Showing 1–13 of 13 results for author: Dresselhaus-Marais, L E

X-ray induced grain structure dynamics in Bi2Se3

Authors: Kento Katagiri, Bernard Kozioziemski, Eric Folsom, Yifan Wang, Karen Appel, Philip K. Cook, Jon Eggert, Sebastian Göde, Marylesa Howard, Sungwon Kim, Mikako Matsuda, Motoaki Nakatsutsumi, Martin M. Nielsen, Henning F. Poulsen, Frank Seiboth, Hugh Simons, Bihan Wang, Wenge Yang, Ulf Zastrau, Hyunjung Kim, Leora E. Dresselhaus-Marais

Abstract: Grain rotation in crystals often results in coarsening or refinement of the grains that modify the mechanical and thermal properties of materials. While many studies have explored how externally applied stress and temperature drive grain structure dynamics in nano-polycrystalline materials, the analogous studies on colossal grains have been limited, especially in the absence of external force. In… ▽ More Grain rotation in crystals often results in coarsening or refinement of the grains that modify the mechanical and thermal properties of materials. While many studies have explored how externally applied stress and temperature drive grain structure dynamics in nano-polycrystalline materials, the analogous studies on colossal grains have been limited, especially in the absence of external force. In this work, we used X-ray free electron laser pulses to irradiate single-crystalline bismuth selenide (Bi2Se3) and observed grain boundary formation and subsequent grain rotation in response to the X-ray radiation. Our observations with simultaneous X-ray diffraction and transmission X-ray microscopy demonstrate how intense X-ray radiation can rapidly change grain morphologies of initially single-crystalline material. △ Less

Submitted 12 March, 2024; originally announced March 2024.

Comments: 20 pages, 8 figures including 3 supplemental figures

Dark-Field X-ray Microscopy for 2D and 3D imaging of Microstructural Dynamics at the European X-ray Free Electron Laser

Authors: Sara J. Irvine, Kento Katagiri, Trygve M. Ræder, Darshan Chalise, Dayeeta Pal, Jade I. Stanton, Gabriele Ansaldi, Ulrike Boesenberg, Felix Brauße, Jon H. Eggert, Lichao Fang, Eric Folsom, Jörg Hallmann, Morten Haubro, Theodor S. Holstad, Anders Madsen, Johannes Möller, Martin M. Nielsen, Henning F. Poulsen, Jan-Etienne Pudel, Angel Rodriguez-Fernandez, Frank Schoofs, Frank Seiboth, Yifan Wang, Jo Wonhyuk , et al. (4 additional authors not shown)

Abstract: Dark field X-ray microscopy (DXFM) has enabled experiments to visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve ~1-um spatial resolution and <100 fs time resolution simultaneously. In this paper, we present the first ultrafast DFXM measurements at the European XFEL. In this work, we demonstrat… ▽ More Dark field X-ray microscopy (DXFM) has enabled experiments to visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve ~1-um spatial resolution and <100 fs time resolution simultaneously. In this paper, we present the first ultrafast DFXM measurements at the European XFEL. In this work, we demonstrate DFXM of laser-induced phonon wavepackets propagating through dislocations inside a diamond single crystal. In addition to demonstrating this new capability, we present two new DFXM scanning techniques for XFEL applications, 3D and axial-strain scans with sub-μm spatial resolution. With this progress to XFEL DFXM, we discuss new opportunities to study multi-timescale spatio-temporal dynamics of defects, strain waves, and other localized phenomena deep inside crystals. △ Less

Submitted 7 November, 2023; originally announced November 2023.

Transonic Dislocation Propagation in Diamond

Authors: Kento Katagiri, Tatiana Pikuz, Lichao Fang, Bruno Albertazzi, Shunsuke Egashira, Yuichi Inubushi, Genki Kamimura, Ryosuke Kodama, Michel Koenig, Bernard Kozioziemski, Gooru Masaoka, Kohei Miyanishi, Hirotaka Nakamura, Masato Ota, Gabriel Rigon, Youichi Sakawa, Takayoshi Sano, Frank Schoofs, Zoe J. Smith, Keiichi Sueda, Tadashi Togashi, Tommaso Vinci, Yifan Wang, Makina Yabashi, Toshinori Yabuuchi , et al. (2 additional authors not shown)

Abstract: The motion of line defects (dislocations) has been studied for over 60 years but the maximum speed at which they can move is unresolved. Recent models and atomistic simulations predict the existence of a limiting velocity of dislocation motions between the transonic and subsonic ranges at which the self-energy of dislocation diverges, though they do not deny the possibility of the transonic disloc… ▽ More The motion of line defects (dislocations) has been studied for over 60 years but the maximum speed at which they can move is unresolved. Recent models and atomistic simulations predict the existence of a limiting velocity of dislocation motions between the transonic and subsonic ranges at which the self-energy of dislocation diverges, though they do not deny the possibility of the transonic dislocations. We use femtosecond x-ray radiography to track ultrafast dislocation motion in shock-compressed single-crystal diamond. By visualizing stacking faults extending faster than the slowest sound wave speed of diamond, we show the evidence of partial dislocations at their leading edge moving transonically. Understanding the upper limit of dislocation mobility in crystals is essential to accurately model, predict, and control the mechanical properties of materials under extreme conditions. △ Less

Submitted 6 October, 2023; v1 submitted 7 March, 2023; originally announced March 2023.

Real-time imaging of acoustic waves in bulk materials with X-ray microscopy

Authors: Theodor S. Holstad, Leora E. Dresselhaus-Marais, Trygve Magnus Ræder, Bernard Kozioziemski, Tim van Driel, Matthew Seaberg, Eric Folsom, Jon H. Eggert, Erik Bergbäck Knudsen, Martin Meedom Nielsen, Hugh Simons, Kristoffer Haldrup, Henning Friis Poulsen

Abstract: Materials modelling and processing require experiments to visualize and quantify how external excitations drive the evolution of deep subsurface structure and defects that determine properties. Today, 3D movies with ~100-nm resolution of crystalline structure are regularly acquired in minutes to hours using X-ray diffraction based imaging. We present an X-ray microscope that improves this time res… ▽ More Materials modelling and processing require experiments to visualize and quantify how external excitations drive the evolution of deep subsurface structure and defects that determine properties. Today, 3D movies with ~100-nm resolution of crystalline structure are regularly acquired in minutes to hours using X-ray diffraction based imaging. We present an X-ray microscope that improves this time resolution to <100 femtoseconds, with images attainable even from a single X-ray pulse. Using this, we resolve the propagation of 18-km/s acoustic waves in mm-sized diamond crystals, and demonstrate how mechanical energy thermalizes from picosecond to microsecond timescales. Our approach unlocks a vast range of new experiments of materials phenomena with intricate structural dynamics at ultrafast timescales. △ Less

Submitted 14 November, 2022; v1 submitted 2 November, 2022; originally announced November 2022.

Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers

Authors: Leora E. Dresselhaus-Marais, Bernard Kozioziemski, Theodor S. Holstad, Trygve Magnus Ræder, Matthew Seaberg, Daewoong Nam, Sangsoo Kim, Sean Breckling, Seonghyuk Choi, Matthieu Chollet, Philip K. Cook, Eric Folsom, Eric Galtier, Arnulfo Gonzalez, Tais Gorhover, Serge Guillet, Kristoffer Haldrup, Marylesa Howard, Kento Katagiri, Seonghan Kim, Sunam Kim, Sungwon Kim, Hyunjung Kim, Erik Bergback Knudsen, Stephan Kuschel , et al. (18 additional authors not shown)

Abstract: The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the str… ▽ More The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, Dark Field X-ray Microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $10^{12}$ photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics. △ Less

Submitted 5 September, 2023; v1 submitted 15 October, 2022; originally announced October 2022.

Journal ref: Scientific Reports, 13, 17573 (2023)

Extensive 3D Map** of Dislocation Structures in Bulk Aluminum

Authors: Can Yildirim, Henning F. Poulsen, Grethe Winther, Carsten Detlefs, Pin H. Huang, Leora E. Dresselhaus-Marais

Abstract: Thermomechanical processing such as annealing is one of the main methods to tailor the mechanical properties of materials, however, much is unknown about the reorganization of dislocation structures deep inside macroscopic crystals that give rise to those changes. Here, we demonstrate the self-organization of dislocation structures upon high-temperature annealing in a mm-sized single crystal of al… ▽ More Thermomechanical processing such as annealing is one of the main methods to tailor the mechanical properties of materials, however, much is unknown about the reorganization of dislocation structures deep inside macroscopic crystals that give rise to those changes. Here, we demonstrate the self-organization of dislocation structures upon high-temperature annealing in a mm-sized single crystal of aluminum. We map a large embedded 3D volume ($100\times300\times300$ $μ$m$^3$) of dislocation structures using dark field x-ray microscopy (DFXM), a diffraction-based imaging technique. Over the wide field of view, DFXM's high angular resolution allows us to identify subgrains, separated by dislocation boundaries, which we identify and characterize down to the single-dislocation level using computer-vision methods. We demonstrate how even after long annealing times at high temperatures, the remaining low density of dislocations still pack into well-defined, straight dislocation boundaries (DBs) that lie on specific crystallographic planes. In contrast to conventional grain growth models, our results show that the dihedral angles at the triple junctions are not the predicted 120$\degree$, suggesting additional complexities in the boundary stabilization mechanisms. Map** the local misorientation and lattice strain around these boundaries shows that the observed strain is shear, imparting an average misorientation around the DB of $\approx 0.003-0.006 \degree{}$ △ Less

Submitted 30 August, 2022; originally announced August 2022.

An Online Dynamic Amplitude-Correcting Gradient Estimation Technique to Align X-ray Focusing Optics

Authors: Sean Breckling, Leora E. Dresselhaus-Marais, Eric Machorro, Michael C. Brennan, Jordan Pillow, Malena Espanol, Bernard Kozioziemski, Ryan Coffee, Sunam Kim, Sangsoo Kim, Daewoong Nam, Arnulfo Gonzales, Margaret Lund, Jesse Adams, Daniel Champion, Ajanae Williams, Kevin Joyce, Marylesa Howard

Abstract: High-brightness X-ray pulses, as generated at synchrotrons and X-ray free electron lasers (XFEL), are used in a variety of scientific experiments. Many experimental testbeds require optical equipment, e.g Compound Refractive Lenses (CRLs), to be precisely aligned and focused. The lateral alignment of CRLs to a beamline requires precise positioning along four axes: two translational, and the two ro… ▽ More High-brightness X-ray pulses, as generated at synchrotrons and X-ray free electron lasers (XFEL), are used in a variety of scientific experiments. Many experimental testbeds require optical equipment, e.g Compound Refractive Lenses (CRLs), to be precisely aligned and focused. The lateral alignment of CRLs to a beamline requires precise positioning along four axes: two translational, and the two rotational. At a synchrotron, alignment is often accomplished manually. However, XFEL beamlines present a beam brightness that fluctuates in time, making manual alignment a time-consuming endeavor. Automation using classic stochastic methods often fail, given the errant gradient estimates. We present an online correction based on the combination of a generalized finite difference stencil and a time-dependent sampling pattern. Error expectation is analyzed, and efficacy is demonstrated. We provide a proof of concept by laterally aligning optics on a simulated XFEL beamline. △ Less

Submitted 30 September, 2022; v1 submitted 23 August, 2022; originally announced August 2022.

Strength of diamond beyond the elastic limit under dynamic compression

Authors: K. Katagiri, N. Ozaki, L. E. Dresselhaus-Marais, J. H. Eggert, Y. Inubushi, T. Irifune, M. Koenig, T. Matsuoka, K. Miyanishi, H. Nakamura, N. Nishiyama, T. Okuchi, T. Sekine, Y. Seto, K. Sueda, Y. Tange, T. Togashi, Y. Umeda, M. Yabashi, T. Yabuuchi, R. Kodama

Abstract: Extremely high pressures over a million of atmospheres are required to deform diamonds permanently. Under dynamic high-pressure conditions, even such strong materials lose their strengths so rapidly that the initially pristine lattice transforms into complex dynamics. Here, we report femtosecond x-ray diffraction observations that directly resolve how shock waves deform the crystal lattice in the… ▽ More Extremely high pressures over a million of atmospheres are required to deform diamonds permanently. Under dynamic high-pressure conditions, even such strong materials lose their strengths so rapidly that the initially pristine lattice transforms into complex dynamics. Here, we report femtosecond x-ray diffraction observations that directly resolve how shock waves deform the crystal lattice in the isotropic nano-polycrystalline form of diamond. The results show that the nano-grain reinforced diamond retains its strength at shock pressures far beyond its elastic limit until it finally approaches zero at 707 GPa, indicating the existence of brittle-ductile transition of nano-polycrystalline diamond under high-strain rate shock compression. The atomic-level deformation process of the diamond observed in this study is a key benchmark for designing high strength materials and simulating their behavior under extreme conditions. △ Less

Submitted 5 August, 2022; originally announced August 2022.

Analytical Methods for Superresolution Dislocation Identification in Dark-Field X-ray Microscopy

Authors: Michael C. Brennan, Marylesa Howard, Youssef Marzouk, Leora E. Dresselhaus-Marais

Abstract: In this work, we develop several inference methods to estimate the position of dislocations from images generated using dark-field X-ray microscopy (DFXM) -- achieving superresolution accuracy and principled uncertainty quantification. Using the framework of Bayesian inference, we incorporate models of the DFXM contrast mechanism and detector measurement noise, along with initial position estimate… ▽ More In this work, we develop several inference methods to estimate the position of dislocations from images generated using dark-field X-ray microscopy (DFXM) -- achieving superresolution accuracy and principled uncertainty quantification. Using the framework of Bayesian inference, we incorporate models of the DFXM contrast mechanism and detector measurement noise, along with initial position estimates, into a statistical model coupling DFXM images with the dislocation position of interest. We motivate several position estimation and uncertainty quantification algorithms based on this model. We then demonstrate the accuracy of our primary estimation algorithm on synthetic realistic DFXM images of edge dislocations in single crystal aluminum. We conclude with a discussion of our methods' impact on future dislocation studies and possible future research avenues. △ Less

Submitted 10 March, 2022; originally announced March 2022.

Journal ref: Journal of Materials Science, 57, 14890-14904 (2022)

Multi-scale characterization of hexagonal Si-4H: a hierarchical nanostructured material

Authors: Silvia Pandolfi, Shiteng Zhao, John Turner, Peter Ercius, Chengyu Song, Rohan Dhall, Nicolas Menguy, Yann Le Godec, Alexandre Courac, Andrew M. Minor, Jon Eggert, Leora E. Dresselhaus-Marais

Abstract: In this work we present a detailed structural characterization of Si-4H, a newly discovered bulk form of hexagonal silicon (Si) with potential optoelectronic applications. Using multi-scale imaging, we reveal a hierarchical structure in the morphology of Si-4H obtained from high-pressure synthesis. We demonstrate discrete structural units, platelets, at an intermediate length-scale between the bul… ▽ More In this work we present a detailed structural characterization of Si-4H, a newly discovered bulk form of hexagonal silicon (Si) with potential optoelectronic applications. Using multi-scale imaging, we reveal a hierarchical structure in the morphology of Si-4H obtained from high-pressure synthesis. We demonstrate discrete structural units, platelets, at an intermediate length-scale between the bulk pellets synthesized at high pressures and the flake-like crystallites inferred in previous studies. Direct observation of the platelets reveals their 2D structure, with planar faces spanning hundreds of nanometers to a few micrometers and thicknesses of only tens of nanometers. We separated and dispersed small packets of quasi-single platelets, which enabled us to analyze the crystalline domains within each grain. With this view, we demonstrate that Si-4H platelets represent the smallest crystalline structural units, which can bend at the single-domain level. Our characterization of the quasi-2D, flexible platelets of hexagonal Si-4H and proof of concept that the platelets can be dispersed and manipulated quite simply demonstrate opportunities to design novel optoelectronic and solar devices. △ Less

Submitted 6 October, 2021; originally announced October 2021.

In-Situ Visualization of Long-Range Defect Interactions at the Edge of Melting

Authors: Leora E. Dresselhaus-Marais, Grethe Winther, Marylesa Howard, Arnulfo Gonzalez, Sean R. Breckling, Can Yildirim, Philip K. Cook, Mustafacan Kutsal, Hugh Simons, Carsten Detlefs, Jon H. Eggert, Henning Friis Poulsen

Abstract: Connecting a bulk material's microscopic defects to its macroscopic properties is an age-old problem in materials science. Long-range interactions between dislocations (line defects) are known to play a key role in how materials deform or melt, but we lack the tools to connect these dynamics to the macroscopic properties. We introduce time-resolved dark-field X-ray microscopy to directly visualize… ▽ More Connecting a bulk material's microscopic defects to its macroscopic properties is an age-old problem in materials science. Long-range interactions between dislocations (line defects) are known to play a key role in how materials deform or melt, but we lack the tools to connect these dynamics to the macroscopic properties. We introduce time-resolved dark-field X-ray microscopy to directly visualize how dislocations move and interact over hundreds of micrometers, deep inside bulk aluminum. With real-time movies, we reveal the thermally-activated motion and interactions of dislocations that comprise a boundary, and show how weakened binding forces inhomogeneously destabilize the structure at 99% of the melting temperature. Connecting dynamics of the microstructure to its stability, we provide important opportunities to guide and validate multiscale models that are yet untested. △ Less

Submitted 14 September, 2020; v1 submitted 10 September, 2020; originally announced September 2020.

Journal ref: Science Advances, 7, 29, abe8311 (2021)

Methods to Quantify Dislocation Behavior with Dark-field X-ray Microscopy Timescans of Single-Crystal Aluminum

Authors: Arnulfo Gonzalez, Marylesa Howard, Sean Breckling, Leora E. Dresselhaus-Marais

Abstract: Crystal defects play a large role in how materials respond to their surroundings, yet there are many uncertainties in how extended defects form, move, and interact deep beneath a material's surface. A newly developed imaging diagnostic, dark-field X-ray microscopy (DFXM) can now visualize the behavior of line defects, known as dislocations, in materials under varying conditions. DFXM images visual… ▽ More Crystal defects play a large role in how materials respond to their surroundings, yet there are many uncertainties in how extended defects form, move, and interact deep beneath a material's surface. A newly developed imaging diagnostic, dark-field X-ray microscopy (DFXM) can now visualize the behavior of line defects, known as dislocations, in materials under varying conditions. DFXM images visualize dislocations by imaging the very subtle long-range distortions in the material's crystal lattice, which produce a characteristic adjoined pair of bright and dark regions. Full analysis of how these dislocations evolve can be used to refine material models, however, it requires quantitative characterization of the statistics of their shape, position and motion. In this paper, we present a semi-automated approach to effectively isolate, track, and quantify the behavior of dislocations as composite objects. This analysis drives the statistical characterization of the defects, to include dislocation velocity and orientation in the crystal, for example, and is demonstrated on DFXM images measuring the evolution of defects at 98$\%$ of the melting temperature for single-crystal aluminum, collected at the European Synchrotron Radiation Facility. △ Less

Submitted 11 August, 2020; originally announced August 2020.

Geometrical Optics Formalism to Model Contrast in Dark-Field X-ray Microscopy

Authors: H. F. Poulsen, L. E. Dresselhaus-Marais, M. A. Carlsen, C. Detlefs, G. Winther

Abstract: Dark-field X-ray microscopy is a new full-field imaging technique that nondestructively maps the structure and local strain inside deeply embedded crystalline elements in three dimensions. Placing an objective lens in the diffracted beam generates a magnified projection image of a local volume. We provide a general formalism based on geometrical optics for the diffraction imaging, valid for any cr… ▽ More Dark-field X-ray microscopy is a new full-field imaging technique that nondestructively maps the structure and local strain inside deeply embedded crystalline elements in three dimensions. Placing an objective lens in the diffracted beam generates a magnified projection image of a local volume. We provide a general formalism based on geometrical optics for the diffraction imaging, valid for any crystallographic space group. This allows simulation of diffraction images based on micro-mechanical models. We present example simulations with the formalism, demonstrating how it may be used to design new experiments or interpret existing ones. In particular, we show how modifications to the experimental design may tailor the reciprocal-space resolution function to map specific components of the deformation gradient tensor. The formalism supports multi-length scale experiments, as it enables DFXM to be interfaced with 3DXRD. The formalism is demonstrated by comparison to experimental images of the strain field around a straight dislocation. △ Less

Submitted 18 July, 2020; originally announced July 2020.

Journal ref: Journal of Applied Crystallography, 54, 6 (2021)