Franz J. Giessibl
Abstract:
The spin order of the nickel oxide (001) surface is resolved, employing non-contact atomic force microscopy at 4.4 K using bulk Fe- and SmCo-tips mounted on a qPlus sensor that oscillates at sub-50 pm amplitudes. The spin-dependent signal is hardly detectable with Fe-tips. In contrast, SmCo-tips yield a height contrast of 1.35 pm for Ni ions with opposite spins. SmCo tips even show a small height…
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The spin order of the nickel oxide (001) surface is resolved, employing non-contact atomic force microscopy at 4.4 K using bulk Fe- and SmCo-tips mounted on a qPlus sensor that oscillates at sub-50 pm amplitudes. The spin-dependent signal is hardly detectable with Fe-tips. In contrast, SmCo-tips yield a height contrast of 1.35 pm for Ni ions with opposite spins. SmCo tips even show a small height contrast on the O atoms of 0.5 pm within the 2x1 spin unit cell, pointing to the observation of superexchange. We attribute this to the increased magnetocrystalline anisotropy energy of SmCo, which stabilizes the magnetic moment at the apex. Atomic force spectroscopy on the Ni up, Ni down and O lattice site reveals a magnitude of the exchange energy of merely 1 meV at the closest accessible distance with an exponential decay length of λ_exc = 18 pm.
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Submitted 27 June, 2013; v1 submitted 24 April, 2013;
originally announced April 2013.
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Optimizing atomic resolution of force microscopy in ambient conditions
Authors:
Daniel S. Wastl,
Alfred J. Weymouth,
Franz J. Giessibl
Abstract:
Ambient operation poses a challenge to AFM because in contrast to operation in vacuum or liquid environments, the cantilever dynamics change dramatically from oscillating in air to oscillating in a hydration layer when probing the sample. We demonstrate atomic resolution by imaging of the KBr(001) surface in ambient conditions by frequency-modulation atomic force microscopy with a cantilever based…
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Ambient operation poses a challenge to AFM because in contrast to operation in vacuum or liquid environments, the cantilever dynamics change dramatically from oscillating in air to oscillating in a hydration layer when probing the sample. We demonstrate atomic resolution by imaging of the KBr(001) surface in ambient conditions by frequency-modulation atomic force microscopy with a cantilever based on a quartz tuning fork (qPlus sensor) and analyze both long- and short-range contributions to the dam**. The thickness of the hydration layer increases with relative humidity, thus varying humidity enables us to study the in uence of the hydration layer thickness on cantilever dam**. Starting with measurements of dam** versus amplitude, we analyzed the signal and the noise characteristics at the atomic scale. We then determined the optimal amplitude which enabled us to acquire high-quality atomically resolved images.
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Submitted 28 May, 2013; v1 submitted 21 March, 2013;
originally announced March 2013.
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How local is the Phantom Force?
Authors:
Thorsten Wutscher,
Alfred J. Weymouth,
Franz J. Giessibl
Abstract:
The phantom force is an apparently repulsive force, which can dominate the atomic contrast of an AFM image when a tunneling current is present. We described this effect with a simple resistive model, in which the tunneling current causes a voltage drop at the sample area underneath the probe tip. Because tunneling is a highly local process, the areal current density is quite high, which leads to a…
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The phantom force is an apparently repulsive force, which can dominate the atomic contrast of an AFM image when a tunneling current is present. We described this effect with a simple resistive model, in which the tunneling current causes a voltage drop at the sample area underneath the probe tip. Because tunneling is a highly local process, the areal current density is quite high, which leads to an appreciable local voltage drop that in turn changes the electrostatic attraction between tip and sample. However, Si(111)-7\times7 has a metallic surface-state and it might be proposed that electrons should instead propagate along the surface-state, as through a thin metal film on a semiconducting surface, before propagating into the bulk. In this article, we investigate the role of the metallic surface-state on the phantom force. First, we show that the phantom force can be observed on H/Si(100), a surface without a metallic surface-state. Furthermore, we investigate the influence of the surface-state on our phantom force observations of Si(111)-7\times7 by analyzing the influence of the macroscopic tip radius R on the strength of the phantom force, where a noticeable effect would be expected if the local voltage drop would reach extensions comparable to the tip radius. We conclude that a metallic surface-state does not suppress the phantom force, but that the local resistance Rs has a strong effect on the magnitude of the phantom force.
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Submitted 10 March, 2012;
originally announced March 2012.
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Application of the equipartition theorem to the thermal excitation of quartz tuning forks
Authors:
Joachim Welker,
Frederico de Faria Elsner,
Franz J. Giessibl
Abstract:
The deflection signal of a thermally excited force sensor of an atomic force microscope can be analyzed to gain important information about the detector noise and about the validity of the equipartion theorem of thermodynamics. Here, we measured the temperature dependence of the thermal amplitude of a tuning fork and compared it to the expected values based on the equipartition theorem. In doing s…
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The deflection signal of a thermally excited force sensor of an atomic force microscope can be analyzed to gain important information about the detector noise and about the validity of the equipartion theorem of thermodynamics. Here, we measured the temperature dependence of the thermal amplitude of a tuning fork and compared it to the expected values based on the equipartition theorem. In doing so, we prove the validity of these assumptions in the temperature range from 140K to 300K. Furthermore, the application of the equipartition theorem to quartz tuning forks at liquid helium temperatures is discussed.
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Submitted 25 August, 2011; v1 submitted 15 June, 2011;
originally announced June 2011.
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A comparsion of force sensors for atomic force microscopy based on quartz tuning forks and length extensional resonators
Authors:
Franz J. Giessibl,
Florian Pielmeier,
Toyoaki Eguchi,
Toshu An,
Yukio Hasegawa
Abstract:
The force sensor is key to the performance of atomic force microscopy (AFM). Nowadays, most AFMs use micro-machined force sensors made from silicon, but piezoelectric quartz sensors are applied at an increasing rate, mainly in vacuum. These self sensing force sensors allow a relatively easy upgrade of a scanning tunneling microscope to a combined scanning tunneling/atomic force microscope. Two fun…
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The force sensor is key to the performance of atomic force microscopy (AFM). Nowadays, most AFMs use micro-machined force sensors made from silicon, but piezoelectric quartz sensors are applied at an increasing rate, mainly in vacuum. These self sensing force sensors allow a relatively easy upgrade of a scanning tunneling microscope to a combined scanning tunneling/atomic force microscope. Two fundamentally different types of quartz sensors have achieved atomic resolution: the 'needle sensor' that is based on a length extensional resonator and the 'qPlus sensor' that is based on a tuning fork. Here, we calculate and measure the noise characteristics of these sensors. We find four noise sources: deflection detector noise, thermal noise, oscillator noise and thermal drift noise. We calculate the effect of these noise sources as a factor of sensor stiffness, bandwidth and oscillation amplitude. We find that for self sensing quartz sensors, the deflection detector noise is independent of sensor stiffness, while the remaining three noise sources increase strongly with sensor stiffness. Deflection detector noise increases with bandwidth to the power of 1.5, while thermal noise and oscillator noise are proportional to the square root of the bandwidth. Thermal drift noise, however, is inversely proportional to bandwidth. The first three noise sources are inversely proportional to amplitude while thermal drift noise is independent of the amplitude. Thus, we show that the earlier finding that quoted optimal signal-to-noise ratio for oscillation amplitudes similar to the range of the forces is still correct when considering all four frequency noise contributions. Finally, we suggest how the signal-to-noise ratio of the sensors can be further improved and briefly discuss the challenges of mounting tips.
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Submitted 26 July, 2011; v1 submitted 15 April, 2011;
originally announced April 2011.
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qPlus Magnetic Force Microscopy in Frequency-Modulation Mode with milli-Hertz Resolution
Authors:
M. Schneiderbauer,
F. J. Giessibl
Abstract:
Magnetic force microscopy (MFM) allows one to image the domain structure of ferromagnetic samples by probing the dipole forces between a magnetic probe tip and a magnetic sample. The magnetic domain structure of the sample depends on the atomic arrangement of individual electron spins. It is desirable to be able to image both individual atoms and domain structures with a single probe. However, the…
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Magnetic force microscopy (MFM) allows one to image the domain structure of ferromagnetic samples by probing the dipole forces between a magnetic probe tip and a magnetic sample. The magnetic domain structure of the sample depends on the atomic arrangement of individual electron spins. It is desirable to be able to image both individual atoms and domain structures with a single probe. However, the force gradients of the interactions responsible for atomic contrast and those causing domain contrast are orders of magnitude apart - ranging from up to 100N/m for atomic interactions down to 0.0001N/m for magnetic dipole interactions. Here, we show that this gap can be bridged with a qPlus sensor, with a stiffness of 1800N/m (optimized for atomic interaction), that is sensitive enough to measure milli-Hertz frequency contrast caused by magnetic dipole-dipole interactions. Thus we have succeeded to establish a sensing technique that performs Scanning Tunneling Microscopy, Atomic Force Microscopy and MFM with a single probe.
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Submitted 4 April, 2011;
originally announced April 2011.
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A phantom force induced by the tunneling current, characterized on Si(111)
Authors:
A. J. Weymouth,
T. Wutscher,
J. Welker,
T. Hofmann,
F. J. Giessibl
Abstract:
Simultaneous measurements of tunneling currents and atomic forces on surfaces and adsorbates provide new insights into the electronic and structural properties of matter on the atomic scale. We report on experimental observations and calculations of a strong impact the tunneling current can have on the measured force, which arises when the resistivity of the sample cannot be neglected. We present…
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Simultaneous measurements of tunneling currents and atomic forces on surfaces and adsorbates provide new insights into the electronic and structural properties of matter on the atomic scale. We report on experimental observations and calculations of a strong impact the tunneling current can have on the measured force, which arises when the resistivity of the sample cannot be neglected. We present a study on Si(111)-7\times7 with various do** levels, but this effect is expected to occur on other low-conductance samples like adsorbed molecules, and is likely to strongly affect Kelvin probe measurements on the atomic scale.
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Submitted 11 March, 2011;
originally announced March 2011.
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Preparation of light-atom tips for Scanning Probe Microscopy by explosive delamination
Authors:
Thomas Hofmann,
Joachim Welker,
Franz J. Giessibl
Abstract:
To obtain maximal resolution in STM and AFM, the size of the protruding tip orbital has to be minimized. Beryllium as tip material is a promising candidate for enhanced resolution because a beryllium atom has just four electrons, leading to a small covalent radius of only 96 pm. Besides that, beryllium is conductive and has a high elastic modulus, which is a necessity for a stable tip apex. Howe…
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To obtain maximal resolution in STM and AFM, the size of the protruding tip orbital has to be minimized. Beryllium as tip material is a promising candidate for enhanced resolution because a beryllium atom has just four electrons, leading to a small covalent radius of only 96 pm. Besides that, beryllium is conductive and has a high elastic modulus, which is a necessity for a stable tip apex. However beryllium tips that are prepared ex situ, are covered with a robust oxide layer, which cannot be removed by just heating the tip. Here we present a successful preparation method that combines the heating of the tip by field emission and a mild collision with a clean metal plate. That method yields a clean, oxide-free tip surface as proven by a work function of as deduced from a current-distance curve. Additionally, a STM image of the Si-(111)-(7x7) is presented to prove the single-atom termination of the beryllium tip.
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Submitted 8 January, 2010;
originally announced January 2010.
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Searching atomic spin contrast on nickel oxide (001) by force microscopy
Authors:
M. Schmid,
F. J. Giessibl,
J. Mannhart
Abstract:
The (001) surface of NiO, an antiferromagnet at room temperature, was investigated under ultra-high vacuum conditions with frequency modulation atomic force microscopy (FM-AFM). The antiferromagnetic coupling between ions leads to a spin superstructure on (001) surfaces. Exchange interaction between the probe of a force microscope and the NiO (001) surface should allow to image spin superstructu…
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The (001) surface of NiO, an antiferromagnet at room temperature, was investigated under ultra-high vacuum conditions with frequency modulation atomic force microscopy (FM-AFM). The antiferromagnetic coupling between ions leads to a spin superstructure on (001) surfaces. Exchange interaction between the probe of a force microscope and the NiO (001) surface should allow to image spin superstructures in real space. The surface was imaged with three different probing tips: nonmagnetic W tips, ferromagnetic Co tips and antiferromagnetic NiO tips - and atomic resolution was achieved with all three of them in various distance regimes and in several channels. Evidence for spin contrast was obtained in experiments that utilize NiO tips and oscillation amplitudes in the Å-regime, where optimal signal-to-noise ratio is expected. The spin contrast is weaker than expected and only visible in Fourier space images.
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Submitted 30 May, 2006; v1 submitted 21 March, 2006;
originally announced March 2006.
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Device for in-situ cleaving of hard crystals
Authors:
M. Schmid,
A. Renner,
F. J. Giessibl
Abstract:
Cleaving crystals in a vacuum chamber is a simple method for obtaining atomically flat and clean surfaces for materials that have a preferential cleaving plane. Most in-situ cleavers use parallel cutting edges that are applied from two sides on the sample. We found in ambient experiments that diagonal cutting pliers, where the cleavage force is introduced in a single point instead of a line work…
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Cleaving crystals in a vacuum chamber is a simple method for obtaining atomically flat and clean surfaces for materials that have a preferential cleaving plane. Most in-situ cleavers use parallel cutting edges that are applied from two sides on the sample. We found in ambient experiments that diagonal cutting pliers, where the cleavage force is introduced in a single point instead of a line work very well also for hard materials. Here, we incorporate the diagonal cutting plier principle in a design compatible with ultra-high vacuum requirements. We show optical microscopy (mm scale) and atomic force microscopy (atomic scale) images of NiO(001) surfaces cleaved with this device.
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Submitted 14 November, 2005;
originally announced November 2005.
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Electron scattering in atomic force microscopy experiments
Authors:
Linda Zotti,
Werner A. Hofer,
Franz J. Giessibl
Abstract:
It has been shown that electron transitions, as measured in a scanning tunnelling microscope (STM), are related to chemical interactions in a tunnelling barrier. Here, we show that the shape and apparent height of subatomic features in an atomic force microscopy (AFM) experiment on Si(111) depend directly on the available electron states of the silicon surface and the silicon AFM tip. Simulation…
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It has been shown that electron transitions, as measured in a scanning tunnelling microscope (STM), are related to chemical interactions in a tunnelling barrier. Here, we show that the shape and apparent height of subatomic features in an atomic force microscopy (AFM) experiment on Si(111) depend directly on the available electron states of the silicon surface and the silicon AFM tip. Simulations and experiments confirm that forces and currents show similar subatomic variations for tip-sample distances approaching the bulk bonding length.
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Submitted 13 October, 2005;
originally announced October 2005.
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AFM's path to atomic resolution
Authors:
Franz J. Giessibl
Abstract:
We review the progress in the spatial resolution of atomic force microscopy (AFM) in vacuum. After an introduction of the basic principle and a conceptual comparison to scanning tunneling microscopy, the main challenges of AFM and the solutions that have evolved in the first twenty years of its existence are outlined. Some crucial steps along the AFM's path towards higher resolution are discusse…
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We review the progress in the spatial resolution of atomic force microscopy (AFM) in vacuum. After an introduction of the basic principle and a conceptual comparison to scanning tunneling microscopy, the main challenges of AFM and the solutions that have evolved in the first twenty years of its existence are outlined. Some crucial steps along the AFM's path towards higher resolution are discussed, followed by an outlook on current and future applications.
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Submitted 29 March, 2005;
originally announced March 2005.
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Simultaneous current-, force- and work function measurement with atomic resolution
Authors:
M. Herz,
Ch. Schiller,
F. J. Giessibl,
J. Mannhart
Abstract:
The local work function of a surface determines the spatial decay of the charge density at the Fermi level normal to the surface. Here, we present a method that enables simultaneous measurements of local work function and tip-sample forces. A combined dynamic scanning tunneling microscope and atomic force microscope is used to measure the tunneling current between an oscillating tip and the samp…
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The local work function of a surface determines the spatial decay of the charge density at the Fermi level normal to the surface. Here, we present a method that enables simultaneous measurements of local work function and tip-sample forces. A combined dynamic scanning tunneling microscope and atomic force microscope is used to measure the tunneling current between an oscillating tip and the sample in real time as a function of the cantilever's deflection. Atomically resolved work function measurements on a silicon (111)-($7\times 7$) surface are presented and related to concurrently recorded tunneling current- and force- measurements.
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Submitted 19 January, 2005;
originally announced January 2005.
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Local spectroscopy and atomic imaging of tunneling current, forces and dissipation on graphite
Authors:
S. Hembacher,
F. J. Giessibl,
J. Mannhart,
C. F. Quate
Abstract:
Theory predicts that the currents in scanning tunneling microscopy (STM) and the attractive forces measured in atomic force microscopy (AFM) are directly related. Atomic images obtained in an attractive AFM mode should therefore be redundant because they should be \emph{similar} to STM. Here, we show that while the distance dependence of current and force is similar for graphite, constant-height…
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Theory predicts that the currents in scanning tunneling microscopy (STM) and the attractive forces measured in atomic force microscopy (AFM) are directly related. Atomic images obtained in an attractive AFM mode should therefore be redundant because they should be \emph{similar} to STM. Here, we show that while the distance dependence of current and force is similar for graphite, constant-height AFM- and STM images differ substantially depending on distance and bias voltage. We perform spectroscopy of the tunneling current, the frequency shift and the dam** signal at high-symmetry lattice sites of the graphite (0001) surface. The dissipation signal is about twice as sensitive to distance as the frequency shift, explained by the Prandtl-Tomlinson model of atomic friction.
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Submitted 4 January, 2005;
originally announced January 2005.
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Investigating Atomic Details of the CaF$_2$(111) Surface with a qPlus Sensor
Authors:
Franz J. Giessibl,
Michael Reichling
Abstract:
The (111) surface of CaF$_2$ has been intensively studied with large-amplitude frequency-modulation atomic force microscopy and atomic contrast formation is now well understood. It has been shown that the apparent contrast patterns obtained with a polar tip strongly depend on the tip terminating ion and three sub-lattices of anions and cations can be imaged. Here, we study the details of atomic…
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The (111) surface of CaF$_2$ has been intensively studied with large-amplitude frequency-modulation atomic force microscopy and atomic contrast formation is now well understood. It has been shown that the apparent contrast patterns obtained with a polar tip strongly depend on the tip terminating ion and three sub-lattices of anions and cations can be imaged. Here, we study the details of atomic contrast formation on CaF$_2$(111) with small-amplitude force microscopy utilizing the qPlus sensor that has been shown to provide utmost resolution at high scanning stability. Step edges resulting from cleaving crystals in-situ in the ultra-high vacuum appear as very sharp structures and on flat terraces, the atomic corrugation is seen in high clarity even for large area scans. The atomic structure is also not lost when scanning across triple layer step edges. High resolution scans of small surface areas yield contrast features of anion- and cation sub-lattices with unprecedented resolution. These contrast patterns are related to previously reported theoretical results.
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Submitted 16 December, 2004;
originally announced December 2004.
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Advances in atomic force microscopy
Authors:
Franz J. Giessibl
Abstract:
This article reviews the progress of atomic force microscopy (AFM) in ultra-high vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows to image surfaces of conductors \emph{and} insulators in vacuum with atomic resolution. The mostly used technique for atomic resolution AFM in vacuum is frequency modulation AFM (FM-AFM). This tec…
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This article reviews the progress of atomic force microscopy (AFM) in ultra-high vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows to image surfaces of conductors \emph{and} insulators in vacuum with atomic resolution. The mostly used technique for atomic resolution AFM in vacuum is frequency modulation AFM (FM-AFM). This technique, as well as other dynamic AFM methods, are explained in detail in this article. In the last few years many groups have expanded the empirical knowledge and deepened the theoretical understanding of FM-AFM. Consequently, the spatial resolution and ease of use have been increased dramatically. Vacuum AFM opens up new classes of experiments, ranging from imaging of insulators with true atomic resolution to the measurement of forces between individual atoms.
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Submitted 6 May, 2003;
originally announced May 2003.
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Probing the shape of atoms in real space
Authors:
M. Herz,
F. J. Giessibl,
J. Mannhart
Abstract:
The structure of single atoms in real space is investigated by scanning tunneling microscopy. Very high resolution is possible by a dramatic reduction of the tip-sample distance. The instabilities which are normally encountered when using small tip-sample distances are avoided by oscillating the tip of the scanning tunneling microscope vertically with respect to the sample. The surface atoms of…
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The structure of single atoms in real space is investigated by scanning tunneling microscopy. Very high resolution is possible by a dramatic reduction of the tip-sample distance. The instabilities which are normally encountered when using small tip-sample distances are avoided by oscillating the tip of the scanning tunneling microscope vertically with respect to the sample. The surface atoms of Si(111)-(7 x 7) with their well-known electronic configuration are used to image individual samarium, cobalt, iron and silicon atoms. The resulting images resemble the charge density corresponding to 4f, 3d and 3p atomic orbitals.
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Submitted 6 May, 2003;
originally announced May 2003.
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Imaging of atomic orbitals with the Atomic Force Microscope - experiments and simulations
Authors:
F. J. Giessibl,
H. Bielefeldt,
S. Hembacher,
J. Mannhart
Abstract:
Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable symmetries of the images of single atoms are observed. These symmetries are related to the nature of the interatomic forces. The Si(111)-(7x7) surface is studied…
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Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable symmetries of the images of single atoms are observed. These symmetries are related to the nature of the interatomic forces. The Si(111)-(7x7) surface is studied by AFM with various tips and AFM images are simulated with chemical and electrostatic model forces. The calculation of images from the tip-sample forces is explained in detail and the implications of the imaging parameters are discussed. Because the structure of the Si(111)-(7x7) surface is known very well, the shape of the adatom images is used to determine the tip structure. The observability of atomic orbitals by AFM and scanning tunneling microscopy is discussed.
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Submitted 10 July, 2001;
originally announced July 2001.
