Flexible focal plane arrays for UVOIR wide field instrumentation
Authors:
Emmanuel Hugot,
Wilfried Jahn,
Bertrand Chambion,
Gaid Moulin,
Liubov Nikitushkina,
Christophe Gaschet,
David Henry,
Stéphane Getin,
Marc Ferrari,
Yann Gaeremynck
Abstract:
LAM and CEA-LETI are develo** the technology of deformable detectors, for UV, VIS or NIR applications. Such breakthrough devices will be a revolution for future wide field imagers and spectrographs, firstly by improving the image quality with better off-axis sharpness, resolution, brightness while scaling down the optical system, secondly by overcoming the manufacturing issues identified so far…
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LAM and CEA-LETI are develo** the technology of deformable detectors, for UV, VIS or NIR applications. Such breakthrough devices will be a revolution for future wide field imagers and spectrographs, firstly by improving the image quality with better off-axis sharpness, resolution, brightness while scaling down the optical system, secondly by overcoming the manufacturing issues identified so far and by offering a flexibility and versatility in optical design. The technology of curved detectors can benefit of the developments of active and deformable structures, to provide a flexibility and a fine tuning of the detectors curvature by thinning down the substrate without modifying the fabrication process of the active pixels. We present studies done so far on optical design improvements, the technological demonstrators we developed and their performances as well as the future five-years roadmap for these developments.
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Submitted 21 July, 2016;
originally announced July 2016.
