Showing 1–8 of 8 results for author: Dullo, F T

Label-free incoherent super-resolution optical microscopy

Authors: Nikhil Jayakumar, Luis E. Villegas-Hernández, Weisong Zhao, Hong Mao, Firehun T Dullo, Jean-Claude Tinguley, Krizia Sagini, Alicia Llorente, Balpreet Singh Ahluwalia

Abstract: The photo-kinetics of fluorescent molecules has enabled the circumvention of far-field optical diffraction-limit. Despite its enormous potential, the necessity to label the sample may adversely influence the delicate biology under investigation. Thus, continued development efforts are needed to surpass the far-field label-free diffraction barrier. The coherence of the detected light in label-free… ▽ More The photo-kinetics of fluorescent molecules has enabled the circumvention of far-field optical diffraction-limit. Despite its enormous potential, the necessity to label the sample may adversely influence the delicate biology under investigation. Thus, continued development efforts are needed to surpass the far-field label-free diffraction barrier. The coherence of the detected light in label-free mode hinders the application of existing super-resolution methods based on incoherent fluorescence imaging. In this article, we present the physics and propose a methodology to circumvent this challenge by exploiting the photoluminescence of silicon nitride waveguides for near-field illumination of unlabeled samples. The technique is abbreviated EPSLON, Evanescently decaying Photoluminescence Scattering enables Label-free Optical Nanoscopy. We demonstrate that such an illumination has properties that mimics the photo-kinetics of nano-sized fluorescent molecules. This allows to develop a label-free incoherent system that is linear in intensity, and stable with time thereby permitting the application of techniques like structured illumination microscopy (SIM) and intensity-fluctuation based optical nanoscopy (IFON) in label-free mode to circumvent the diffraction limit. We experimentally demonstrate labelfree super-resolution imaging of nanobeads (polystyrene and gold), extra-cellular vesicles, rat kidney sections and human placenta tissue. △ Less

Submitted 7 November, 2023; v1 submitted 9 January, 2023; originally announced January 2023.

Comments: 37 pages including supplementary, 6 figures in main text and 20 figures in supplementary

MEMS-tunable dielectric metasurface lens using thin-film PZT for large displacements at low voltages

Authors: Christopher A. Dirdal, Paul C. V. Thrane, Firehun T. Dullo, Jo Gjessing, Anand Summanwar, Jon Tschudi

Abstract: Tunable focusing is a desired property in a wide range of optical imaging and sensing technologies but has tended to require bulky components which cannot be integrated on-chip and have slow actuation speeds. Recently, integration of metasurfaces into electrostatic MEMS architectures has shown potential to overcome these challenges, but has offered limited out of plane displacement range while req… ▽ More Tunable focusing is a desired property in a wide range of optical imaging and sensing technologies but has tended to require bulky components which cannot be integrated on-chip and have slow actuation speeds. Recently, integration of metasurfaces into electrostatic MEMS architectures has shown potential to overcome these challenges, but has offered limited out of plane displacement range while requiring large voltages. We demonstrate for the first time a movable metasurface lens actuated by integrated thin-film PZT MEMS, which has the advantage of offering large displacements at low voltages. An out of plane displacement of a metasurface in the range of 7.2 um is demonstrated under a voltage application of 23V. This is roughly twice the displacement at a quarter of the voltage of state of the art electrostatic out of plane actuation of metasurfaces. Utilizing this tunability we demonstrate a varifocal lens doublet with a focal shift on the order of 250um at the wavelength 1.55um. Thin-film PZT MEMS-metasurfaces is a promising platform for miniaturized varifocal components. △ Less

Submitted 19 December, 2021; originally announced December 2021.

Label-free chip-based evanescent light scattering super-resolution and superior-contrast optical microscopy (cELS)

Authors: Nikhil Jayakumar, Firehun T Dullo, Vishesh Dubey, Azeem Ahmad Ahmad, Jennifer Cauzzo, Eduarda Mazagao Guerreiro, Omri Snir, Natasa Skalko-Basnet, Krishna Agarwal, Balpreet Singh Ahluwalia

Abstract: Chip-based Evanescent Light Scattering (cELS) utilizes the multiple modes of a high-index contrast optical waveguide for near-field illumination of unlabeled samples, thereby repositioning the highest spatial frequencies of the sample into the far-field. The multiple modes scattering off the sample with different phase differences is engineered to have random spatial distributions within the integ… ▽ More Chip-based Evanescent Light Scattering (cELS) utilizes the multiple modes of a high-index contrast optical waveguide for near-field illumination of unlabeled samples, thereby repositioning the highest spatial frequencies of the sample into the far-field. The multiple modes scattering off the sample with different phase differences is engineered to have random spatial distributions within the integration time of the camera, mitigating the coherent speckle noise. This enables label-free superior-contrast imaging of weakly scattering nanosized specimens such as extra-cellular vesicles (EVs) and liposomes, dynamics of living HeLa cells etc. The article explains and validates experimentally the physics behind cELS by demonstrating a multi-moded straight waveguide as a partially coherent light source. For isotropic super-resolution, spatially incoherent light engineered via multiple-arms waveguide chip and intensity-fluctuation based algorithms are used. The proof-of-concept results are demonstrated on 100 nm polystyrene beads and resolution improvement of close to 2X is shown. cELS also realizes (2-10)X more contrast as opposed to conventional imaging techniques. In addition, cELS platform is miniaturized and enables large field-of-view imaging compared to state of the art label-free techniques. cELS holds a potential for label-free super-resolution imaging of nanosized biological specimens at high-throughput. △ Less

Submitted 24 February, 2022; v1 submitted 24 August, 2021; originally announced August 2021.

Comments: Modified the paper as it is not super-resolution but contrast enhancement happening

Roadmap on multimode light sha**

Authors: Marco Piccardo, Vincent Ginis, Andrew Forbes, Simon Mahler, Asher A. Friesem, Nir Davidson, Haoran Ren, Ahmed H. Dorrah, Federico Capasso, Firehun T. Dullo, Balpreet S. Ahluwalia, Antonio Ambrosio, Sylvain Gigan, Nicolas Treps, Markus Hiekkamäki, Robert Fickler, Michael Kues, David Moss, Roberto Morandotti, Johann Riemensberger, Tobias J. Kippenberg, Jérôme Faist, Giacomo Scalari, Nathalie Picqué, Theodor W. Hänsch , et al. (13 additional authors not shown)

Abstract: Our ability to generate new distributions of light has been remarkably enhanced in recent years. At the most fundamental level, these light patterns are obtained by ingeniously combining different electromagnetic modes. Interestingly, the modal superposition occurs in the spatial, temporal as well as spatio-temporal domain. This generalized concept of structured light is being applied across the e… ▽ More Our ability to generate new distributions of light has been remarkably enhanced in recent years. At the most fundamental level, these light patterns are obtained by ingeniously combining different electromagnetic modes. Interestingly, the modal superposition occurs in the spatial, temporal as well as spatio-temporal domain. This generalized concept of structured light is being applied across the entire spectrum of optics: generating classical and quantum states of light, harnessing linear and nonlinear light-matter interactions, and advancing applications in microscopy, spectroscopy, holography, communication, and synchronization. This Roadmap highlights the common roots of these different techniques and thus establishes links between research areas that complement each other seamlessly. We provide an overview of all these areas, their backgrounds, current research, and future developments. We highlight the power of multimodal light manipulation and want to inspire new eclectic approaches in this vibrant research community. △ Less

Submitted 8 April, 2021; originally announced April 2021.

Comments: Under review in J. Opt

A transparent waveguide chip for versatile TIRF-based microscopy and nanoscopy

Authors: Anish Priyadarshi, Firehun Tsige Dullo, Deanna L. Wolfson, Azeem Ahmad, Nikhil Jayakumar, Vishesh Dubey, Jean-Claude Tinguely, Balpreet Singh Ahluwalia, Ganapathy Senthil Murugan

Abstract: Total internal reflection fluorescence microscopy (TIRF) has enabled low-background, live-cell friendly imaging of cell surfaces and other thin samples thanks to the shallow penetration of the evanescent light field into the sample. The implementation of TIRF on optical waveguide chips (c-TIRF) has overcome historical limitations on the magnification and field of view (FOV) compared to lens-based… ▽ More Total internal reflection fluorescence microscopy (TIRF) has enabled low-background, live-cell friendly imaging of cell surfaces and other thin samples thanks to the shallow penetration of the evanescent light field into the sample. The implementation of TIRF on optical waveguide chips (c-TIRF) has overcome historical limitations on the magnification and field of view (FOV) compared to lens-based TIRF, and further allows the light to be guided in complicated patterns that can be used for advanced imaging techniques or selective stimulation of the sample. However, the opacity of the chips themselves has thus far precluded their use on inverted microscopes and complicated sample preparation and handling. In this work, we introduce a new platform for c-TIRF imaging based on a transparent substrate, which is fully compatible with sample handling and imaging procedures commonly used with a standard #1.5 glass coverslip, and is fabricated using standard complementary metal-oxide-semiconductor (CMOS) techniques, which can easily be scaled up for mass production. We demonstrate its performance on synthetic and biological samples using both upright and inverted microscopes, and show how it can be extended to super-resolution applications, achieving a resolution of 116 nm using super resolution radial fluctuations (SRRF). These new chips retain the scalable FOV of opaque chip-based TIRF and the high axial resolution of TIRF, and have the versatility to be used with many different objective lenses, microscopy methods, and handling techniques. We thus see c-TIRF as a technology primed for widespread adoption, increasing both TIRF's accessibility to users and the range of applications that can benefit from it. △ Less

Submitted 1 July, 2020; v1 submitted 11 June, 2020; originally announced June 2020.

Report number: s43246-021-00192-5

Journal ref: 2021

Photonic-chip assisted correlative light and electron microscopy

Authors: Jean-Claude Tinguely, Anna Maria Steyer, Cristina Ionica Øie, Øystein Ivar Helle, Firehun Tsige Dullo, Randi Olsen, Peter McCourt, Yannick Schwab, Balpreet Singh Ahluwalia

Abstract: Correlative light-electron microscopy (CLEM) unifies the versatility of light microscopy (LM) with the high resolution of electron microscopy (EM), allowing one to zoom into the complex organization of cells. Most CLEM techniques use ultrathin sections, and thus lack the 3D-EM structural information, and focusing on a very restricted field of view. Here, we introduce photonic chip assisted CLEM, e… ▽ More Correlative light-electron microscopy (CLEM) unifies the versatility of light microscopy (LM) with the high resolution of electron microscopy (EM), allowing one to zoom into the complex organization of cells. Most CLEM techniques use ultrathin sections, and thus lack the 3D-EM structural information, and focusing on a very restricted field of view. Here, we introduce photonic chip assisted CLEM, enabling multi-modal total internal reflection fluorescence (TIRF) microscopy over large field of view and high precision localization of the target area of interest within EM. The chip-based direct stochastic optical reconstruction microscopy (dSTORM), and 3D high precision correlation of biological processes by focused ion beam-scanning electron microscopy (FIB-SEM) is further demonstrated. The core layer of the photonic chips are used as a substrate to hold, to illuminate and the cladding layer is used to enable high-precision landmarking of the sample through specially designed grid-like numbering systems. The landmarks are fabricated on the cladding of the photonic chips as extruding pillars from the waveguide surface, thus remaining visible for FIB-SEM after resin embedding during sample processing. Using this approach we demonstrate its applicability for tracking the area of interest, imaging the 3D structural organization of nano-sized morphological features on liver sinusoidal endothelial cells such as fenestrations, and correlating specific endo-lysosomal compartments with its cargo protein upon endocytosis. We envisage that photonic chip equipped with landmarks can be used in the future to automatize the work-flow for both LM and EM for high-throughput CLEM, providing the resolution needed for insights into the complex intracellular communication and the relation between morphology and function in health and disease. △ Less

Submitted 16 November, 2019; originally announced November 2019.

Comments: 23 Pages, 11 Figures

A Super-Condenser for Labelfree Nanoscopy

Authors: Florian Ströhl, Ida S. Opstad, Jean-Claude Tinguely, Firehun T. Dullo, Ioanna Mela, Johannes W. M. Osterrieth, Balpreet S. Ahluwalia, Clemens F. Kaminski

Abstract: Labelfree nanoscopy encompasses optical imaging with resolution in the 100 nm range using visible wavelengths. Here, we present a labelfree nanoscopy method that combines Fourier ptychography with waveguide microscopy to realize a 'super-condenser' featuring maximally inclined coherent darkfield illumination with artificially stretched wave vectors due to large refractive indices of the employed S… ▽ More Labelfree nanoscopy encompasses optical imaging with resolution in the 100 nm range using visible wavelengths. Here, we present a labelfree nanoscopy method that combines Fourier ptychography with waveguide microscopy to realize a 'super-condenser' featuring maximally inclined coherent darkfield illumination with artificially stretched wave vectors due to large refractive indices of the employed Si$_3$N$_4$ waveguide material. We produce the required coherent plane wave illumination for Fourier ptychography over imaging areas 400 $\mathrmμ$m$^2$ in size via adiabatically tapered single-mode waveguides and tackle the overlap constraints of the Fourier ptychography phase retrieval algorithm two-fold: firstly, the directionality of the illumination wave vector is changed sequentially via a multiplexed input structure of the waveguide chip layout and secondly, the wave vector modulus is shortend via step-wise increases of the illumination light wavelength over the visible spectrum. We validate the method via in silico and in vitro experiments and provide details on the underlying image formation theory as well as the reconstruction algorithm. △ Less

Submitted 7 May, 2019; originally announced May 2019.

Structured illumination microscopy using a photonic chip

Authors: Øystein I. Helle, Firehun T. Dullo, Marcel Lahrberg, Jean-Claude Tinguely, Balpreet S. Ahluwalia

Abstract: Structured illumination microscopy (SIM) enables live cell, super-resolution imaging at high speeds. SIM uses sophisticated optical systems to generate pre-determined excitation light patterns, and reconstruction algorithms to enhance the resolution by up to a factor of two. The optical set-up of SIM relies on delicate free-space optics to generate the light patterns, and a high numerical aperture… ▽ More Structured illumination microscopy (SIM) enables live cell, super-resolution imaging at high speeds. SIM uses sophisticated optical systems to generate pre-determined excitation light patterns, and reconstruction algorithms to enhance the resolution by up to a factor of two. The optical set-up of SIM relies on delicate free-space optics to generate the light patterns, and a high numerical aperture objective lens to project the pattern on the sample. These arrangements are prone to miss-alignment, often with high costs, and with the final resolution-enhancement being limited by the numerical aperture of the collection optics. Here, we present a photonic-chip based total internal reflection fluorescence (TIRF)-SIM that greatly reduces the complexity of the optical setup needed to acquire TIRF-SIM images. This is achieved by taking out the light delivery from the microscope and transferring it to a photonic-chip. The conventional glass slide is replaced by the planar photonic chip, that both holds and illuminates the specimen. The chip is used to create a standing wave interference pattern, which illuminates the sample via evanescent fields. The phase of the interference pattern is controlled by the use of thermo-optical modulation, leaving the footprint of the light illumination path for the SIM system to around 4 by 4 cm$^2$. Furthermore, we show that by the use of the photonic-chip technology, the resolution enhancement of SIM can be increased above that of the conventional approach. In addition, by the separation of excitation and collection light paths the technology opens the possibility to use low numerical objective lenses, without sacrificing on the SIM resolution. Chip-based SIM represents a simple, stable and affordable approach, which could enable widespread penetration of the technique and might also open avenues for high throughput optical super-resolution microscopy. △ Less

Submitted 13 March, 2019; originally announced March 2019.