The 4D Camera: an 87 kHz direct electron detector for scanning/transmission electron microscopy
Authors:
Peter Ercius,
Ian J. Johnson,
Philipp Pelz,
Benjamin H. Savitzky,
Lauren Hughes,
Hamish G. Brown,
Steven E. Zeltmann,
Shang-Lin Hsu,
Cassio C. S. Pedroso,
Bruce E. Cohen,
Ramamoorthy Ramesh,
David Paul,
John M. Joseph,
Thorsten Stezelberger,
Cory Czarnik,
Matthew Lent,
Erin Fong,
Jim Ciston,
Mary C. Scott,
Colin Ophus,
Andrew M. Minor,
and Peter Denes
Abstract:
We describe the development, operation, and application of the 4D Camera -- a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at approximately 480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10 - 700…
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We describe the development, operation, and application of the 4D Camera -- a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at approximately 480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10 - 700 Gigabyte-sized raw datasets. The back illuminated detector provides the ability to detect single electron events at accelerating voltages from 30 - 300 keV. Through electron counting, the resulting sparse data sets are reduced in size by 10 - 300x compared to the raw data, and open-source sparsity-based processing algorithms offer rapid data analysis. The high frame rate allows for large and complex 4D-STEM experiments to be accomplished with typical STEM scanning parameters.
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Submitted 19 May, 2023;
originally announced May 2023.
