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Speckle correlation as a monitor of X-ray free electron laser induced crystal lattice deformation
Authors:
Rajan Plumley,
Yanwen Sun,
Samuel W Teitelbaum,
Sanghoon Song,
Takahiro Sato,
Matthieu Chollet,
Nan Wang,
Aymeric Robert,
Paul H Fuoss,
Mark Sutton,
Diling Zhu
Abstract:
X-ray free electron lasers (X-FELs) present new opportunities to study ultrafast lattice dynamics in complex materials. While the unprecedented source brilliance enables high fidelity measurement of structural dynamics, it also raises experimental challenges related to the understanding and control of beam-induced irreversible structural changes in samples that can ultimately impact the interpreta…
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X-ray free electron lasers (X-FELs) present new opportunities to study ultrafast lattice dynamics in complex materials. While the unprecedented source brilliance enables high fidelity measurement of structural dynamics, it also raises experimental challenges related to the understanding and control of beam-induced irreversible structural changes in samples that can ultimately impact the interpretation of experimental results. This is also important for designing reliable high performance X-ray optical components. In this work, we investigate X-FEL beam-induced lattice alterations by measuring the shot-to-shot evolution of near-Bragg coherent scattering from a single crystalline germanium sample. We show that X-ray photon correlation analysis of sequential speckle patterns measurements can be used to monitor the nature and extent of lattice rearrangements. Abrupt, irreversible changes are observed following intermittent high-fluence monochromatic X-ray pulses, thus revealing the existence of a threshold response to X-FEL pulse intensity.
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Submitted 17 December, 2019; v1 submitted 13 December, 2019;
originally announced December 2019.
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Persistence of Island Arrangements During Layer-by-Layer Growth Revealed Using Coherent X-rays
Authors:
Guangxu Ju,
Dongwei Xu,
Matthew J. Highland,
Carol Thompson,
Hua Zhou,
Jeffrey A. Eastman,
Paul H. Fuoss,
Peter Zapol,
Hyunjung Kim,
G. Brian Stephenson
Abstract:
Understanding surface dynamics during epitaxial film growth is key to growing high quality materials with controllable properties. X-ray photon correlation spectroscopy (XPCS) using coherent x-rays opens new opportunities for in situ observation of atomic-scale fluctuation dynamics during crystal growth. Here, we present the first XPCS measurements of 2D island dynamics during homoepitaxial growth…
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Understanding surface dynamics during epitaxial film growth is key to growing high quality materials with controllable properties. X-ray photon correlation spectroscopy (XPCS) using coherent x-rays opens new opportunities for in situ observation of atomic-scale fluctuation dynamics during crystal growth. Here, we present the first XPCS measurements of 2D island dynamics during homoepitaxial growth in the layer-by-layer mode. Analysis of the results using two-time correlations reveals a new phenomenon - a memory effect in island nucleation sites on successive crystal layers. Simulations indicate that this persistence in the island arrangements arises from communication between islands on different layers via adatoms. With the worldwide advent of new coherent x-ray sources, the XPCS methods pioneered here will be widely applicable to atomic-scale processes on surfaces.
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Submitted 22 April, 2018;
originally announced April 2018.
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Characterization of the X-ray Coherence Properties of an Undulator Beamline at the Advanced Photon Source
Authors:
Guangxu Ju,
Matthew J. Highland,
Carol Thompson,
Jeffrey A. Eastman,
Paul H. Fuoss,
Hua Zhou,
Roger Dejus,
G. Brian Stephenson
Abstract:
In anticipation of the increased use of coherent x-ray methods and the need to upgrade beamlines to match improved source quality, we have characterized the coherence properties of the x-rays delivered by beamline 12ID-D at the Advanced Photon Source. We compare the measured x-ray divergence, beam size, brightness, and coherent flux at energies up to 26 keV to the calculated values from the undula…
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In anticipation of the increased use of coherent x-ray methods and the need to upgrade beamlines to match improved source quality, we have characterized the coherence properties of the x-rays delivered by beamline 12ID-D at the Advanced Photon Source. We compare the measured x-ray divergence, beam size, brightness, and coherent flux at energies up to 26 keV to the calculated values from the undulator source, and evaluate the effects of beamline optics such as a mirror, monochromator, and compound refractive lenses. Diffraction patterns from slits as a function of slit width are analyzed using wave propagation theory to obtain the beam divergence and thus coherence length. Imaging of the source using a compound refractive lens was found to be the most accurate method for determining the vertical divergence. While the brightness and coherent flux obtained without a monochromator ("pink beam") agree well with those calculated for the source, those measured with the monochromator were a factor of 3 to 6 lower than the source, primarily because of vertical divergence introduced by the monochromator. The methods we describe should be widely applicable for measuring the x-ray coherence properties of synchrotron beamlines.
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Submitted 15 February, 2018;
originally announced February 2018.
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Real-time X-ray Monitoring of the Nucleation and Growth of AlN Epitaxial Films on Sapphire (0001)
Authors:
Guangxu Ju,
Matthew J. Highland,
Jeffrey A. Eastman,
Rebecca Sichel-Tissot,
Peter M. Baldo,
Peter Zapol,
Paul H. Fuoss
Abstract:
We report the results of x-ray scattering studies of AlN on c-plane sapphire during reactive radiofrequency magnetron sputtering. The sensitivity of in situ x-ray measurements allowed us to follow the structural evolution of strain and roughness from initial nucleation layers to fullyrelaxed AlN films. A growth rate transient was observed, consistent with the initial formation of non-coalesced isl…
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We report the results of x-ray scattering studies of AlN on c-plane sapphire during reactive radiofrequency magnetron sputtering. The sensitivity of in situ x-ray measurements allowed us to follow the structural evolution of strain and roughness from initial nucleation layers to fullyrelaxed AlN films. A growth rate transient was observed, consistent with the initial formation of non-coalesced islands with significant oxygen incorporation from the substrate. Following island coalescence, a steady state growth rate was seen with a continuous shift of the c and a lattice parameters towards the relaxed bulk values as growth progressed, with films reaching a fully relaxed state at thicknesses of about 30 nm.
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Submitted 6 September, 2017;
originally announced September 2017.
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Island dynamics and anisotropy during vapor phase epitaxy of m-plane GaN
Authors:
Edith Perret,
Dongwei Xu,
M. J. Highland,
G. B. Stephenson,
P. Zapol,
P. H. Fuoss,
A. Munkholm,
Carol Thompson
Abstract:
Using in situ grazing-incidence x-ray scattering, we have measured the diffuse scattering from islands that form during layer-by-layer growth of GaN by metal-organic vapor phase epitaxy on the (1010) m-plane surface. The diffuse scattering is extended in the (0001) in-plane direction in reciprocal space, indicating a strong anisotropy with islands elongated along [1 $\overline{2}$ 10] and closely…
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Using in situ grazing-incidence x-ray scattering, we have measured the diffuse scattering from islands that form during layer-by-layer growth of GaN by metal-organic vapor phase epitaxy on the (1010) m-plane surface. The diffuse scattering is extended in the (0001) in-plane direction in reciprocal space, indicating a strong anisotropy with islands elongated along [1 $\overline{2}$ 10] and closely spaced along [0001]. This is confirmed by atomic force microscopy of a quenched sample. Islands were characterized as a function of growth rate G and temperature. The island spacing along [0001] observed during the growth of the first monolayer obeys a power-law dependence on growth rate G$^{-n}$, with an exponent $n = 0.25 \pm 0.02$. Results are in agreement with recent kinetic Monte Carlo simulations, indicating that elongated islands result from the dominant anisotropy in step edge energy and not from surface diffusion anisotropy. The observed power-law exponent can be explained using a simple steady-state model, which gives n = 1/4.
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Submitted 29 June, 2017;
originally announced June 2017.
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An instrument for advanced in situ x-ray studies of metal-organic vapor phase epitaxy of III-nitrides
Authors:
Guangxu Ju,
Matthew J. Highland,
Angel Yanguas-Gil,
Carol Thompson,
Jeffrey A. Eastman,
Hua Zhou,
Sean M. Brennan,
G. Brian Stephenson,
Paul H. Fuoss
Abstract:
We describe an instrument that exploits the ongoing revolution in synchrotron sources, optics, and detectors to enable in situ studies of metal-organic vapor phase epitaxy (MOVPE) growth of III-nitride materials using coherent x-ray methods. The system includes high-resolution positioning of the sample and detector including full rotations, an x-ray transparent chamber wall for incident and diffra…
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We describe an instrument that exploits the ongoing revolution in synchrotron sources, optics, and detectors to enable in situ studies of metal-organic vapor phase epitaxy (MOVPE) growth of III-nitride materials using coherent x-ray methods. The system includes high-resolution positioning of the sample and detector including full rotations, an x-ray transparent chamber wall for incident and diffracted beam access over a wide angular range, and minimal thermal sample motion, giving the sub-micron positional stability and reproducibility needed for coherent x-ray studies. The instrument enables surface x-ray photon correlation spectroscopy, microbeam diffraction, and coherent diffraction imaging of atomic-scale surface and film structure and dynamics during growth, to provide fundamental understanding of MOVPE processes.
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Submitted 14 May, 2017; v1 submitted 9 February, 2017;
originally announced February 2017.
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Chrono CDI: Coherent diffractive imaging of time-evolving samples
Authors:
A. Ulvestad,
A. Tripathi,
S. O. Hruszkewycz,
W. Cha,
S. M. Wild,
G. B. Stephenson,
P. H. Fuoss
Abstract:
Bragg coherent x-ray diffractive imaging is a powerful technique for investigating dynamic nanoscale processes in nanoparticles immersed in reactive, realistic environments. Its temporal resolution is limited, however, by the oversampling requirements of 3D phase retrieval. Here we show that incorporating the entire measurement time series, which is typically a continuous physical process, into ph…
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Bragg coherent x-ray diffractive imaging is a powerful technique for investigating dynamic nanoscale processes in nanoparticles immersed in reactive, realistic environments. Its temporal resolution is limited, however, by the oversampling requirements of 3D phase retrieval. Here we show that incorporating the entire measurement time series, which is typically a continuous physical process, into phase retrieval allows the oversampling requirement at each time step to be reduced leading to a subsequent improvement in the temporal resolution by a factor of 2 to 20 times. The increased time resolution will allow imaging of faster dynamics and of radiation dose sensitive samples. This approach, which we call "chrono CDI", may find use in improving time resolution in other imaging techniques.
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Submitted 4 March, 2016;
originally announced March 2016.
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High resolution three dimensional structural microscopy by single angle Bragg ptychography
Authors:
S. O. Hruszkewycz,
M. Allain,
M. V. Holt,
C. E. Murray,
J. R. Holt,
P. H. Fuoss,
V. Chamard
Abstract:
We present an efficient method of imaging 3D nanoscale lattice behavior and strain fields in crystalline materials with a new methodology -- three dimensional Bragg projection ptychography (3DBPP). In this method, the 2D sample structure information encoded in a coherent high-angle Bragg peak measured at a fixed angle is combined with the real-space scanning probe positions to reconstruct the 3D s…
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We present an efficient method of imaging 3D nanoscale lattice behavior and strain fields in crystalline materials with a new methodology -- three dimensional Bragg projection ptychography (3DBPP). In this method, the 2D sample structure information encoded in a coherent high-angle Bragg peak measured at a fixed angle is combined with the real-space scanning probe positions to reconstruct the 3D sample structure. This work introduces an entirely new means of three dimensional structural imaging of nanoscale materials and eliminates the experimental complexities associated with rotating nanoscale samples. We present the framework for the method and demonstrate our approach with a numerical demonstration, an analytical derivation, and an experimental reconstruction of lattice distortions in a component of a nanoelectronic prototype device.
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Submitted 3 June, 2015;
originally announced June 2015.
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Atomic layer engineering of perovskite oxides for chemically sharp heterointerfaces
Authors:
Woo Seok Choi,
Christopher M. Rouleau,
Sung Seok A. Seo,
Zhenlin Luo,
Hua Zhou,
Timothy T. Fister,
Jeffrey A. Eastman,
Paul H. Fuoss,
Dillon D. Fong,
Jonathan Z. Tischler,
Gyula Eres,
Matthew F. Chisholm,
Ho Nyung Lee
Abstract:
Advances in synthesis techniques and materials understanding have given rise to oxide heterostructures with intriguing physical phenomena that cannot be found in their constituents. In these structures, precise control of interface quality, including oxygen stoichiometry, is critical for unambiguous tailoring of the interfacial properties, with deposition of the first monolayer being the most impo…
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Advances in synthesis techniques and materials understanding have given rise to oxide heterostructures with intriguing physical phenomena that cannot be found in their constituents. In these structures, precise control of interface quality, including oxygen stoichiometry, is critical for unambiguous tailoring of the interfacial properties, with deposition of the first monolayer being the most important step in sha** a well-defined functional interface. Here, we studied interface formation and strain evolution during the initial growth of LaAlO3 on SrTiO3 by pulsed laser deposition, in search of a means for controlling the atomic-sharpness of the interfaces. Our experimental results show that growth of LaAlO3 at a high oxygen pressure dramatically enhances interface abruptness. As a consequence, the critical thickness for strain relaxation was increased, facilitating coherent epitaxy of perovskite oxides. This provides a clear understanding of the role of oxygen pressure during the interface formation, and enables the synthesis of oxide heterostructures with chemically-sharper interfaces.
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Submitted 6 October, 2012;
originally announced October 2012.
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Supplemental Material for "High Contrast X-ray Speckle from Atomic-Scale Order in Liquids and Glasses"
Authors:
S. O. Hruszkewycz,
M. Sutton,
P. H. Fuoss,
B. Adams,
S. Rosenkranz,
K. F. Ludwig Jr.,
W. Roseker,
D. Fritz,
M. Cammarata,
D. Zhu,
S. Lee,
H. Lemke,
C. Gutt,
A. Robert,
G. Gruebel,
G. B. Stephenson
Abstract:
This supplemental material gives additional detail on Experimental Methods and Hard X-ray FEL Source Characteristics, Calculation of Maximum Speckle Contrast, Extracting Contrast of Weak Speckle Patterns, Estimated Temperature Increase from X-ray Absorption, Split-Pulse XPCS Feasibility, and Sample Disturbance During Single Pulses.
This supplemental material gives additional detail on Experimental Methods and Hard X-ray FEL Source Characteristics, Calculation of Maximum Speckle Contrast, Extracting Contrast of Weak Speckle Patterns, Estimated Temperature Increase from X-ray Absorption, Split-Pulse XPCS Feasibility, and Sample Disturbance During Single Pulses.
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Submitted 10 July, 2012;
originally announced July 2012.
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High Contrast X-ray Speckle from Atomic-Scale Order in Liquids and Glasses
Authors:
S. O. Hruszkewycz,
M. Sutton,
P. H. Fuoss,
B. Adams,
S. Rosenkranz,
K. F. Ludwig Jr.,
W. Roseker,
D. Fritz,
M. Cammarata,
D. Zhu,
S. Lee,
H. Lemke,
C. Gutt,
A. Robert,
G. Gruebel,
G. B. Stephenson
Abstract:
The availability of ultrafast pulses of coherent hard x-rays from the Linac Coherent Light Source opens new opportunities for studies of atomic-scale dynamics in amorphous materials. Here we show that single ultrafast coherent x-ray pulses can be used to observe the speckle contrast in the high-angle diffraction from liquid Ga and glassy Ni2Pd2P and B2O3. We determine the thresholds above which th…
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The availability of ultrafast pulses of coherent hard x-rays from the Linac Coherent Light Source opens new opportunities for studies of atomic-scale dynamics in amorphous materials. Here we show that single ultrafast coherent x-ray pulses can be used to observe the speckle contrast in the high-angle diffraction from liquid Ga and glassy Ni2Pd2P and B2O3. We determine the thresholds above which the x-ray pulses disturb the atomic arrangements. Furthermore, high contrast speckle is observed in scattering patterns from the glasses integrated over many pulses, demonstrating that the source and optics are sufficiently stable for x-ray photon correlation spectroscopy studies of dynamics over a wide range of time scales.
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Submitted 10 July, 2012;
originally announced July 2012.
