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Showing 1–1 of 1 results for author: Elizalde, J T

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  1. arXiv:2202.07019  [pdf, other

    cond-mat.mtrl-sci cond-mat.supr-con

    Sputtering power effects on the electrochromic properties of NiO films

    Authors: Juan R. Abenuz Acuña, Israel Perez, Victor Sosa, Fidel Gamboa, Jose T. Elizalde, Rurik Farias, Diana Carrillo, Jose L. Enriquez, Andres Burrola, Pierre Mani

    Abstract: The effect of sputtering power ($P$=60 W-180 W) on the electrochromic properties of nickel oxide films deposited on ITO-coated glass substrates by the RF magnetron sputtering technique was investigated. Crystalline structure and morphology were assessed by X-ray diffraction (XRD) and scanning electron microscopy (SEM), respectively. The effect of sputtering power on electrochromism of the samples… ▽ More

    Submitted 14 February, 2022; originally announced February 2022.

    Comments: 9 pages, 9 figures, 2 tables. Research article

    Journal ref: Optik, 231, 166509, (2021)