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Localised Solid-State Nanopore Fabrication via Controlled Breakdown using On-Chip Electrodes
Authors:
Jasper P. Fried,
Jacob L. Swett,
Binoy Paulose Nadappuram,
Aleksandra Fedosyuk,
Alex Gee,
Ondrej E. Dyck,
James R. Yates,
Aleksandar P. Ivanov,
Joshua B. Edel,
Jan A. Mol
Abstract:
Controlled breakdown has recently emerged as a highly accessible technique to fabricate solid-state nanopores. However, in its most common form, controlled breakdown creates a single nanopore at an arbitrary location in the membrane. Here, we introduce a new strategy whereby breakdown is performed by applying the electric field between an on-chip electrode and an electrolyte solution in contact wi…
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Controlled breakdown has recently emerged as a highly accessible technique to fabricate solid-state nanopores. However, in its most common form, controlled breakdown creates a single nanopore at an arbitrary location in the membrane. Here, we introduce a new strategy whereby breakdown is performed by applying the electric field between an on-chip electrode and an electrolyte solution in contact with the opposite side of the membrane. We demonstrate two advantages of this method. First, we can independently fabricate multiple nanopores at given positions in the membrane by localising the applied field to the electrode. Second, we show we can create nanopores that are self-aligned with complementary nanoelectrodes by applying voltages to the on-chip electrodes to locally heat the membrane during controlled breakdown. This new controlled breakdown method provides a path towards the affordable, rapid, and automatable fabrication of arrays of nanopores self-aligned with complementary on-chip nanostructures.
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Submitted 4 November, 2021;
originally announced November 2021.
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Manifold Learning of Four-dimensional Scanning Transmission Electron Microscopy
Authors:
Xin Li,
Ondrej E. Dyck,
Mark P. Oxley,
Andrew R. Lupini,
Leland McInnes,
John Healy,
Stephen Jesse,
Sergei V. Kalinin
Abstract:
Four-dimensional scanning transmission electron microscopy (4D-STEM) of local atomic diffraction patterns is emerging as a powerful technique for probing intricate details of atomic structure and atomic electric fields. However, efficient processing and interpretation of large volumes of data remain challenging, especially for two-dimensional or light materials because the diffraction signal recor…
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Four-dimensional scanning transmission electron microscopy (4D-STEM) of local atomic diffraction patterns is emerging as a powerful technique for probing intricate details of atomic structure and atomic electric fields. However, efficient processing and interpretation of large volumes of data remain challenging, especially for two-dimensional or light materials because the diffraction signal recorded on the pixelated arrays is weak. Here we employ data-driven manifold leaning approaches for straightforward visualization and exploration analysis of the 4D-STEM datasets, distilling real-space neighboring effects on atomically resolved deflection patterns from single-layer graphene, with single dopant atoms, as recorded on a pixelated detector. These extracted patterns relate to both individual atom sites and sublattice structures, effectively discriminating single dopant anomalies via multi-mode views. We believe manifold learning analysis will accelerate physics discoveries coupled between data-rich imaging mechanisms and materials such as ferroelectric, topological spin and van der Waals heterostructures.
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Submitted 13 January, 2019; v1 submitted 18 October, 2018;
originally announced November 2018.
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Map** mesoscopic phase evolution during e-beam induced transformations via deep learning of atomically resolved images
Authors:
Rama K. Vasudevan,
Nouamane Laanait,
Erik M. Ferragut,
Kai Wang,
David B. Geohegan,
Kai Xiao,
Maxim A. Ziatdinov,
Stephen Jesse,
Ondrej E. Dyck,
Sergei V. Kalinin
Abstract:
Understanding transformations under electron beam irradiation requires map** the structural phases and their evolution in real time. To date, this has mostly been a manual endeavor comprising of difficult frame-by-frame analysis that is simultaneously tedious and prone to error. Here, we turn towards the use of deep convolutional neural networks (DCNN) to automatically determine the Bravais latt…
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Understanding transformations under electron beam irradiation requires map** the structural phases and their evolution in real time. To date, this has mostly been a manual endeavor comprising of difficult frame-by-frame analysis that is simultaneously tedious and prone to error. Here, we turn towards the use of deep convolutional neural networks (DCNN) to automatically determine the Bravais lattice symmetry present in atomically-resolved images. A DCNN is trained to identify the Bravais lattice class given a 2D fast Fourier transform of the input image. Monte-Carlo dropout is used for determining the prediction probability, and results are shown for both simulated and real atomically-resolved images from scanning tunneling microscopy and scanning transmission electron microscopy. A reduced representation of the final layer output allows to visualize the separation of classes in the DCNN and agrees with physical intuition. We then apply the trained network to electron beam-induced transformations in WS2, which allows tracking and determination of growth rate of voids. These results are novel in two ways: (1) It shows that DCNNs can be trained to recognize diffraction patterns, which is markedly different from the typical "real image" cases, and (2) it provides a method with in-built uncertainty quantification, allowing the real-time analysis of phases present in atomically resolved images.
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Submitted 28 February, 2018;
originally announced February 2018.
