Incidence of multilayers in chemically exfoliated graphene
Authors:
P. Szirmai,
B. G. Márkus,
J. C. Chacón-Torres,
P. Eckerlein,
K. Edelthalhammer,
J. M. Englert,
U. Mundloch,
A. Hirsch,
F. Hauke,
B. Náfrádi,
L. Forró,
C. Kramberger,
T. Pichler,
F. Simon
Abstract:
An efficient route to synthesize macroscopic amounts of graphene is highly desired and a bulk characterization of such samples, in terms of the number of layers, is equally important. We present a Raman spectroscopy-based method to determine the distribution of the number of graphene layers in chemically exfoliated graphene. We utilize a controlled vapor-phase potassium intercalation technique and…
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An efficient route to synthesize macroscopic amounts of graphene is highly desired and a bulk characterization of such samples, in terms of the number of layers, is equally important. We present a Raman spectroscopy-based method to determine the distribution of the number of graphene layers in chemically exfoliated graphene. We utilize a controlled vapor-phase potassium intercalation technique and identify a lightly doped stage, where the Raman modes of undoped and doped few-layer graphene flakes coexist. The spectra can be unambiguously distinguished from alkali doped graphite, and a modeling with the distribution of the layers yields an upper limit of flake thickness of five layers with a significant single-layer graphene content. Complementary statistical AFM measurements on individual few-layer graphene flakes find a consistent distribution of the layer numbers.
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Submitted 17 January, 2019; v1 submitted 24 July, 2018;
originally announced July 2018.
